KR20040059402A - 인버스 구조의 mim 커패시터를 이용한 rf 아날로그디바이스의 제조 방법 - Google Patents
인버스 구조의 mim 커패시터를 이용한 rf 아날로그디바이스의 제조 방법 Download PDFInfo
- Publication number
- KR20040059402A KR20040059402A KR1020020086017A KR20020086017A KR20040059402A KR 20040059402 A KR20040059402 A KR 20040059402A KR 1020020086017 A KR1020020086017 A KR 1020020086017A KR 20020086017 A KR20020086017 A KR 20020086017A KR 20040059402 A KR20040059402 A KR 20040059402A
- Authority
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- South Korea
- Prior art keywords
- inductor
- forming
- layer
- mim capacitor
- lower electrode
- Prior art date
Links
- 239000003990 capacitor Substances 0.000 title claims abstract description 47
- 238000000034 method Methods 0.000 title claims abstract description 21
- 229910052751 metal Inorganic materials 0.000 claims abstract description 15
- 239000002184 metal Substances 0.000 claims abstract description 15
- 238000005530 etching Methods 0.000 claims abstract description 9
- 125000006850 spacer group Chemical group 0.000 claims abstract description 7
- 239000000463 material Substances 0.000 claims description 11
- 239000003989 dielectric material Substances 0.000 claims description 6
- 238000000151 deposition Methods 0.000 claims description 2
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 2
- 229910052721 tungsten Inorganic materials 0.000 claims description 2
- 239000010937 tungsten Substances 0.000 claims description 2
- 238000004519 manufacturing process Methods 0.000 abstract description 10
- 239000010410 layer Substances 0.000 description 40
- 239000004065 semiconductor Substances 0.000 description 7
- 230000006870 function Effects 0.000 description 6
- 229920002120 photoresistant polymer Polymers 0.000 description 5
- 230000015572 biosynthetic process Effects 0.000 description 4
- 239000012212 insulator Substances 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 230000010354 integration Effects 0.000 description 2
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 2
- 229920005591 polysilicon Polymers 0.000 description 2
- 239000002131 composite material Substances 0.000 description 1
- 239000011229 interlayer Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003071 parasitic effect Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body
- H01L27/06—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration
- H01L27/07—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common
- H01L27/0705—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common comprising components of the field effect type
- H01L27/0727—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being a semiconductor body including a plurality of individual components in a non-repetitive configuration the components having an active region in common comprising components of the field effect type in combination with diodes, or capacitors or resistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L28/00—Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
- H01L28/10—Inductors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L28/00—Passive two-terminal components without a potential-jump or surface barrier for integrated circuits; Details thereof; Multistep manufacturing processes therefor
- H01L28/40—Capacitors
- H01L28/60—Electrodes
- H01L28/75—Electrodes comprising two or more layers, e.g. comprising a barrier layer and a metal layer
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Semiconductor Integrated Circuits (AREA)
Abstract
Description
Claims (3)
- 전면에 IMD층을 형성하고 선택적으로 비아홀들을 형성하고 비아 콘택층을 형성하는 단계;커패시터 하부 전극 형성용 물질층,유전 물질층을 차례로 증착하고 선택적으로 식각하여 MIM 커패시터 하부 전극,유전체층을 형성하는 단계;상기 MIM 커패시터 하부 전극,유전체층의 측면에 스페이서를 형성하는 단계;전면에 인덕터 형성용 금속층, 하드 마스크 물질층을 차례로 형성하고 선택적으로 식각하여 인덕터 형성을 위한 하드 마스크층을 형성하는 단계;상기 하드 마스크를 이용하여 인덕터 형성용 금속층을 선택적으로 식각하여 선택적으로 MIM 커패시터 상부 전극으로 사용되는 인덕터를 형성하는 단계를 포함하는 것을 특징으로 하는 인버스 구조의 MIM 커패시터를 이용한 RF 아날로그 디바이스의 제조 방법.
- 제 1 항에 있어서, 비아 콘택층을 비아홀들을 형성한 후에 텅스텐(W)층을 형성하고 CMP 공정으로 평탄화하여 형성하는 것을 특징으로 하는 인버스 구조의 MIM 커패시터를 이용한 RF 아날로그 디바이스의 제조 방법.
- 제 1 항에 있어서, 비아 콘택층이 MIM 커패시터의 하부 전극 또는 인덕터에 연결되는 것을 특징으로 하는 인버스 구조의 MIM 커패시터를 이용한 RF 아날로그 디바이스의 제조 방법.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020020086017A KR100593957B1 (ko) | 2002-12-28 | 2002-12-28 | 인버스 구조의 mim 커패시터를 이용한 rf 아날로그디바이스의 제조 방법 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020020086017A KR100593957B1 (ko) | 2002-12-28 | 2002-12-28 | 인버스 구조의 mim 커패시터를 이용한 rf 아날로그디바이스의 제조 방법 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20040059402A true KR20040059402A (ko) | 2004-07-05 |
KR100593957B1 KR100593957B1 (ko) | 2006-07-03 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020020086017A KR100593957B1 (ko) | 2002-12-28 | 2002-12-28 | 인버스 구조의 mim 커패시터를 이용한 rf 아날로그디바이스의 제조 방법 |
Country Status (1)
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KR (1) | KR100593957B1 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8492822B2 (en) | 2009-03-11 | 2013-07-23 | Samsung Electronics Co., Ltd. | Method of manufacturing LC circuit and LC circuit |
-
2002
- 2002-12-28 KR KR1020020086017A patent/KR100593957B1/ko active IP Right Grant
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8492822B2 (en) | 2009-03-11 | 2013-07-23 | Samsung Electronics Co., Ltd. | Method of manufacturing LC circuit and LC circuit |
Also Published As
Publication number | Publication date |
---|---|
KR100593957B1 (ko) | 2006-07-03 |
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