KR102368644B1 - 엔드포인트 검출을 위한 연속적인 피처 트래킹 - Google Patents

엔드포인트 검출을 위한 연속적인 피처 트래킹 Download PDF

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KR102368644B1
KR102368644B1 KR1020167033510A KR20167033510A KR102368644B1 KR 102368644 B1 KR102368644 B1 KR 102368644B1 KR 1020167033510 A KR1020167033510 A KR 1020167033510A KR 20167033510 A KR20167033510 A KR 20167033510A KR 102368644 B1 KR102368644 B1 KR 102368644B1
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South Korea
Prior art keywords
spectral feature
sequence
polishing
spectra
substrate
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Korean (ko)
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KR20160148676A (ko
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제프리 드류 데이비드
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어플라이드 머티어리얼스, 인코포레이티드
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    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00—Lapping machines or devices; Accessories
    • B24B37/005—Control means for lapping machines or devices
    • B24B37/013—Devices or means for detecting lapping completion
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B49/00—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
    • B24B49/12—Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation involving optical means
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting

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  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Constituent Portions Of Griding Lathes, Driving, Sensing And Control (AREA)
KR1020167033510A 2014-04-30 2015-04-13 엔드포인트 검출을 위한 연속적인 피처 트래킹 Active KR102368644B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US14/265,707 2014-04-30
US14/265,707 US9352440B2 (en) 2014-04-30 2014-04-30 Serial feature tracking for endpoint detection
PCT/US2015/025616 WO2015167790A1 (en) 2014-04-30 2015-04-13 Serial feature tracking for endpoint detection

Publications (2)

Publication Number Publication Date
KR20160148676A KR20160148676A (ko) 2016-12-26
KR102368644B1 true KR102368644B1 (ko) 2022-02-25

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KR1020167033510A Active KR102368644B1 (ko) 2014-04-30 2015-04-13 엔드포인트 검출을 위한 연속적인 피처 트래킹

Country Status (6)

Country Link
US (1) US9352440B2 (enExample)
JP (1) JP6440741B2 (enExample)
KR (1) KR102368644B1 (enExample)
CN (1) CN106463378B (enExample)
TW (1) TWI654678B (enExample)
WO (1) WO2015167790A1 (enExample)

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US8747189B2 (en) * 2011-04-26 2014-06-10 Applied Materials, Inc. Method of controlling polishing
WO2015163164A1 (ja) * 2014-04-22 2015-10-29 株式会社 荏原製作所 研磨方法および研磨装置
TWI816620B (zh) 2017-04-21 2023-09-21 美商應用材料股份有限公司 使用神經網路來監測的拋光裝置
US10898986B2 (en) * 2017-09-15 2021-01-26 Applied Materials, Inc. Chattering correction for accurate sensor position determination on wafer
TWI825075B (zh) 2018-04-03 2023-12-11 美商應用材料股份有限公司 針對墊子厚度使用機器學習及補償的拋光裝置、拋光系統、方法及電腦儲存媒體
US20200035495A1 (en) * 2018-07-25 2020-01-30 Globalfoundries Inc. Chemical-mechanical polishing with variable-pressure polishing pads
US12447578B2 (en) 2018-09-26 2025-10-21 Applied Materials, Inc. Compensation for substrate doping in edge reconstruction for in-situ electromagnetic inductive monitoring
JP2021028099A (ja) * 2019-08-09 2021-02-25 株式会社荏原製作所 終点検知装置、終点検知方法
CN110549240B (zh) * 2019-09-18 2020-12-29 清华大学 一种终点检测方法和化学机械抛光装置
CN112247740B (zh) * 2020-09-25 2025-12-09 富联裕展科技(深圳)有限公司 打磨装置、方法、辅助打磨的装置、系统及方法
CN116141178B (zh) * 2023-04-17 2023-07-18 杭州鄂达精密机电科技有限公司 一种半导体阀门的加工系统及其方法

Citations (2)

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JP2004001227A (ja) 1995-07-20 2004-01-08 Ebara Corp ポリッシング装置および方法
KR100510919B1 (ko) 1997-05-28 2005-11-22 램 리서치 코포레이션 화학적-기계적 폴리싱공정시 다중파장분광계를 사용하여 두께를 모니터하는 장치 및 방법

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US5838447A (en) 1995-07-20 1998-11-17 Ebara Corporation Polishing apparatus including thickness or flatness detector
TW398036B (en) 1998-08-18 2000-07-11 Promos Technologies Inc Method of monitoring of chemical mechanical polishing end point and uniformity
WO2000026613A1 (en) 1998-11-02 2000-05-11 Applied Materials, Inc. Optical monitoring of radial ranges in chemical mechanical polishing a metal layer on a substrate
US6399501B2 (en) 1999-12-13 2002-06-04 Applied Materials, Inc. Method and apparatus for detecting polishing endpoint with optical monitoring
JP2001287159A (ja) * 2000-04-05 2001-10-16 Nikon Corp 表面状態測定方法及び測定装置及び研磨装置及び半導体デバイス製造方法
JP2002359217A (ja) * 2001-05-31 2002-12-13 Omron Corp 研磨終点検出方法およびその装置
US7764377B2 (en) * 2005-08-22 2010-07-27 Applied Materials, Inc. Spectrum based endpointing for chemical mechanical polishing
KR101521414B1 (ko) * 2005-08-22 2015-05-19 어플라이드 머티어리얼스, 인코포레이티드 화학적 기계적 폴리싱의 스펙트럼 기반 모니터링을 위한 장치 및 방법
US7998358B2 (en) 2006-10-31 2011-08-16 Applied Materials, Inc. Peak-based endpointing for chemical mechanical polishing
JP2011000647A (ja) * 2009-06-16 2011-01-06 Ebara Corp 研磨監視方法
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JP5339859B2 (ja) * 2008-11-07 2013-11-13 株式会社東京精密 研磨終了時点の検出方法及び検出装置
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JP5376293B2 (ja) * 2008-11-17 2013-12-25 株式会社ニコン 終点検出装置および研磨装置
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US8834229B2 (en) 2010-05-05 2014-09-16 Applied Materials, Inc. Dynamically tracking spectrum features for endpoint detection
WO2011139571A2 (en) * 2010-05-05 2011-11-10 Applied Materials, Inc. Dynamically or adaptively tracking spectrum features for endpoint detection
US8930013B2 (en) 2010-06-28 2015-01-06 Applied Materials, Inc. Adaptively tracking spectrum features for endpoint detection
TWI478259B (zh) * 2010-07-23 2015-03-21 Applied Materials Inc 用於終點偵測之二維光譜特徵追蹤
KR101981814B1 (ko) * 2011-04-28 2019-05-23 어플라이드 머티어리얼스, 인코포레이티드 연마를 위한 모델 기반 스펙트럼 라이브러리의 생성
KR101892914B1 (ko) * 2012-03-08 2018-08-29 어플라이드 머티어리얼스, 인코포레이티드 측정된 스펙트럼에 대한 광학 모델의 피팅

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004001227A (ja) 1995-07-20 2004-01-08 Ebara Corp ポリッシング装置および方法
KR100510919B1 (ko) 1997-05-28 2005-11-22 램 리서치 코포레이션 화학적-기계적 폴리싱공정시 다중파장분광계를 사용하여 두께를 모니터하는 장치 및 방법

Also Published As

Publication number Publication date
CN106463378A (zh) 2017-02-22
TWI654678B (zh) 2019-03-21
JP6440741B2 (ja) 2018-12-19
US20150314415A1 (en) 2015-11-05
KR20160148676A (ko) 2016-12-26
JP2017515307A (ja) 2017-06-08
WO2015167790A1 (en) 2015-11-05
TW201606870A (zh) 2016-02-16
CN106463378B (zh) 2019-06-11
US9352440B2 (en) 2016-05-31

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