KR20010080576A - 과도 외란을 감소시키기 위한 전하 평형 구조를 갖는 집적회로 - Google Patents

과도 외란을 감소시키기 위한 전하 평형 구조를 갖는 집적회로 Download PDF

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Publication number
KR20010080576A
KR20010080576A KR1020017006556A KR20017006556A KR20010080576A KR 20010080576 A KR20010080576 A KR 20010080576A KR 1020017006556 A KR1020017006556 A KR 1020017006556A KR 20017006556 A KR20017006556 A KR 20017006556A KR 20010080576 A KR20010080576 A KR 20010080576A
Authority
KR
South Korea
Prior art keywords
circuit
filter
switch
capacitive
compensation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
KR1020017006556A
Other languages
English (en)
Korean (ko)
Inventor
반다리산자이엠
Original Assignee
롤페스 요하네스 게라투스 알베르투스
코닌클리즈케 필립스 일렉트로닉스 엔.브이.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 롤페스 요하네스 게라투스 알베르투스, 코닌클리즈케 필립스 일렉트로닉스 엔.브이. filed Critical 롤페스 요하네스 게라투스 알베르투스
Priority claimed from PCT/EP2000/009222 external-priority patent/WO2001024363A2/en
Publication of KR20010080576A publication Critical patent/KR20010080576A/ko
Withdrawn legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • H03F3/45071—Differential amplifiers with semiconductor devices only
    • H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
    • H03F3/45179—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using MOSFET transistors as the active amplifying circuit
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B20/00—Signal processing not specific to the method of recording or reproducing; Circuits therefor
    • G11B20/10—Digital recording or reproducing
    • G11B20/10009—Improvement or modification of read or write signals
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • H03F3/45071—Differential amplifiers with semiconductor devices only
    • H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
    • H03F3/4508—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using bipolar transistors as the active amplifying circuit
    • H03F3/45098—PI types
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • H03F3/45071—Differential amplifiers with semiconductor devices only
    • H03F3/45479—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection
    • H03F3/45928—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection using IC blocks as the active amplifying circuit
    • H03F3/45932—Differential amplifiers with semiconductor devices only characterised by the way of common mode signal rejection using IC blocks as the active amplifying circuit by using feedback means
    • H03F3/45937—Measuring at the loading circuit of the differential amplifier
    • H03F3/45941—Controlling the input circuit of the differential amplifier
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H11/00—Networks using active elements
    • H03H11/02—Multiple-port networks
    • H03H11/04—Frequency selective two-port networks
    • H03H11/12—Frequency selective two-port networks using amplifiers with feedback
    • H03H11/1291—Current or voltage controlled filters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B2005/0002—Special dispositions or recording techniques
    • G11B2005/0005—Arrangements, methods or circuits
    • G11B2005/001—Controlling recording characteristics of record carriers or transducing characteristics of transducers by means not being part of their structure
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
    • H03F2203/45—Indexing scheme relating to differential amplifiers
    • H03F2203/45466—Indexing scheme relating to differential amplifiers the CSC being controlled, e.g. by a signal derived from a non specified place in the dif amp circuit
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
    • H03F2203/45—Indexing scheme relating to differential amplifiers
    • H03F2203/45506—Indexing scheme relating to differential amplifiers the CSC comprising only one switch
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
    • H03F2203/45—Indexing scheme relating to differential amplifiers
    • H03F2203/45631—Indexing scheme relating to differential amplifiers the LC comprising one or more capacitors, e.g. coupling capacitors
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
    • H03F2203/45—Indexing scheme relating to differential amplifiers
    • H03F2203/45634—Indexing scheme relating to differential amplifiers the LC comprising one or more switched capacitors
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
    • H03F2203/45—Indexing scheme relating to differential amplifiers
    • H03F2203/45646—Indexing scheme relating to differential amplifiers the LC comprising an extra current source
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
    • H03F2203/45—Indexing scheme relating to differential amplifiers
    • H03F2203/45702—Indexing scheme relating to differential amplifiers the LC comprising two resistors
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
    • H03F2203/45—Indexing scheme relating to differential amplifiers
    • H03F2203/45726—Indexing scheme relating to differential amplifiers the LC comprising more than one switch, which are not cross coupled

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Signal Processing (AREA)
  • Digital Magnetic Recording (AREA)
  • Signal Processing For Digital Recording And Reproducing (AREA)
  • Electronic Switches (AREA)
KR1020017006556A 1999-09-28 2000-09-21 과도 외란을 감소시키기 위한 전하 평형 구조를 갖는 집적회로 Withdrawn KR20010080576A (ko)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US09/407,776 US6404578B1 (en) 1999-09-28 1999-09-28 Circuit for reduction and optimization of write-to-read settling times in magnetic medium storage devices
US09/407,776 1999-09-28
US09/469,873 1999-12-22
US09/469,873 US6400217B1 (en) 1999-09-28 1999-12-22 Integrated circuit having a filter with charge balancing scheme to reduce transient disturbances
PCT/EP2000/009222 WO2001024363A2 (en) 1999-09-28 2000-09-21 An integrated circuit having a filter with charge balancing scheme to reduce transient disturbances

Publications (1)

Publication Number Publication Date
KR20010080576A true KR20010080576A (ko) 2001-08-22

Family

ID=23613481

Family Applications (2)

Application Number Title Priority Date Filing Date
KR1020017006556A Withdrawn KR20010080576A (ko) 1999-09-28 2000-09-21 과도 외란을 감소시키기 위한 전하 평형 구조를 갖는 집적회로
KR1020017006593A Withdrawn KR20010080588A (ko) 1999-09-28 2000-09-25 자기 매체 저장 장치에서 기록-판독간 조정 시간의 감소와최적화를 위한 집적회로

Family Applications After (1)

Application Number Title Priority Date Filing Date
KR1020017006593A Withdrawn KR20010080588A (ko) 1999-09-28 2000-09-25 자기 매체 저장 장치에서 기록-판독간 조정 시간의 감소와최적화를 위한 집적회로

Country Status (6)

Country Link
US (2) US6404578B1 (enExample)
EP (1) EP1135769B1 (enExample)
JP (1) JP2003510747A (enExample)
KR (2) KR20010080576A (enExample)
DE (1) DE60016374T2 (enExample)
WO (1) WO2001024168A1 (enExample)

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US6751034B1 (en) * 2000-07-19 2004-06-15 Texas Instruments Incorporated Preamplifier read recovery parade
US6721117B2 (en) * 2000-11-29 2004-04-13 Agere Systems Inc. Read/write system with reduced write-to-read transition recovery time independent from input voltage and input current offset
WO2002060055A1 (en) * 2001-01-24 2002-08-01 Koninklijke Philips Electronics N.V. Tunable integrated rf filter having switched field effect capacitors
US7292400B2 (en) * 2001-04-23 2007-11-06 Seagate Technology Llc Device for limiting current in a sensor
US6876253B2 (en) 2001-09-28 2005-04-05 Koninklijke Philips Electronics N.V. Amplifier for alternating signals superimposed on a continuous signal and method for amplifying such signals
FR2850499B1 (fr) * 2003-01-28 2005-10-21 St Microelectronics Sa Procede et circuit de correction de l'offset d'une chaine d'amplification
US7339760B2 (en) * 2004-01-30 2008-03-04 Agere Systems Inc. Integrated bias and offset recovery amplifier
US7119977B2 (en) * 2004-04-17 2006-10-10 Agere Systems Inc. Reduced recovery time for perpendicular recording systems
US20070127149A1 (en) * 2005-12-02 2007-06-07 Texas Instruments Incorporated Offset cancellation scheme for perpendicular reader
US8144125B2 (en) 2006-03-30 2012-03-27 Cypress Semiconductor Corporation Apparatus and method for reducing average scan rate to detect a conductive object on a sensing device
US8547114B2 (en) 2006-11-14 2013-10-01 Cypress Semiconductor Corporation Capacitance to code converter with sigma-delta modulator
US8089288B1 (en) 2006-11-16 2012-01-03 Cypress Semiconductor Corporation Charge accumulation capacitance sensor with linear transfer characteristic
US8144126B2 (en) 2007-05-07 2012-03-27 Cypress Semiconductor Corporation Reducing sleep current in a capacitance sensing system
US8436263B2 (en) * 2007-06-29 2013-05-07 Cypress Semiconductor Corporation Noise resistant capacitive sensor
US8089289B1 (en) 2007-07-03 2012-01-03 Cypress Semiconductor Corporation Capacitive field sensor with sigma-delta modulator
US8169238B1 (en) * 2007-07-03 2012-05-01 Cypress Semiconductor Corporation Capacitance to frequency converter
US8570053B1 (en) 2007-07-03 2013-10-29 Cypress Semiconductor Corporation Capacitive field sensor with sigma-delta modulator
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US8321174B1 (en) 2008-09-26 2012-11-27 Cypress Semiconductor Corporation System and method to measure capacitance of capacitive sensor array
US8723827B2 (en) 2009-07-28 2014-05-13 Cypress Semiconductor Corporation Predictive touch surface scanning
US8711502B1 (en) 2012-10-12 2014-04-29 Lsi Corporation Preamplifier-to-channel communication in a storage device
TWI530090B (zh) * 2013-10-02 2016-04-11 聯詠科技股份有限公司 放大器電路及其操作方法
WO2015051535A1 (en) 2013-10-11 2015-04-16 Motorola Solutions, Inc. Interference detection and mitigation in radio frequency receivers
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US10896694B2 (en) * 2018-10-30 2021-01-19 Marvell Asia Pte, Ltd. Thermal compensation for laser in heat assisted magnetic recording
US11716097B2 (en) 2021-12-29 2023-08-01 Western Digital Technologies, Inc. Signal correction using soft information in a data channel

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Also Published As

Publication number Publication date
US6404578B1 (en) 2002-06-11
KR20010080588A (ko) 2001-08-22
JP2003510747A (ja) 2003-03-18
DE60016374D1 (de) 2005-01-05
EP1135769B1 (en) 2004-12-01
DE60016374T2 (de) 2005-12-01
WO2001024168A1 (en) 2001-04-05
US6400217B1 (en) 2002-06-04
EP1135769A1 (en) 2001-09-26

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Legal Events

Date Code Title Description
PA0105 International application

Patent event date: 20010525

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application
PC1203 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid