KR102669140B1 - 알루미늄 베이스 구조에 대한 e 척의 본딩 구조 - Google Patents

알루미늄 베이스 구조에 대한 e 척의 본딩 구조 Download PDF

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Publication number
KR102669140B1
KR102669140B1 KR1020180117680A KR20180117680A KR102669140B1 KR 102669140 B1 KR102669140 B1 KR 102669140B1 KR 1020180117680 A KR1020180117680 A KR 1020180117680A KR 20180117680 A KR20180117680 A KR 20180117680A KR 102669140 B1 KR102669140 B1 KR 102669140B1
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KR
South Korea
Prior art keywords
bonding layer
aperture
temperature control
layer structure
center
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
KR1020180117680A
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English (en)
Korean (ko)
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KR20190039389A (ko
Inventor
비제이 디. 파크헤
로저 앨런 린들리
Original Assignee
어플라이드 머티어리얼스, 인코포레이티드
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by 어플라이드 머티어리얼스, 인코포레이티드 filed Critical 어플라이드 머티어리얼스, 인코포레이티드
Publication of KR20190039389A publication Critical patent/KR20190039389A/ko
Priority to KR1020240065235A priority Critical patent/KR102918494B1/ko
Application granted granted Critical
Publication of KR102669140B1 publication Critical patent/KR102669140B1/ko
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Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/72Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using electrostatic chucks
    • H01L21/6833
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23QDETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q3/00Devices holding, supporting, or positioning work or tools, of a kind normally removable from the machine
    • B23Q3/15Devices for holding work using magnetic or electric force acting directly on the work
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B3/00Layered products comprising a layer with external or internal discontinuities or unevennesses, or a layer of non-planar shape; Layered products comprising a layer having particular features of form
    • B32B3/26Layered products comprising a layer with external or internal discontinuities or unevennesses, or a layer of non-planar shape; Layered products comprising a layer having particular features of form characterised by a particular shape of the outline of the cross-section of a continuous layer; characterised by a layer with cavities or internal voids ; characterised by an apertured layer
    • B32B3/266Layered products comprising a layer with external or internal discontinuities or unevennesses, or a layer of non-planar shape; Layered products comprising a layer having particular features of form characterised by a particular shape of the outline of the cross-section of a continuous layer; characterised by a layer with cavities or internal voids ; characterised by an apertured layer characterised by an apertured layer, the apertures going through the whole thickness of the layer, e.g. expanded metal, perforated layer, slit layer regular cells B32B3/12
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B5/00Layered products characterised by the non- homogeneity or physical structure, i.e. comprising a fibrous, filamentary, particulate or foam layer; Layered products characterised by having a layer differing constitutionally or physically in different parts
    • B32B5/18Layered products characterised by the non- homogeneity or physical structure, i.e. comprising a fibrous, filamentary, particulate or foam layer; Layered products characterised by having a layer differing constitutionally or physically in different parts characterised by features of a layer of foamed material
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B32LAYERED PRODUCTS
    • B32BLAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
    • B32B7/00Layered products characterised by the relation between layers; Layered products characterised by the relative orientation of features between layers, or by the relative values of a measurable parameter between layers, i.e. products comprising layers having different physical, chemical or physicochemical properties; Layered products characterised by the interconnection of layers
    • B32B7/04Interconnection of layers
    • B32B7/12Interconnection of layers using interposed adhesives or interposed materials with bonding properties
    • H01L21/6835
    • H01L24/743
    • HELECTRICITY
    • H02GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
    • H02NELECTRIC MACHINES NOT OTHERWISE PROVIDED FOR
    • H02N13/00Clutches or holding devices using electrostatic attraction, e.g. using Johnson-Rahbek effect
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/72Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using electrostatic chucks
    • H10P72/722Details of electrostatic chucks
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/76Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
    • H10P72/7604Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support
    • H10P72/7616Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a coating, a hardness or a material
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/70Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
    • H10P72/76Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
    • H10P72/7604Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support
    • H10P72/7624Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the mechanical construction of the susceptor, stage or support
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/24Structurally defined web or sheet [e.g., overall dimension, etc.]
    • Y10T428/24273Structurally defined web or sheet [e.g., overall dimension, etc.] including aperture
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/24Structurally defined web or sheet [e.g., overall dimension, etc.]
    • Y10T428/24273Structurally defined web or sheet [e.g., overall dimension, etc.] including aperture
    • Y10T428/24322Composite web or sheet
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/24Structurally defined web or sheet [e.g., overall dimension, etc.]
    • Y10T428/24273Structurally defined web or sheet [e.g., overall dimension, etc.] including aperture
    • Y10T428/24322Composite web or sheet
    • Y10T428/24331Composite web or sheet including nonapertured component
    • Y10T428/24339Keyed

Landscapes

  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Ceramic Products (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Pressure Welding/Diffusion-Bonding (AREA)
  • Flanged Joints, Insulating Joints, And Other Joints (AREA)
  • Adhesive Tapes (AREA)
  • Adhesives Or Adhesive Processes (AREA)
KR1020180117680A 2017-10-03 2018-10-02 알루미늄 베이스 구조에 대한 e 척의 본딩 구조 Active KR102669140B1 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1020240065235A KR102918494B1 (ko) 2017-10-03 2024-05-20 알루미늄 베이스 구조에 대한 e 척의 본딩 구조

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US15/724,045 2017-10-03
US15/724,045 US10688750B2 (en) 2017-10-03 2017-10-03 Bonding structure of E chuck to aluminum base configuration

Related Child Applications (1)

Application Number Title Priority Date Filing Date
KR1020240065235A Division KR102918494B1 (ko) 2017-10-03 2024-05-20 알루미늄 베이스 구조에 대한 e 척의 본딩 구조

Publications (2)

Publication Number Publication Date
KR20190039389A KR20190039389A (ko) 2019-04-11
KR102669140B1 true KR102669140B1 (ko) 2024-05-29

Family

ID=65896401

Family Applications (2)

Application Number Title Priority Date Filing Date
KR1020180117680A Active KR102669140B1 (ko) 2017-10-03 2018-10-02 알루미늄 베이스 구조에 대한 e 척의 본딩 구조
KR1020240065235A Active KR102918494B1 (ko) 2017-10-03 2024-05-20 알루미늄 베이스 구조에 대한 e 척의 본딩 구조

Family Applications After (1)

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KR1020240065235A Active KR102918494B1 (ko) 2017-10-03 2024-05-20 알루미늄 베이스 구조에 대한 e 척의 본딩 구조

Country Status (5)

Country Link
US (3) US10688750B2 (https=)
JP (3) JP7353024B2 (https=)
KR (2) KR102669140B1 (https=)
CN (4) CN120727644A (https=)
TW (2) TWI806799B (https=)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10688750B2 (en) 2017-10-03 2020-06-23 Applied Materials, Inc. Bonding structure of E chuck to aluminum base configuration
US10847402B2 (en) 2018-04-02 2020-11-24 Applied Materials, Inc. Bond protection around porous plugs
US11456161B2 (en) 2018-06-04 2022-09-27 Applied Materials, Inc. Substrate support pedestal
JP7387764B2 (ja) * 2019-05-24 2023-11-28 アプライド マテリアルズ インコーポレイテッド 結合層の保護が改善された基板支持キャリア
JP7291046B2 (ja) * 2019-09-18 2023-06-14 新光電気工業株式会社 基板固定装置
JP7319158B2 (ja) * 2019-09-30 2023-08-01 日本特殊陶業株式会社 保持装置
CN112687602B (zh) * 2019-10-18 2024-11-08 中微半导体设备(上海)股份有限公司 一种静电吸盘及其制造方法、等离子体处理装置
CN112908919B (zh) * 2019-12-04 2024-07-09 中微半导体设备(上海)股份有限公司 静电吸盘装置及包括该静电吸盘装置的等离子体处理装置
JP7458195B2 (ja) * 2020-02-10 2024-03-29 東京エレクトロン株式会社 載置台、プラズマ処理装置及びクリーニング処理方法
KR102779855B1 (ko) 2021-02-17 2025-03-10 어플라이드 머티어리얼스, 인코포레이티드 다공성 플러그 본딩
JP7255659B1 (ja) * 2021-11-25 2023-04-11 住友大阪セメント株式会社 静電チャック装置
US11794296B2 (en) 2022-02-03 2023-10-24 Applied Materials, Inc. Electrostatic chuck with porous plug
JP7645838B2 (ja) 2022-03-31 2025-03-14 日本碍子株式会社 ウエハ載置台
US12340980B2 (en) 2022-04-01 2025-06-24 Applied Materials, Inc. Plasma showerhead with improved uniformity
WO2024129283A1 (en) * 2022-12-16 2024-06-20 Lam Research Corporation Electrostatic chuck with halogen modulated silicone dike
JP7618098B2 (ja) * 2023-01-26 2025-01-20 日本碍子株式会社 ウエハ載置台
US20250037978A1 (en) * 2023-07-24 2025-01-30 Applied Materials, Inc. Gas distribution assemblies for semiconductor devices
WO2025038231A1 (en) * 2023-08-16 2025-02-20 Lam Research Corporation Electrostatic chuck with ceramic coating adhesion

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013118781A1 (ja) 2012-02-08 2013-08-15 東京エレクトロン株式会社 静電チャック装置
JP2015195346A (ja) 2014-03-27 2015-11-05 Toto株式会社 静電チャック
JP2017162899A (ja) 2016-03-08 2017-09-14 住友大阪セメント株式会社 静電チャック装置

Family Cites Families (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6490144B1 (en) 1999-11-29 2002-12-03 Applied Materials, Inc. Support for supporting a substrate in a process chamber
US7411331B2 (en) * 2002-05-10 2008-08-12 Massachusetts Institute Of Technology Dielectric elastomer actuated systems and methods
US7789736B2 (en) * 2006-10-13 2010-09-07 Applied Materials, Inc. Stepped retaining ring
JP5567494B2 (ja) 2007-12-19 2014-08-06 ラム リサーチ コーポレーション 半導体真空処理装置用のコンポーネント・アセンブリ、アセンブリを結合する方法、及び、半導体基板を処理する方法
US9520314B2 (en) 2008-12-19 2016-12-13 Applied Materials, Inc. High temperature electrostatic chuck bonding adhesive
US20100326602A1 (en) * 2009-06-30 2010-12-30 Intevac, Inc. Electrostatic chuck
JP5604888B2 (ja) * 2009-12-21 2014-10-15 住友大阪セメント株式会社 静電チャックの製造方法
JP5558178B2 (ja) * 2010-04-07 2014-07-23 オリンパス株式会社 蛍光観察装置
JP5143184B2 (ja) 2010-05-07 2013-02-13 日本碍子株式会社 ウエハー載置装置の製造方法
KR20110138788A (ko) * 2010-06-22 2011-12-28 하나 마이크론(주) 적층형 반도체 패키지
US9209061B2 (en) 2011-09-28 2015-12-08 Sumitomo Osaka Cement Co., Ltd. Electrostatic chuck device
KR102110108B1 (ko) * 2011-09-30 2020-05-13 어플라이드 머티어리얼스, 인코포레이티드 정전 척
KR101196441B1 (ko) * 2011-12-20 2012-11-01 이준호 정전 척의 리페어 방법
KR20130104738A (ko) * 2012-03-15 2013-09-25 코리아세미텍 주식회사 정전척 및 그 제조방법
JP6005579B2 (ja) 2012-04-27 2016-10-12 日本碍子株式会社 半導体製造装置用部材
US9685356B2 (en) 2012-12-11 2017-06-20 Applied Materials, Inc. Substrate support assembly having metal bonded protective layer
JP6140457B2 (ja) * 2013-01-21 2017-05-31 東京エレクトロン株式会社 接着方法、載置台及び基板処理装置
JP6110159B2 (ja) 2013-02-22 2017-04-05 日本特殊陶業株式会社 複合部材及びその製造方法
JP6162428B2 (ja) * 2013-02-27 2017-07-12 日本特殊陶業株式会社 支持装置
JP5633766B2 (ja) 2013-03-29 2014-12-03 Toto株式会社 静電チャック
KR101385950B1 (ko) * 2013-09-16 2014-04-16 주식회사 펨빅스 정전척 및 정전척 제조 방법
JP6181572B2 (ja) 2014-02-13 2017-08-16 日本特殊陶業株式会社 静電チャック用の接着シート及びその製造方法
CN204102876U (zh) * 2014-10-16 2015-01-14 中芯国际集成电路制造(北京)有限公司 一种晶片承载装置
KR102508955B1 (ko) 2015-02-18 2023-03-13 스미토모 오사카 세멘토 가부시키가이샤 정전 척 장치 및 반도체 제조 장치
KR20170128585A (ko) 2015-03-20 2017-11-22 어플라이드 머티어리얼스, 인코포레이티드 고온 폴리머 본드를 이용하여 금속 베이스에 본딩 결합된 세라믹 정전 척
JP6008063B1 (ja) * 2015-03-24 2016-10-19 住友大阪セメント株式会社 静電チャック装置
US9608550B2 (en) 2015-05-29 2017-03-28 Lam Research Corporation Lightup prevention using multi-layer ceramic fabrication techniques
US11227749B2 (en) 2016-02-18 2022-01-18 Lam Research Corporation 3D printed plasma arrestor for an electrostatic chuck
US10249526B2 (en) 2016-03-04 2019-04-02 Applied Materials, Inc. Substrate support assembly for high temperature processes
JP6688715B2 (ja) 2016-09-29 2020-04-28 東京エレクトロン株式会社 載置台及びプラズマ処理装置
US10688750B2 (en) 2017-10-03 2020-06-23 Applied Materials, Inc. Bonding structure of E chuck to aluminum base configuration
JP6994981B2 (ja) 2018-02-26 2022-01-14 東京エレクトロン株式会社 プラズマ処理装置及び載置台の製造方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013118781A1 (ja) 2012-02-08 2013-08-15 東京エレクトロン株式会社 静電チャック装置
JP2015195346A (ja) 2014-03-27 2015-11-05 Toto株式会社 静電チャック
JP2017162899A (ja) 2016-03-08 2017-09-14 住友大阪セメント株式会社 静電チャック装置

Also Published As

Publication number Publication date
CN109599356B (zh) 2025-07-04
CN120727644A (zh) 2025-09-30
TWI806799B (zh) 2023-06-21
JP7682966B2 (ja) 2025-05-26
JP2025122029A (ja) 2025-08-20
KR20190039389A (ko) 2019-04-11
US11794441B2 (en) 2023-10-24
JP7353024B2 (ja) 2023-09-29
CN211700228U (zh) 2020-10-16
US10688750B2 (en) 2020-06-23
CN109599356A (zh) 2019-04-09
US11192323B2 (en) 2021-12-07
US20200276785A1 (en) 2020-09-03
TW201916246A (zh) 2019-04-16
US20190099977A1 (en) 2019-04-04
TWI786194B (zh) 2022-12-11
US20220063236A1 (en) 2022-03-03
JP2023171803A (ja) 2023-12-05
TW202312345A (zh) 2023-03-16
CN209461436U (zh) 2019-10-01
KR102918494B1 (ko) 2026-01-26
KR20240074739A (ko) 2024-05-28
JP2019068044A (ja) 2019-04-25

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