KR102353562B1 - 산화물 소결체, 스퍼터링용 타겟, 및 그것을 이용하여 얻어지는 산화물 반도체 박막 - Google Patents

산화물 소결체, 스퍼터링용 타겟, 및 그것을 이용하여 얻어지는 산화물 반도체 박막 Download PDF

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KR102353562B1
KR102353562B1 KR1020167022418A KR20167022418A KR102353562B1 KR 102353562 B1 KR102353562 B1 KR 102353562B1 KR 1020167022418 A KR1020167022418 A KR 1020167022418A KR 20167022418 A KR20167022418 A KR 20167022418A KR 102353562 B1 KR102353562 B1 KR 102353562B1
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thin film
oxide
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KR20160127732A (ko
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도쿠유키 나카야마
에이이치로 니시무라
후미히코 마츠무라
마사시 이와라
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미쓰이금속광업주식회사
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KR1020167022418A 2014-02-27 2015-02-12 산화물 소결체, 스퍼터링용 타겟, 및 그것을 이용하여 얻어지는 산화물 반도체 박막 Active KR102353562B1 (ko)

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Application Number Priority Date Filing Date Title
JPJP-P-2014-037022 2014-02-27
JP2014037022 2014-02-27
JPJP-P-2014-163148 2014-08-08
JP2014163148 2014-08-08
JPJP-P-2014-263621 2014-12-25
JP2014263621A JP6358083B2 (ja) 2014-02-27 2014-12-25 酸化物焼結体、スパッタリング用ターゲット、及びそれを用いて得られる酸化物半導体薄膜
PCT/JP2015/053848 WO2015129468A1 (ja) 2014-02-27 2015-02-12 酸化物焼結体、スパッタリング用ターゲット、及びそれを用いて得られる酸化物半導体薄膜

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KR20160127732A KR20160127732A (ko) 2016-11-04
KR102353562B1 true KR102353562B1 (ko) 2022-01-20

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US (1) US9670577B2 (https=)
JP (1) JP6358083B2 (https=)
KR (1) KR102353562B1 (https=)
CN (1) CN106029604B (https=)
TW (1) TWI547573B (https=)
WO (1) WO2015129468A1 (https=)

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JP6358329B2 (ja) * 2014-04-17 2018-07-18 住友金属鉱山株式会社 酸化物焼結体、スパッタリング用ターゲット、及びそれを用いて得られる酸化物半導体薄膜
JP6724057B2 (ja) * 2018-03-30 2020-07-15 Jx金属株式会社 スパッタリングターゲット部材
JP7247546B2 (ja) * 2018-11-26 2023-03-29 日新電機株式会社 薄膜トランジスタの製造方法
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