KR102438353B1 - 감시 회로 및 반도체 장치 - Google Patents
감시 회로 및 반도체 장치 Download PDFInfo
- Publication number
- KR102438353B1 KR102438353B1 KR1020180036522A KR20180036522A KR102438353B1 KR 102438353 B1 KR102438353 B1 KR 102438353B1 KR 1020180036522 A KR1020180036522 A KR 1020180036522A KR 20180036522 A KR20180036522 A KR 20180036522A KR 102438353 B1 KR102438353 B1 KR 102438353B1
- Authority
- KR
- South Korea
- Prior art keywords
- output
- circuit
- current
- detection circuit
- output transistor
- Prior art date
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
- G01R19/16538—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
- G05B19/042—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
- G05B19/0428—Safety, monitoring
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
- G01R19/16538—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies
- G01R19/16552—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application in AC or DC supplies in I.C. power supplies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31721—Power aspects, e.g. power supplies for test circuits, power saving during test
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
- G01R19/16571—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 comparing AC or DC current with one threshold, e.g. load current, over-current, surge current or fault current
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31712—Input or output aspects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/26—Power supply means, e.g. regulation thereof
- G06F1/32—Means for saving power
- G06F1/3203—Power management, i.e. event-based initiation of a power-saving mode
- G06F1/3206—Monitoring of events, devices or parameters that trigger a change in power modality
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/26—Power supply means, e.g. regulation thereof
- G06F1/32—Means for saving power
- G06F1/3203—Power management, i.e. event-based initiation of a power-saving mode
- G06F1/3234—Power saving characterised by the action undertaken
- G06F1/3287—Power saving characterised by the action undertaken by switching off individual functional units in the computer system
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/30—Monitoring
- G06F11/3003—Monitoring arrangements specially adapted to the computing system or computing system component being monitored
- G06F11/3024—Monitoring arrangements specially adapted to the computing system or computing system component being monitored where the computing system component is a central processing unit [CPU]
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/30—Monitoring
- G06F11/3055—Monitoring arrangements for monitoring the status of the computing system or of the computing system component, e.g. monitoring if the computing system is on, off, available, not available
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/20—Pc systems
- G05B2219/24—Pc safety
- G05B2219/24024—Safety, surveillance
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Computing Systems (AREA)
- Power Engineering (AREA)
- Quality & Reliability (AREA)
- Computer Hardware Design (AREA)
- Mathematical Physics (AREA)
- Automation & Control Theory (AREA)
- Continuous-Control Power Sources That Use Transistors (AREA)
- Electronic Switches (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPJP-P-2017-072218 | 2017-03-31 | ||
JP2017072218A JP6814085B2 (ja) | 2017-03-31 | 2017-03-31 | 監視回路及び半導体装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20180111643A KR20180111643A (ko) | 2018-10-11 |
KR102438353B1 true KR102438353B1 (ko) | 2022-08-31 |
Family
ID=63669224
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020180036522A KR102438353B1 (ko) | 2017-03-31 | 2018-03-29 | 감시 회로 및 반도체 장치 |
Country Status (5)
Country | Link |
---|---|
US (1) | US10613122B2 (ja) |
JP (1) | JP6814085B2 (ja) |
KR (1) | KR102438353B1 (ja) |
CN (1) | CN108693801B (ja) |
TW (1) | TWI754030B (ja) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112187267B (zh) * | 2019-07-01 | 2022-09-16 | 江阴圣邦微电子制造有限公司 | 电流采样电路及其控制方法 |
KR20210118294A (ko) | 2020-03-19 | 2021-09-30 | 삼성전자주식회사 | 내부 에러를 검출하기 위한 전원 관리 회로 및 전자 장치 |
JP7361675B2 (ja) * | 2020-11-30 | 2023-10-16 | 三菱電機株式会社 | 半導体装置 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000232728A (ja) | 1998-12-09 | 2000-08-22 | Seiko Epson Corp | 電源装置およびその制御方法、携帯型電子機器、計時装置およびその制御方法 |
JP2005191821A (ja) | 2003-12-25 | 2005-07-14 | Seiko Epson Corp | コンパレータ回路及び電源回路 |
JP2010166183A (ja) | 2009-01-13 | 2010-07-29 | Seiko Instruments Inc | 検出回路及びセンサ装置 |
Family Cites Families (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03231336A (ja) * | 1990-02-07 | 1991-10-15 | Zexel Corp | ウオッチドックタイマの故障検出装置 |
JP3429917B2 (ja) * | 1995-09-14 | 2003-07-28 | 富士通株式会社 | 電源監視回路 |
KR100360717B1 (ko) * | 2000-03-27 | 2002-11-13 | 김강철 | Cmos논리회로의 고장감지장치 |
CN100381021C (zh) * | 2002-05-24 | 2008-04-09 | 龚明甫 | 防止高频电子镇流器产生声振荡的方法及装置 |
JP4190853B2 (ja) * | 2002-10-15 | 2008-12-03 | 株式会社デンソー | 電流検出機能付き負荷駆動回路 |
JP2004140230A (ja) * | 2002-10-18 | 2004-05-13 | Sony Corp | 半導体およびガラス基板の処理方法 |
US7589507B2 (en) * | 2005-12-30 | 2009-09-15 | St-Ericsson Sa | Low dropout regulator with stability compensation |
US8325453B2 (en) * | 2009-05-28 | 2012-12-04 | Qualcomm, Incorporated | Short-circuit protection for switched output stages |
KR101230164B1 (ko) * | 2009-09-10 | 2013-02-05 | 가부시끼가이샤 도시바 | 모터 제어 장치와 세탁기 |
US8760824B2 (en) * | 2011-03-04 | 2014-06-24 | Fairchild Semiconductor Corporation | Ground fault circuit interrupter (GFCI) monitor |
US20120259575A1 (en) * | 2011-04-07 | 2012-10-11 | International Business Machines Corporation | Integrated circuit chip incorporating a test circuit that allows for on-chip stress testing in order to model or monitor device performance degradation |
JP5878742B2 (ja) * | 2011-11-30 | 2016-03-08 | ルネサスエレクトロニクス株式会社 | コントローラ |
JP2013238472A (ja) * | 2012-05-15 | 2013-11-28 | Renesas Electronics Corp | 半導体装置および電圧測定装置 |
TW201416698A (zh) * | 2012-10-24 | 2014-05-01 | Atomic Energy Council | 再生高壓游離腔數位環境監測儀 |
JP6268712B2 (ja) * | 2013-01-31 | 2018-01-31 | ミツミ電機株式会社 | 保護ic及び保護回路及び電池電圧監視方法 |
CN104050050A (zh) * | 2013-03-13 | 2014-09-17 | 施耐德电器工业公司 | 一种看门狗控制电路和控制方法 |
FR3013528B1 (fr) * | 2013-11-19 | 2016-01-01 | Valeo Equip Electr Moteur | Boucle de regulation porportionnelle integrale pour un dispositif regulateur numerique de machine electrique tournante a excitation de vehicule automobile |
CN103885849B (zh) * | 2014-03-13 | 2019-04-30 | 深圳怡化电脑股份有限公司 | 一种电子系统的看门狗电路 |
TWI503645B (zh) * | 2014-05-07 | 2015-10-11 | Nuvoton Technology Corp | 電壓調節器、方法與晶片 |
TWI587116B (zh) * | 2014-05-07 | 2017-06-11 | 新唐科技股份有限公司 | 電壓調節晶片 |
-
2017
- 2017-03-31 JP JP2017072218A patent/JP6814085B2/ja active Active
-
2018
- 2018-03-26 TW TW107110334A patent/TWI754030B/zh active
- 2018-03-29 CN CN201810270198.3A patent/CN108693801B/zh active Active
- 2018-03-29 US US15/939,936 patent/US10613122B2/en active Active
- 2018-03-29 KR KR1020180036522A patent/KR102438353B1/ko active IP Right Grant
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000232728A (ja) | 1998-12-09 | 2000-08-22 | Seiko Epson Corp | 電源装置およびその制御方法、携帯型電子機器、計時装置およびその制御方法 |
JP2005191821A (ja) | 2003-12-25 | 2005-07-14 | Seiko Epson Corp | コンパレータ回路及び電源回路 |
JP2010166183A (ja) | 2009-01-13 | 2010-07-29 | Seiko Instruments Inc | 検出回路及びセンサ装置 |
Also Published As
Publication number | Publication date |
---|---|
TW201837650A (zh) | 2018-10-16 |
CN108693801B (zh) | 2022-03-08 |
TWI754030B (zh) | 2022-02-01 |
CN108693801A (zh) | 2018-10-23 |
KR20180111643A (ko) | 2018-10-11 |
US10613122B2 (en) | 2020-04-07 |
US20180284164A1 (en) | 2018-10-04 |
JP2018173867A (ja) | 2018-11-08 |
JP6814085B2 (ja) | 2021-01-13 |
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E701 | Decision to grant or registration of patent right |