AU2003210779A1 - Imaging method and apparatus - Google Patents

Imaging method and apparatus

Info

Publication number
AU2003210779A1
AU2003210779A1 AU2003210779A AU2003210779A AU2003210779A1 AU 2003210779 A1 AU2003210779 A1 AU 2003210779A1 AU 2003210779 A AU2003210779 A AU 2003210779A AU 2003210779 A AU2003210779 A AU 2003210779A AU 2003210779 A1 AU2003210779 A1 AU 2003210779A1
Authority
AU
Australia
Prior art keywords
imaging method
imaging
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2003210779A
Other languages
English (en)
Inventor
Steven P. Floeder
James A. Masterman
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
3M Innovative Properties Co
Original Assignee
3M Innovative Properties Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 3M Innovative Properties Co filed Critical 3M Innovative Properties Co
Publication of AU2003210779A1 publication Critical patent/AU2003210779A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles

Landscapes

  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
AU2003210779A 2002-04-03 2003-01-31 Imaging method and apparatus Abandoned AU2003210779A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US10/115,533 US7023542B2 (en) 2002-04-03 2002-04-03 Imaging method and apparatus
US10/115,533 2002-04-03
PCT/US2003/002979 WO2003085389A1 (en) 2002-04-03 2003-01-31 Imaging method and apparatus

Publications (1)

Publication Number Publication Date
AU2003210779A1 true AU2003210779A1 (en) 2003-10-20

Family

ID=28673792

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2003210779A Abandoned AU2003210779A1 (en) 2002-04-03 2003-01-31 Imaging method and apparatus

Country Status (7)

Country Link
US (1) US7023542B2 (enExample)
EP (1) EP1493022A1 (enExample)
JP (1) JP2005528593A (enExample)
KR (1) KR20040105831A (enExample)
CN (1) CN1646895A (enExample)
AU (1) AU2003210779A1 (enExample)
WO (1) WO2003085389A1 (enExample)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7623699B2 (en) 2004-04-19 2009-11-24 3M Innovative Properties Company Apparatus and method for the automated marking of defects on webs of material
GB0503184D0 (en) * 2005-02-16 2005-03-23 Greenbank Terotech Ltd A method and a device for generating data relating to particles in a particulate material
FR2892191B1 (fr) * 2005-10-17 2008-04-04 Vai Clecim Soc Par Actions Sim Dispositif compact et procede d'inspection d'un produit en defilement, pour la detection automatique de defauts.
KR101442871B1 (ko) * 2007-02-16 2014-09-19 쓰리엠 이노베이티브 프로퍼티즈 컴파니 시트 재료 조명 시스템 및 방법
US7542821B2 (en) * 2007-07-26 2009-06-02 3M Innovative Properties Company Multi-unit process spatial synchronization of image inspection systems
US8175739B2 (en) * 2007-07-26 2012-05-08 3M Innovative Properties Company Multi-unit process spatial synchronization
US7797133B2 (en) * 2008-09-10 2010-09-14 3M Innovative Properties Company Multi-roller registered repeat defect detection of a web process line
CN102081047B (zh) * 2009-11-27 2015-04-08 法国圣-戈班玻璃公司 用于对基板的缺陷进行区分的方法和系统
JP6037701B2 (ja) * 2012-08-03 2016-12-07 株式会社日立ハイテクノロジーズ 免疫分析装置
CN107688248A (zh) * 2016-08-05 2018-02-13 豪威科技股份有限公司 硅基液晶测试平台
TW201818065A (zh) * 2016-09-01 2018-05-16 美商3M新設資產公司 機器方向線膜檢測
JP2018147579A (ja) * 2017-03-01 2018-09-20 オムロン株式会社 光電センサ
US12305983B2 (en) * 2020-06-17 2025-05-20 Corning Incorporated Methods and apparatus for measuring a feature of glass-based substrate

Family Cites Families (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL272308A (enExample) * 1960-12-13
GB1008769A (en) * 1962-07-31 1965-11-03 Ernest Arthur Timson Apparatus for checking the pitch of uniformly spaced visible effects in the course of being formed in a travelling strip or web
DE2220373A1 (de) * 1972-04-26 1973-11-15 Wernicke & Co Kg Vorrichtung zum zentrieren von brillenglaesern, insbesondere von brillenglaesern mit nahteil, und zum anbringen eines halteteils auf dem brillenglas
US3788750A (en) * 1972-12-06 1974-01-29 Libbey Owens Ford Co Inspecting glass
SU840712A1 (ru) 1978-02-09 1981-06-23 Предприятие П/Я Р-6681 Устройство дл исследовани опти-чЕСКиХ НЕОдНОРОдНОСТЕй
US4310242A (en) * 1980-04-01 1982-01-12 The United States Of America As Represented By The Secretary Of The Air Force Field test unit for windscreen optical evaluation
DE3338802A1 (de) * 1983-10-26 1985-05-09 Feldmühle AG, 4000 Düsseldorf Vorrichtung und verfahren zum pruefen von materialbahnen
GB8424084D0 (en) * 1984-09-24 1984-10-31 Sira Ltd Inspection apparatus
DE3534019A1 (de) * 1985-09-24 1987-04-02 Sick Optik Elektronik Erwin Optische bahnueberwachungsvorrichtung
GB8610305D0 (en) * 1986-04-28 1986-06-04 Sira Ltd Inspection apparatus
WO1987007383A1 (en) 1986-05-30 1987-12-03 Diffracto, Ltd. Index-sight
JPH0827443B2 (ja) * 1986-10-16 1996-03-21 オリンパス光学工業株式会社 シユリ−レン光学装置
GB2202627A (en) * 1987-03-23 1988-09-28 Sick Optik Elektronik Erwin Optical arrangement in web monitoring device
EP0379281A3 (en) * 1989-01-19 1991-03-20 Cosmopolitan Textile Company Limited Web inspecting method and apparatus
DE3926349A1 (de) 1989-08-09 1991-02-14 Sick Optik Elektronik Erwin Optische fehlerinspektionsvorrichtung
DE4139094A1 (de) 1991-11-28 1993-06-03 Wolf & Beck Gmbh Dr Messverfahren und messgeraet zur erkennung von stoerstellen bei flachglaesern
JP2795595B2 (ja) * 1992-06-26 1998-09-10 セントラル硝子株式会社 透明板状体の欠点検出方法
JPH07151706A (ja) * 1993-09-03 1995-06-16 Minnesota Mining & Mfg Co <3M> 物品の欠陥検知装置及びその使用方法
US5515158A (en) * 1994-02-01 1996-05-07 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Retroreflection focusing schlieren system
JP3385442B2 (ja) * 1994-05-31 2003-03-10 株式会社ニュークリエイション 検査用光学系および検査装置
JP3178644B2 (ja) * 1995-02-10 2001-06-25 セントラル硝子株式会社 透明板状体の欠点検出方法
US5642198A (en) * 1995-04-03 1997-06-24 Long; William R. Method of inspecting moving material
JPH08327561A (ja) 1995-06-05 1996-12-13 Nippon Sheet Glass Co Ltd 連続シート状物体の欠点検査装置
JPH10115871A (ja) * 1996-10-14 1998-05-06 Canon Inc 画像投射装置
IL119850A (en) * 1996-12-17 2000-11-21 Prolaser Ltd Optical method and apparatus for detecting low frequency defects
US6181416B1 (en) * 1998-04-14 2001-01-30 Optometrix, Inc. Schlieren method for imaging semiconductor device properties
US6633377B1 (en) 2000-04-20 2003-10-14 Image Processing Systems Inc. Dark view inspection system for transparent media
AU2000274686A1 (en) 2000-08-09 2002-02-18 Turkiye Sise Ve Cam Fabrikalari A.S. Method and apparatus for imaging inhomogeneity in a transparent solid medium

Also Published As

Publication number Publication date
US7023542B2 (en) 2006-04-04
WO2003085389A1 (en) 2003-10-16
EP1493022A1 (en) 2005-01-05
CN1646895A (zh) 2005-07-27
KR20040105831A (ko) 2004-12-16
JP2005528593A (ja) 2005-09-22
US20030189704A1 (en) 2003-10-09

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase