CN1646895A - 成像方法及装置 - Google Patents

成像方法及装置 Download PDF

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Publication number
CN1646895A
CN1646895A CNA038078430A CN03807843A CN1646895A CN 1646895 A CN1646895 A CN 1646895A CN A038078430 A CNA038078430 A CN A038078430A CN 03807843 A CN03807843 A CN 03807843A CN 1646895 A CN1646895 A CN 1646895A
Authority
CN
China
Prior art keywords
transparent medium
light
image
lens
defects
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CNA038078430A
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English (en)
Chinese (zh)
Inventor
史蒂文·P·弗洛德
詹姆斯·A·马斯特
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
3M Innovative Properties Co
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3M Innovative Properties Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 3M Innovative Properties Co filed Critical 3M Innovative Properties Co
Publication of CN1646895A publication Critical patent/CN1646895A/zh
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G01N21/896—Optical defects in or on transparent materials, e.g. distortion, surface flaws in conveyed flat sheet or rod
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles

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  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
CNA038078430A 2002-04-03 2003-01-31 成像方法及装置 Pending CN1646895A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/115,533 US7023542B2 (en) 2002-04-03 2002-04-03 Imaging method and apparatus
US10/115,533 2002-04-03

Publications (1)

Publication Number Publication Date
CN1646895A true CN1646895A (zh) 2005-07-27

Family

ID=28673792

Family Applications (1)

Application Number Title Priority Date Filing Date
CNA038078430A Pending CN1646895A (zh) 2002-04-03 2003-01-31 成像方法及装置

Country Status (7)

Country Link
US (1) US7023542B2 (enExample)
EP (1) EP1493022A1 (enExample)
JP (1) JP2005528593A (enExample)
KR (1) KR20040105831A (enExample)
CN (1) CN1646895A (enExample)
AU (1) AU2003210779A1 (enExample)
WO (1) WO2003085389A1 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102081047A (zh) * 2009-11-27 2011-06-01 法国圣-戈班玻璃公司 用于对基板的缺陷进行区分的方法和系统
CN107688248A (zh) * 2016-08-05 2018-02-13 豪威科技股份有限公司 硅基液晶测试平台

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7623699B2 (en) 2004-04-19 2009-11-24 3M Innovative Properties Company Apparatus and method for the automated marking of defects on webs of material
GB0503184D0 (en) * 2005-02-16 2005-03-23 Greenbank Terotech Ltd A method and a device for generating data relating to particles in a particulate material
FR2892191B1 (fr) * 2005-10-17 2008-04-04 Vai Clecim Soc Par Actions Sim Dispositif compact et procede d'inspection d'un produit en defilement, pour la detection automatique de defauts.
KR101442871B1 (ko) * 2007-02-16 2014-09-19 쓰리엠 이노베이티브 프로퍼티즈 컴파니 시트 재료 조명 시스템 및 방법
US7542821B2 (en) * 2007-07-26 2009-06-02 3M Innovative Properties Company Multi-unit process spatial synchronization of image inspection systems
US8175739B2 (en) * 2007-07-26 2012-05-08 3M Innovative Properties Company Multi-unit process spatial synchronization
US7797133B2 (en) * 2008-09-10 2010-09-14 3M Innovative Properties Company Multi-roller registered repeat defect detection of a web process line
JP6037701B2 (ja) * 2012-08-03 2016-12-07 株式会社日立ハイテクノロジーズ 免疫分析装置
TW201818065A (zh) * 2016-09-01 2018-05-16 美商3M新設資產公司 機器方向線膜檢測
JP2018147579A (ja) * 2017-03-01 2018-09-20 オムロン株式会社 光電センサ
US12305983B2 (en) * 2020-06-17 2025-05-20 Corning Incorporated Methods and apparatus for measuring a feature of glass-based substrate

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DE3534019A1 (de) * 1985-09-24 1987-04-02 Sick Optik Elektronik Erwin Optische bahnueberwachungsvorrichtung
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JPH0827443B2 (ja) * 1986-10-16 1996-03-21 オリンパス光学工業株式会社 シユリ−レン光学装置
GB2202627A (en) * 1987-03-23 1988-09-28 Sick Optik Elektronik Erwin Optical arrangement in web monitoring device
EP0379281A3 (en) * 1989-01-19 1991-03-20 Cosmopolitan Textile Company Limited Web inspecting method and apparatus
DE3926349A1 (de) 1989-08-09 1991-02-14 Sick Optik Elektronik Erwin Optische fehlerinspektionsvorrichtung
DE4139094A1 (de) 1991-11-28 1993-06-03 Wolf & Beck Gmbh Dr Messverfahren und messgeraet zur erkennung von stoerstellen bei flachglaesern
JP2795595B2 (ja) * 1992-06-26 1998-09-10 セントラル硝子株式会社 透明板状体の欠点検出方法
JPH07151706A (ja) * 1993-09-03 1995-06-16 Minnesota Mining & Mfg Co <3M> 物品の欠陥検知装置及びその使用方法
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JP3385442B2 (ja) * 1994-05-31 2003-03-10 株式会社ニュークリエイション 検査用光学系および検査装置
JP3178644B2 (ja) * 1995-02-10 2001-06-25 セントラル硝子株式会社 透明板状体の欠点検出方法
US5642198A (en) * 1995-04-03 1997-06-24 Long; William R. Method of inspecting moving material
JPH08327561A (ja) 1995-06-05 1996-12-13 Nippon Sheet Glass Co Ltd 連続シート状物体の欠点検査装置
JPH10115871A (ja) * 1996-10-14 1998-05-06 Canon Inc 画像投射装置
IL119850A (en) * 1996-12-17 2000-11-21 Prolaser Ltd Optical method and apparatus for detecting low frequency defects
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US6633377B1 (en) 2000-04-20 2003-10-14 Image Processing Systems Inc. Dark view inspection system for transparent media
AU2000274686A1 (en) 2000-08-09 2002-02-18 Turkiye Sise Ve Cam Fabrikalari A.S. Method and apparatus for imaging inhomogeneity in a transparent solid medium

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102081047A (zh) * 2009-11-27 2011-06-01 法国圣-戈班玻璃公司 用于对基板的缺陷进行区分的方法和系统
CN102081047B (zh) * 2009-11-27 2015-04-08 法国圣-戈班玻璃公司 用于对基板的缺陷进行区分的方法和系统
CN107688248A (zh) * 2016-08-05 2018-02-13 豪威科技股份有限公司 硅基液晶测试平台

Also Published As

Publication number Publication date
AU2003210779A1 (en) 2003-10-20
US7023542B2 (en) 2006-04-04
WO2003085389A1 (en) 2003-10-16
EP1493022A1 (en) 2005-01-05
KR20040105831A (ko) 2004-12-16
JP2005528593A (ja) 2005-09-22
US20030189704A1 (en) 2003-10-09

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