BRPI0807774A2 - Método e aparelho para iluminar material para inspeção automatizada - Google Patents

Método e aparelho para iluminar material para inspeção automatizada

Info

Publication number
BRPI0807774A2
BRPI0807774A2 BRPI0807774-6A2A BRPI0807774A BRPI0807774A2 BR PI0807774 A2 BRPI0807774 A2 BR PI0807774A2 BR PI0807774 A BRPI0807774 A BR PI0807774A BR PI0807774 A2 BRPI0807774 A2 BR PI0807774A2
Authority
BR
Brazil
Prior art keywords
automated inspection
inspection material
lighting
lighting automated
inspection
Prior art date
Application number
BRPI0807774-6A2A
Other languages
English (en)
Inventor
Kenneth G Brittain
Steven P Floeder
Original Assignee
3M Innovative Properties Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 3M Innovative Properties Co filed Critical 3M Innovative Properties Co
Publication of BRPI0807774A2 publication Critical patent/BRPI0807774A2/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8822—Dark field detection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8829—Shadow projection or structured background, e.g. for deflectometry
    • G01N2021/8832—Structured background, e.g. for transparent objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8841—Illumination and detection on two sides of object

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
BRPI0807774-6A2A 2007-02-16 2008-01-21 Método e aparelho para iluminar material para inspeção automatizada BRPI0807774A2 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US89028407P 2007-02-16 2007-02-16
PCT/US2008/051556 WO2008100683A1 (en) 2007-02-16 2008-01-21 Method and apparatus for illuminating material for automated inspection

Publications (1)

Publication Number Publication Date
BRPI0807774A2 true BRPI0807774A2 (pt) 2014-06-17

Family

ID=39690451

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0807774-6A2A BRPI0807774A2 (pt) 2007-02-16 2008-01-21 Método e aparelho para iluminar material para inspeção automatizada

Country Status (7)

Country Link
US (1) US8072593B2 (pt)
EP (1) EP2126552A4 (pt)
JP (1) JP2010519515A (pt)
KR (1) KR101442871B1 (pt)
CN (1) CN101611309B (pt)
BR (1) BRPI0807774A2 (pt)
WO (1) WO2008100683A1 (pt)

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EP2097389B1 (en) 2006-12-20 2011-09-14 Boehringer Ingelheim International GmbH Sulfated benzimidazolone derivatives having mixed serotonine receptor affinity
US8083201B2 (en) * 2009-02-09 2011-12-27 The Procter & Gamble Company Apparatus and method for supporting and aligning imaging equipment on a web converting manufacturing line
CN101887030A (zh) 2009-05-15 2010-11-17 圣戈本玻璃法国公司 用于检测透明基板表面和/或其内部的缺陷的方法及系统
CN102169093B (zh) * 2010-12-20 2012-10-10 湖南大学 基于图形处理器的多工位机器视觉成像检测方法及系统
US9019486B2 (en) 2013-01-31 2015-04-28 Fluke Corporation Multi-light fiber source for fiber end-surface inspection
CN106415248B (zh) * 2013-10-24 2020-08-18 飞利浦灯具控股公司 缺陷检查系统和方法
KR200474087Y1 (ko) * 2013-11-29 2014-09-19 피에스아이트레이딩 주식회사 필름 결함 검사 장치
KR20160047360A (ko) * 2014-10-22 2016-05-02 동우 화인켐 주식회사 결함 검출 시스템 및 방법
WO2017001897A1 (pt) * 2015-06-30 2017-01-05 Bosch Car Multimedia Portugal, S.A. Dispositivo e método para deteção de defeitos em superfícies especulares com luz difusa estruturada
CN105222728A (zh) * 2015-09-14 2016-01-06 深圳市星源材质科技股份有限公司 一种锂电池隔膜表面平整度的检测装置及其方法
KR102499831B1 (ko) * 2016-05-23 2023-02-14 코닝 인코포레이티드 글라스 시트의 무중력 형상 예측 방법 및 무중력 형상 기반 글라스 시트 품질 관리 방법
US10402958B2 (en) * 2016-09-22 2019-09-03 Current Lighting Solutions, Llc Systems and methods for window contamination detection
JP6788837B2 (ja) * 2017-01-06 2020-11-25 日本電気硝子株式会社 ガラス板の検査方法及びその製造方法並びにガラス板の検査装置
KR102632169B1 (ko) * 2018-11-12 2024-02-02 삼성디스플레이 주식회사 유리기판 검사 장치 및 방법
KR102162693B1 (ko) 2018-12-14 2020-10-07 동우 화인켐 주식회사 결함 검출 시스템 및 방법
CN110609040B (zh) * 2019-09-30 2022-01-07 苏州精濑光电有限公司 一种隔膜的光学检测方法
CN111999316B (zh) * 2020-09-02 2021-06-04 惠州高视科技有限公司 一种曲面玻璃检测系统及方法
EP4231001A1 (en) * 2022-02-16 2023-08-23 Carl Zeiss Vision International GmbH Testing device and testing method

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GB2157824B (en) 1984-04-19 1988-09-14 Owens Illinois Inc Inspecting and sorting of glass containers
CN1008003B (zh) * 1985-04-01 1990-05-16 欧文斯-伊利诺衣公司 透明物体中折光缺陷的检测系统
JPH01210807A (ja) * 1988-02-18 1989-08-24 Toyota Motor Corp 塗膜平滑度自動検査装置
JPH02116741A (ja) * 1988-10-27 1990-05-01 Mitsubishi Rayon Co Ltd フィッシュアイ検査装置
US5132791A (en) * 1990-09-25 1992-07-21 Ball Corporation Optical sheet inspection system
JPH04236344A (ja) * 1991-01-18 1992-08-25 Omron Corp 視覚検査装置
US5172005A (en) * 1991-02-20 1992-12-15 Pressco Technology, Inc. Engineered lighting system for tdi inspection comprising means for controlling lighting elements in accordance with specimen displacement
JP2795595B2 (ja) * 1992-06-26 1998-09-10 セントラル硝子株式会社 透明板状体の欠点検出方法
JP3390931B2 (ja) * 1993-09-28 2003-03-31 大日本印刷株式会社 着色パターンの欠陥検査方法
JPH0992692A (ja) * 1995-07-13 1997-04-04 Toray Ind Inc Ｔａｂテープの検査装置および検査方法ならびに実装ｔａｂテープの製造方法および製造装置
US5847834A (en) * 1997-09-11 1998-12-08 Webview, Inc. Expandable, continuous illumination source for a web inspection assembly and method
US6170973B1 (en) * 1997-11-26 2001-01-09 Cognex Corporation Method and apparatus for wide-angle illumination in line-scanning machine vision devices
US6011620A (en) * 1998-04-06 2000-01-04 Northrop Grumman Corporation Method and apparatus for the automatic inspection of optically transmissive planar objects
JPH11337504A (ja) * 1998-05-26 1999-12-10 Central Glass Co Ltd ガラス板の欠陥識別検査方法および装置
US6207946B1 (en) * 1998-09-03 2001-03-27 Semiconductor Technologies & Instruments, Inc. Adaptive lighting system and method for machine vision apparatus
CA2252308C (en) * 1998-10-30 2005-01-04 Image Processing Systems, Inc. Glass inspection system
JP2001215197A (ja) * 2000-02-01 2001-08-10 Sekisui Chem Co Ltd 透明シートの検査方法および装置
JP2002214158A (ja) * 2001-01-19 2002-07-31 Central Glass Co Ltd 透明板状体の欠点検出方法および検出装置
JP4155742B2 (ja) * 2002-01-22 2008-09-24 株式会社日立製作所 フィルムに対する欠陥検査方法及びその装置
US7023542B2 (en) * 2002-04-03 2006-04-04 3M Innovative Properties Company Imaging method and apparatus
FR2846425B1 (fr) * 2002-10-25 2006-04-28 Bsn Glasspack Procede et didpositif pour detecter des defauts de surface presentes par la paroi externe d'un objet transparent ou translucide
JP2004177306A (ja) * 2002-11-28 2004-06-24 Canon Inc 塗工欠陥検出装置
US7142295B2 (en) * 2003-03-05 2006-11-28 Corning Incorporated Inspection of transparent substrates for defects
US7027934B2 (en) * 2003-09-24 2006-04-11 3M Innovative Properties Company Apparatus and method for automated web inspection
KR20060128979A (ko) * 2003-12-31 2006-12-14 쓰리엠 이노베이티브 프로퍼티즈 컴파니 웹 기반 제품의 수율을 최대화하는 방법 및 시스템
US7623699B2 (en) * 2004-04-19 2009-11-24 3M Innovative Properties Company Apparatus and method for the automated marking of defects on webs of material
US20060092276A1 (en) * 2004-10-28 2006-05-04 Ariglio James A Inspection system and method for identifying surface and body defects in a glass sheet
US7369240B1 (en) * 2006-07-20 2008-05-06 Litesentry Corporation Apparatus and methods for real-time adaptive inspection for glass production
CN1908638A (zh) * 2006-08-24 2007-02-07 上海交通大学 玻璃缺陷的光学检测装置
US7880156B2 (en) * 2006-12-27 2011-02-01 Honeywell International Inc. System and method for z-structure measurements using simultaneous multi-band tomography

Also Published As

Publication number Publication date
CN101611309A (zh) 2009-12-23
CN101611309B (zh) 2012-06-27
KR101442871B1 (ko) 2014-09-19
JP2010519515A (ja) 2010-06-03
KR20090113885A (ko) 2009-11-02
EP2126552A4 (en) 2016-04-20
WO2008100683A1 (en) 2008-08-21
EP2126552A1 (en) 2009-12-02
US8072593B2 (en) 2011-12-06
US20080198602A1 (en) 2008-08-21

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Legal Events

Date Code Title Description
B08F Application fees: application dismissed [chapter 8.6 patent gazette]
B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]