KR102214272B1 - 메모리 셀의 분산된 서브-블록의 액세스를 포함하는 장치 및 방법 - Google Patents

메모리 셀의 분산된 서브-블록의 액세스를 포함하는 장치 및 방법 Download PDF

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KR102214272B1
KR102214272B1 KR1020157007295A KR20157007295A KR102214272B1 KR 102214272 B1 KR102214272 B1 KR 102214272B1 KR 1020157007295 A KR1020157007295 A KR 1020157007295A KR 20157007295 A KR20157007295 A KR 20157007295A KR 102214272 B1 KR102214272 B1 KR 102214272B1
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memory
blocks
array
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KR20150047568A (ko
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도루 단자와
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마이크론 테크놀로지, 인크.
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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/02—Arrangements for writing information into, or reading information out from, a digital store with means for avoiding parasitic signals
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C8/00—Arrangements for selecting an address in a digital store
    • G11C8/10—Decoders
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0004—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements comprising amorphous/crystalline phase transition cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0021—Auxiliary circuits
    • G11C13/003—Cell access
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/02—Disposition of storage elements, e.g. in the form of a matrix array
    • G11C5/025—Geometric lay-out considerations of storage- and peripheral-blocks in a semiconductor storage device
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C5/00—Details of stores covered by group G11C11/00
    • G11C5/06—Arrangements for interconnecting storage elements electrically, e.g. by wiring
    • G11C5/063—Voltage and signal distribution in integrated semi-conductor memory access lines, e.g. word-line, bit-line, cross-over resistance, propagation delay
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C8/00—Arrangements for selecting an address in a digital store
    • G11C8/12—Group selection circuits, e.g. for memory block selection, chip selection, array selection
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C8/00—Arrangements for selecting an address in a digital store
    • G11C8/16—Multiple access memory array, e.g. addressing one storage element via at least two independent addressing line groups
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C8/00—Arrangements for selecting an address in a digital store
    • G11C8/18—Address timing or clocking circuits; Address control signal generation or management, e.g. for row address strobe [RAS] or column address strobe [CAS] signals
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/408—Address circuits
    • G11C11/4087—Address decoders, e.g. bit - or word line decoders; Multiple line decoders
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G11C16/0483—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells having several storage transistors connected in series
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/08—Address circuits; Decoders; Word-line control circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3418—Disturbance prevention or evaluation; Refreshing of disturbed memory data
    • G11C16/3427—Circuits or methods to prevent or reduce disturbance of the state of a memory cell when neighbouring cells are read or written

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Dram (AREA)
  • Read Only Memory (AREA)
  • Semiconductor Memories (AREA)
KR1020157007295A 2012-08-21 2013-08-20 메모리 셀의 분산된 서브-블록의 액세스를 포함하는 장치 및 방법 Active KR102214272B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/590,926 US8891305B2 (en) 2012-08-21 2012-08-21 Apparatuses and methods involving accessing distributed sub-blocks of memory cells
US13/590,926 2012-08-21
PCT/US2013/055767 WO2014031624A1 (en) 2012-08-21 2013-08-20 Apparatuses and methods involving accessing distributed sub-blocks of memory cells

Publications (2)

Publication Number Publication Date
KR20150047568A KR20150047568A (ko) 2015-05-04
KR102214272B1 true KR102214272B1 (ko) 2021-02-10

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Country Status (7)

Country Link
US (5) US8891305B2 (enExample)
EP (2) EP3686890A1 (enExample)
JP (1) JP6321650B2 (enExample)
KR (1) KR102214272B1 (enExample)
CN (1) CN104685569B (enExample)
TW (1) TWI512756B (enExample)
WO (1) WO2014031624A1 (enExample)

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CN107689377A (zh) * 2016-08-06 2018-02-13 厦门海存艾匹科技有限公司 含有分离地址/数据转换器的三维一次电编程存储器
US8891305B2 (en) * 2012-08-21 2014-11-18 Micron Technology, Inc. Apparatuses and methods involving accessing distributed sub-blocks of memory cells
US9312005B2 (en) * 2013-09-10 2016-04-12 Micron Technology, Inc. Accessing memory cells in parallel in a cross-point array
CN112074816B (zh) 2018-03-16 2025-02-21 美光科技公司 Nand数据放置模式的集群奇偶校验
US11521690B2 (en) 2018-03-16 2022-12-06 Micron Technology, Inc. NAND data placement schema
US11271002B2 (en) 2019-04-12 2022-03-08 Micron Technology, Inc. Methods used in forming a memory array comprising strings of memory cells
US12483804B2 (en) * 2023-12-08 2025-11-25 Varjo Technologies Oy Subsampling and wobulation in colour filter arrays having smallest repeating units with different sub-units
US20250193542A1 (en) * 2023-12-08 2025-06-12 Varjo Technologies Oy Selective reading in colour filter arrays having smallest repeating units with different sub-units

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JP2007095222A (ja) * 2005-09-30 2007-04-12 Eastman Kodak Co 半導体メモリ及びそのメモリコントローラ
US20120206980A1 (en) * 2008-01-09 2012-08-16 Unity Semiconductor Corporation Buffering systems for accessing multiple layers of memory in integrated circuits

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JP4458584B2 (ja) * 1999-09-07 2010-04-28 株式会社ルネサステクノロジ 半導体記憶装置
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JP2007095222A (ja) * 2005-09-30 2007-04-12 Eastman Kodak Co 半導体メモリ及びそのメモリコントローラ
US20120206980A1 (en) * 2008-01-09 2012-08-16 Unity Semiconductor Corporation Buffering systems for accessing multiple layers of memory in integrated circuits

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US9779791B2 (en) 2017-10-03
US20150063022A1 (en) 2015-03-05
EP3686890A1 (en) 2020-07-29
JP2015529929A (ja) 2015-10-08
EP2888740A1 (en) 2015-07-01
EP2888740B1 (en) 2020-03-11
TWI512756B (zh) 2015-12-11
US10734049B2 (en) 2020-08-04
US11282556B2 (en) 2022-03-22
JP6321650B2 (ja) 2018-05-09
US8891305B2 (en) 2014-11-18
EP2888740A4 (en) 2016-04-13
CN104685569A (zh) 2015-06-03
KR20150047568A (ko) 2015-05-04
CN104685569B (zh) 2016-07-06
WO2014031624A1 (en) 2014-02-27
US20180122443A1 (en) 2018-05-03
US20140056070A1 (en) 2014-02-27
US20190279695A1 (en) 2019-09-12
TW201419302A (zh) 2014-05-16
US20210020214A1 (en) 2021-01-21
US10170169B2 (en) 2019-01-01

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