KR20040012212A - 박막 트랜지스터 제조 방법 - Google Patents
박막 트랜지스터 제조 방법 Download PDFInfo
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- KR20040012212A KR20040012212A KR1020020045655A KR20020045655A KR20040012212A KR 20040012212 A KR20040012212 A KR 20040012212A KR 1020020045655 A KR1020020045655 A KR 1020020045655A KR 20020045655 A KR20020045655 A KR 20020045655A KR 20040012212 A KR20040012212 A KR 20040012212A
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- KR
- South Korea
- Prior art keywords
- film
- organic
- substrate
- organic material
- electrode
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims description 39
- 239000010409 thin film Substances 0.000 title abstract description 14
- 239000000758 substrate Substances 0.000 claims abstract description 28
- 239000011368 organic material Substances 0.000 claims abstract description 23
- 230000005684 electric field Effects 0.000 claims abstract description 12
- 238000000206 photolithography Methods 0.000 claims abstract description 9
- 238000002161 passivation Methods 0.000 claims abstract description 6
- 238000004528 spin coating Methods 0.000 claims abstract description 5
- 239000002184 metal Substances 0.000 claims description 6
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 4
- 239000004033 plastic Substances 0.000 claims description 4
- 229920003023 plastic Polymers 0.000 claims description 4
- 230000001681 protective effect Effects 0.000 claims description 4
- 229910052814 silicon oxide Inorganic materials 0.000 claims description 4
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 3
- 238000005530 etching Methods 0.000 claims description 3
- 239000011521 glass Substances 0.000 claims description 3
- 229910052710 silicon Inorganic materials 0.000 claims description 3
- 239000010703 silicon Substances 0.000 claims description 3
- 238000001771 vacuum deposition Methods 0.000 claims description 3
- 229910052581 Si3N4 Inorganic materials 0.000 claims description 2
- 239000012535 impurity Substances 0.000 claims description 2
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims description 2
- 239000010408 film Substances 0.000 abstract description 33
- 238000004519 manufacturing process Methods 0.000 abstract description 14
- 238000007738 vacuum evaporation Methods 0.000 abstract 1
- 238000010438 heat treatment Methods 0.000 description 7
- 230000005669 field effect Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 230000006378 damage Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
- G02F1/1343—Electrodes
- G02F1/134309—Electrodes characterised by their geometrical arrangement
- G02F1/134363—Electrodes characterised by their geometrical arrangement for applying an electric field parallel to the substrate, i.e. in-plane switching [IPS]
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136277—Active matrix addressed cells formed on a semiconductor substrate, e.g. of silicon
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/1368—Active matrix addressed cells in which the switching element is a three-electrode device
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/125—Active-matrix OLED [AMOLED] displays including organic TFTs [OTFT]
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F2201/00—Constructional arrangements not provided for in groups G02F1/00 - G02F7/00
- G02F2201/42—Arrangements for providing conduction through an insulating substrate
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Optics & Photonics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Mathematical Physics (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Ceramic Engineering (AREA)
- Geometry (AREA)
- Thin Film Transistor (AREA)
Abstract
Description
Claims (6)
- 절연 기판 상에 게이트 전극 및 게이트 절연막을 차례로 형성하는 단계와,상기 기판 상에 상기 게이트 전극을 덮되, 상기 게이트 전극의 중심과 대응되는 부분을 노출시키는 소오스/드레인 전극을 형성하는 단계와,상기 결과물 전면에 유기물질막을 형성하는 단계와,상기 유기물질막의 양단에 각각의 전극을 형성하는 단계와,상기 전극에 전계를 인가하여 상기 유기물질막 내의 유기 분자를 정렬시키는 단계와,포토리쏘그라피 공정에 의해 상기 정렬된 유기물질막을 식각하여 유기 액티브층을 형성하는 단계를 포함한 것을 특징으로 하는 박막 트랜지스터 제조 방법.
- 제 1항에 있어서, 상기 절연 기판은 플라스틱 기판, 유리기판 및 유연성있는 기판 중 어느 하나를 이용하는 것을 특징으로 하는 박막 트랜지스터 제조 방법.
- 제 1항에 있어서, 상기 게이트 절연막은 실리콘 산화막, 실리콘 질화막 및 유기 절연막 중 어느 하나를 이용하여 형성하는 것을 특징으로 하는 박막 트랜지스터 제조 방법.
- 제 1항에 있어서, 상기 유기물질막은 스핀 코팅 및 진공증착 중 어느 하나의방식에 의해 형성하는 것을 특징으로 하는 박막 트랜지스터 제조 방법.
- 제 1항에 있어서, 상기 게이트 전극은 금속막 및 불순물이 도핑된 실리콘막 중 어느 하나를 이용하여 형성하는 것을 특징으로 하는 박막 트랜지스터 제조 방법.
- 제 1항에 있어서, 상기 유기 액티브층을 형성한 후에,상기 유기 액티브층을 포함한 기판 상에 상기 드레인 전극을 노출시키는 개구부를 가진 보호막을 형성하는 단계와,상기 보호막 상에 형성되며, 상기 개구부를 통해 상기 드레인 전극과 연결되는 화소 전극을 형성하는 단계를 추가하는 것을 특징으로 하는 박막 트랜지스터 제조 방법.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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KR1020020045655A KR100867477B1 (ko) | 2002-08-01 | 2002-08-01 | 박막 트랜지스터 제조 방법 |
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KR1020020045655A KR100867477B1 (ko) | 2002-08-01 | 2002-08-01 | 박막 트랜지스터 제조 방법 |
Publications (2)
Publication Number | Publication Date |
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KR20040012212A true KR20040012212A (ko) | 2004-02-11 |
KR100867477B1 KR100867477B1 (ko) | 2008-11-10 |
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KR1020020045655A KR100867477B1 (ko) | 2002-08-01 | 2002-08-01 | 박막 트랜지스터 제조 방법 |
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KR (1) | KR100867477B1 (ko) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100675639B1 (ko) * | 2004-08-30 | 2007-02-02 | 엘지.필립스 엘시디 주식회사 | 유기 박막트랜지스터 및 액정표시소자의 제조방법 |
US7485894B2 (en) | 2005-10-20 | 2009-02-03 | Samsung Mobile Display Co., Ltd. | Thin film transistor and flat panel display including the same |
US7799597B2 (en) | 2005-10-21 | 2010-09-21 | Samsung Mobile Display Co., Ltd. | Thin film transistor, method of manufacturing the same and flat panel display having the thin film transistor |
US7800102B2 (en) | 2005-10-19 | 2010-09-21 | Samsung Mobile Display Co., Ltd. | Organic thin film transistor including a self-assembly monolayer between an insulating layer and an organic semiconductor layer and flat panel display comprising the same |
US8071422B2 (en) * | 2005-12-20 | 2011-12-06 | Lg Display Co., Ltd. | Method of fabricating thin film transistor including organic semiconductor layer and substrate |
US8227795B2 (en) | 2005-11-10 | 2012-07-24 | Samsung Mobile Display Co., Ltd. | Organic thin film transistor, flat panel display apparatus having the same, and a method of manufacturing organic thin film transistor |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100248392B1 (ko) * | 1997-05-15 | 2000-09-01 | 정선종 | 유기물전계효과트랜지스터와결합된유기물능동구동전기발광소자및그소자의제작방법 |
-
2002
- 2002-08-01 KR KR1020020045655A patent/KR100867477B1/ko active IP Right Grant
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100675639B1 (ko) * | 2004-08-30 | 2007-02-02 | 엘지.필립스 엘시디 주식회사 | 유기 박막트랜지스터 및 액정표시소자의 제조방법 |
US7800102B2 (en) | 2005-10-19 | 2010-09-21 | Samsung Mobile Display Co., Ltd. | Organic thin film transistor including a self-assembly monolayer between an insulating layer and an organic semiconductor layer and flat panel display comprising the same |
US7485894B2 (en) | 2005-10-20 | 2009-02-03 | Samsung Mobile Display Co., Ltd. | Thin film transistor and flat panel display including the same |
US7595504B2 (en) | 2005-10-20 | 2009-09-29 | Samsung Mobile Display Co., Ltd. | Thin film transistor and flat panel display including the same |
US7799597B2 (en) | 2005-10-21 | 2010-09-21 | Samsung Mobile Display Co., Ltd. | Thin film transistor, method of manufacturing the same and flat panel display having the thin film transistor |
US8207529B2 (en) | 2005-10-21 | 2012-06-26 | Samsung Mobile Display Co., Ltd. | Thin film transistor and flat panel display having the thin film transistor |
US8227795B2 (en) | 2005-11-10 | 2012-07-24 | Samsung Mobile Display Co., Ltd. | Organic thin film transistor, flat panel display apparatus having the same, and a method of manufacturing organic thin film transistor |
US8071422B2 (en) * | 2005-12-20 | 2011-12-06 | Lg Display Co., Ltd. | Method of fabricating thin film transistor including organic semiconductor layer and substrate |
KR101217662B1 (ko) * | 2005-12-20 | 2013-01-02 | 엘지디스플레이 주식회사 | 유기 반도체 물질을 이용한 박막트랜지스터와 이를 구비한액정표시장치용 어레이 기판의 제조방법 |
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Publication number | Publication date |
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KR100867477B1 (ko) | 2008-11-10 |
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