KR102344555B1 - 엔드 이펙터용 흡입 장치, 기판을 홀딩하기 위한 엔드 이펙터 및 엔드 이펙터를 제조하는 방법 - Google Patents
엔드 이펙터용 흡입 장치, 기판을 홀딩하기 위한 엔드 이펙터 및 엔드 이펙터를 제조하는 방법 Download PDFInfo
- Publication number
- KR102344555B1 KR102344555B1 KR1020180009854A KR20180009854A KR102344555B1 KR 102344555 B1 KR102344555 B1 KR 102344555B1 KR 1020180009854 A KR1020180009854 A KR 1020180009854A KR 20180009854 A KR20180009854 A KR 20180009854A KR 102344555 B1 KR102344555 B1 KR 102344555B1
- Authority
- KR
- South Korea
- Prior art keywords
- end effector
- layer
- substrate
- fastening
- sealing lip
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
- B25J15/00—Gripping heads and other end effectors
- B25J15/06—Gripping heads and other end effectors with vacuum or magnetic holding means
- B25J15/0616—Gripping heads and other end effectors with vacuum or magnetic holding means with vacuum
- B25J15/0683—Details of suction cup structure, e.g. grooves or ridges
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- H01L21/67712—
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
- H10P72/32—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations between different workstations
- H10P72/3206—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations between different workstations the substrate being handled substantially vertically
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
- B25J15/00—Gripping heads and other end effectors
- B25J15/06—Gripping heads and other end effectors with vacuum or magnetic holding means
- B25J15/0616—Gripping heads and other end effectors with vacuum or magnetic holding means with vacuum
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
- B25J19/00—Accessories fitted to manipulators, e.g. for monitoring, for viewing; Safety devices combined with or specially adapted for use in connection with manipulators
- B25J19/007—Means or methods for designing or fabricating manipulators
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- H01L21/67144—
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- H01L21/67721—
-
- H01L21/67742—
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0446—Apparatus for mounting on conductive members, e.g. leadframes or conductors on insulating substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
- H10P72/32—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations between different workstations
- H10P72/3212—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations between different workstations the substrates to be conveyed not being semiconductor wafers or large planar substrates, e.g. chips or lead frames
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/30—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations
- H10P72/33—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for conveying, e.g. between different workstations into and out of processing chamber
- H10P72/3302—Mechanical parts of transfer devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/76—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches
- H10P72/7602—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using mechanical means, e.g. clamps or pinches the wafers being placed on a robot blade or gripped by a gripper for conveyance
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/70—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping
- H10P72/78—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof for supporting or gripping using vacuum or suction, e.g. Bernoulli chucks
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S901/00—Robots
- Y10S901/30—End effector
- Y10S901/40—Vacuum or mangetic
Landscapes
- Engineering & Computer Science (AREA)
- Robotics (AREA)
- Mechanical Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Manipulator (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| NL2018243 | 2017-01-27 | ||
| NL2018243A NL2018243B1 (en) | 2017-01-27 | 2017-01-27 | Suction apparatus for an end effector, end effector for holding substrates and method of producing an end effector |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20180088598A KR20180088598A (ko) | 2018-08-06 |
| KR102344555B1 true KR102344555B1 (ko) | 2021-12-28 |
Family
ID=62843388
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020180009854A Active KR102344555B1 (ko) | 2017-01-27 | 2018-01-26 | 엔드 이펙터용 흡입 장치, 기판을 홀딩하기 위한 엔드 이펙터 및 엔드 이펙터를 제조하는 방법 |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US10259124B2 (https=) |
| JP (1) | JP2018157194A (https=) |
| KR (1) | KR102344555B1 (https=) |
| CN (1) | CN108364903A (https=) |
| AT (1) | AT519587B1 (https=) |
| DE (1) | DE102018100856A1 (https=) |
| NL (1) | NL2018243B1 (https=) |
| SG (1) | SG10201800716YA (https=) |
| TW (1) | TWI710438B (https=) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP3657537A1 (en) * | 2018-11-23 | 2020-05-27 | ATOTECH Deutschland GmbH | End effector for slab formed substrates |
| US11276593B2 (en) | 2019-07-22 | 2022-03-15 | Rorze Automation, Inc. | Systems and methods for horizontal wafer packaging |
| PT3772089T (pt) * | 2019-07-30 | 2021-06-28 | Semsysco Gmbh | Dispositivo de manuseamento de substrato para uma pastilha |
| US20230321758A1 (en) | 2022-03-25 | 2023-10-12 | Ii-Vi Delaware, Inc. | Laser-roughened reaction-bonded silicon carbide for wafer contact surface |
| EP4273911A1 (de) * | 2022-05-03 | 2023-11-08 | Werner Lieb GmbH | Haltevorrichtung und verfahren zum halten und/oder transportieren von werkstücken und/oder bauteilen, optional mit werkzeugfrei auswechselbaren saugerelementen |
| US12348002B2 (en) | 2022-05-31 | 2025-07-01 | Ii-Vi Delaware, Inc. | Current load-controlled laser driver |
| US12337467B2 (en) * | 2022-12-09 | 2025-06-24 | Formfactor, Inc. | Wafer-handling end effectors configured to selectively lift a wafer from an upper surface of the wafer, probe systems that include the wafer-handling end effectors, and methods of utilizing the wafer-handling end effectors |
| EP4658455A4 (en) * | 2023-03-13 | 2026-03-25 | Shanghai Flexiv Robotics Tech Co Ltd | ADHESION DEVICE AND ROBOT |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012199282A (ja) * | 2011-03-18 | 2012-10-18 | Tokyo Electron Ltd | 基板保持装置 |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4131267A (en) * | 1978-06-02 | 1978-12-26 | Disco Kabushiki Kaisha | Apparatus for holding workpiece by suction |
| JPH05267433A (ja) * | 1992-03-19 | 1993-10-15 | Nec Kyushu Ltd | 吸着パッド |
| US5226636A (en) * | 1992-06-10 | 1993-07-13 | International Business Machines Corporation | Holding fixture for substrates |
| JPH07273499A (ja) * | 1994-03-30 | 1995-10-20 | Matsushita Electric Ind Co Ltd | パネル保持装置 |
| JP3200285B2 (ja) * | 1994-06-29 | 2001-08-20 | キヤノン株式会社 | 基板搬送装置 |
| JP2002184835A (ja) | 2000-12-13 | 2002-06-28 | Ando Electric Co Ltd | 吸着パッド |
| US6942265B1 (en) * | 2002-10-23 | 2005-09-13 | Kla-Tencor Technologies Corporation | Apparatus comprising a flexible vacuum seal pad structure capable of retaining non-planar substrates thereto |
| US20050110292A1 (en) * | 2002-11-26 | 2005-05-26 | Axcelis Technologies, Inc. | Ceramic end effector for micro circuit manufacturing |
| US7641247B2 (en) * | 2002-12-17 | 2010-01-05 | Applied Materials, Inc. | End effector assembly for supporting a substrate |
| JP4468893B2 (ja) | 2003-01-29 | 2010-05-26 | 三星ダイヤモンド工業株式会社 | 真空吸着ヘッド |
| US7055875B2 (en) * | 2003-07-11 | 2006-06-06 | Asyst Technologies, Inc. | Ultra low contact area end effector |
| WO2010111784A1 (en) * | 2009-03-31 | 2010-10-07 | Ats Automation Tooling Systems Inc. | Vacuum gripper assembly stabilized by springs |
| US8801069B2 (en) * | 2010-02-26 | 2014-08-12 | Brooks Automation, Inc. | Robot edge contact gripper |
| JP2014176914A (ja) | 2013-03-14 | 2014-09-25 | Nippon Electric Glass Co Ltd | 吸着パッド及び吸着装置 |
| JP5861677B2 (ja) * | 2013-07-08 | 2016-02-16 | 株式会社安川電機 | 吸着構造、ロボットハンドおよびロボット |
| US9991152B2 (en) | 2014-03-06 | 2018-06-05 | Cascade Microtech, Inc. | Wafer-handling end effectors with wafer-contacting surfaces and sealing structures |
| NL2014625B1 (en) * | 2015-04-13 | 2017-01-06 | Suss Microtec Lithography Gmbh | Wafer treating device and sealing ring for a wafer treating device. |
-
2017
- 2017-01-27 NL NL2018243A patent/NL2018243B1/en active
-
2018
- 2018-01-16 DE DE102018100856.2A patent/DE102018100856A1/de active Pending
- 2018-01-19 US US15/875,713 patent/US10259124B2/en active Active
- 2018-01-22 TW TW107102181A patent/TWI710438B/zh active
- 2018-01-24 AT ATA50059/2018A patent/AT519587B1/de active
- 2018-01-26 JP JP2018011618A patent/JP2018157194A/ja active Pending
- 2018-01-26 SG SG10201800716YA patent/SG10201800716YA/en unknown
- 2018-01-26 KR KR1020180009854A patent/KR102344555B1/ko active Active
- 2018-01-29 CN CN201810084258.2A patent/CN108364903A/zh active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012199282A (ja) * | 2011-03-18 | 2012-10-18 | Tokyo Electron Ltd | 基板保持装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| AT519587B1 (de) | 2021-10-15 |
| NL2018243B1 (en) | 2018-08-07 |
| KR20180088598A (ko) | 2018-08-06 |
| AT519587A2 (de) | 2018-08-15 |
| SG10201800716YA (en) | 2018-08-30 |
| TW201831290A (zh) | 2018-09-01 |
| US10259124B2 (en) | 2019-04-16 |
| AT519587A3 (de) | 2020-02-15 |
| CN108364903A (zh) | 2018-08-03 |
| DE102018100856A1 (de) | 2018-08-02 |
| US20180215049A1 (en) | 2018-08-02 |
| TWI710438B (zh) | 2020-11-21 |
| JP2018157194A (ja) | 2018-10-04 |
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| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
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| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
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| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
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| A201 | Request for examination | ||
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
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| D13-X000 | Search requested |
St.27 status event code: A-1-2-D10-D13-srh-X000 |
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| D14-X000 | Search report completed |
St.27 status event code: A-1-2-D10-D14-srh-X000 |
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| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
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| AMND | Amendment | ||
| E13-X000 | Pre-grant limitation requested |
St.27 status event code: A-2-3-E10-E13-lim-X000 |
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| P11-X000 | Amendment of application requested |
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| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
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| E601 | Decision to refuse application | ||
| PE0601 | Decision on rejection of patent |
St.27 status event code: N-2-6-B10-B15-exm-PE0601 |
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| X091 | Application refused [patent] | ||
| AMND | Amendment | ||
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| P13-X000 | Application amended |
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| PX0901 | Re-examination |
St.27 status event code: A-2-3-E10-E12-rex-PX0901 |
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| PX0701 | Decision of registration after re-examination |
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| X701 | Decision to grant (after re-examination) | ||
| GRNT | Written decision to grant | ||
| PR0701 | Registration of establishment |
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| PR1002 | Payment of registration fee |
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