KR102179261B1 - 고속 촬상 방법 및 고속 촬상 장치 - Google Patents

고속 촬상 방법 및 고속 촬상 장치 Download PDF

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KR102179261B1
KR102179261B1 KR1020157030449A KR20157030449A KR102179261B1 KR 102179261 B1 KR102179261 B1 KR 102179261B1 KR 1020157030449 A KR1020157030449 A KR 1020157030449A KR 20157030449 A KR20157030449 A KR 20157030449A KR 102179261 B1 KR102179261 B1 KR 102179261B1
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South Korea
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imaging
work
luminance value
imager
imagers
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KR1020157030449A
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Korean (ko)
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KR20150135431A (ko
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겐지 오쿠보
치사 이나카
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토레이 엔지니어링 컴퍼니, 리미티드
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Publication of KR20150135431A publication Critical patent/KR20150135431A/ko
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N1/00—Scanning, transmission or reproduction of documents or the like, e.g. facsimile transmission; Details thereof
    • H04N1/04—Scanning arrangements, i.e. arrangements for the displacement of active reading or reproducing elements relative to the original or reproducing medium, or vice versa
    • H04N1/19—Scanning arrangements, i.e. arrangements for the displacement of active reading or reproducing elements relative to the original or reproducing medium, or vice versa using multi-element arrays
KR1020157030449A 2013-03-27 2014-02-21 고속 촬상 방법 및 고속 촬상 장치 KR102179261B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2013066593A JP6238541B2 (ja) 2013-03-27 2013-03-27 高速撮像方法および高速撮像装置
JPJP-P-2013-066593 2013-03-27
PCT/JP2014/054103 WO2014156396A1 (ja) 2013-03-27 2014-02-21 高速撮像方法および高速撮像装置

Publications (2)

Publication Number Publication Date
KR20150135431A KR20150135431A (ko) 2015-12-02
KR102179261B1 true KR102179261B1 (ko) 2020-11-16

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Application Number Title Priority Date Filing Date
KR1020157030449A KR102179261B1 (ko) 2013-03-27 2014-02-21 고속 촬상 방법 및 고속 촬상 장치

Country Status (4)

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JP (1) JP6238541B2 (ja)
KR (1) KR102179261B1 (ja)
CN (1) CN105103533B (ja)
WO (1) WO2014156396A1 (ja)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7209329B2 (ja) * 2018-06-28 2023-01-20 株式会社 システムスクエア 検査装置
CN111727601A (zh) * 2018-09-30 2020-09-29 深圳配天智能技术研究院有限公司 图像传感器、获取图像的方法、视觉系统及存储介质
JP2020136361A (ja) * 2019-02-14 2020-08-31 ファスフォードテクノロジ株式会社 実装装置および半導体装置の製造方法
CN111610195A (zh) * 2019-02-22 2020-09-01 上海微电子装备（集团）股份有限公司 一种缺陷检测装置
CN110388960B (zh) * 2019-07-05 2021-12-14 燕山大学 用低速相机实现高速运动产品质量检测装置
CN111780682A (zh) * 2019-12-12 2020-10-16 天目爱视（北京）科技有限公司 一种基于伺服系统的3d图像采集控制方法
CN111551556B (zh) * 2020-05-20 2023-09-12 上海御微半导体技术有限公司 一种缺陷检测装置及缺陷检测方法
CN114598814A (zh) * 2022-02-28 2022-06-07 厦门聚视智创科技有限公司 一种多工位线扫相机触发控制系统
CN115908618B (zh) * 2023-02-28 2023-06-02 脉冲视觉(北京)科技有限公司 基于脉冲数据的重构图像生成方法、装置、设备及介质
CN117232396B (zh) * 2023-11-15 2024-02-06 湖南睿图智能科技有限公司 一种高速生产线产品质量视觉检测系统及方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003133224A (ja) * 2001-10-30 2003-05-09 Canon Inc 表面位置設定方法、表面位置設定装置及び露光装置
JP2011149701A (ja) 2010-01-19 2011-08-04 Shonai Create Kogyo:Kk ラインセンサーカメラを用いたｘ線検査装置
JP2013228338A (ja) 2012-04-27 2013-11-07 Panasonic Corp 撮像方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3399554B2 (ja) * 1992-03-10 2003-04-21 株式会社リコー 画像読み取り装置
JPH0749301A (ja) * 1993-08-03 1995-02-21 Toa Medical Electronics Co Ltd 粒子分析装置
JP4536293B2 (ja) * 2001-06-25 2010-09-01 ヤマハ発動機株式会社 部品検査装置及び同装置を搭載した表面実装機
JP3907560B2 (ja) 2002-09-04 2007-04-18 株式会社シーアイエス 画素ずらし用駆動装置
JP2006221514A (ja) * 2005-02-14 2006-08-24 Canon Inc 生体認証装置及び画像取得方法
JP2009262161A (ja) * 2008-04-22 2009-11-12 Olympus Corp 修正装置、修正方法、制御装置、およびプログラム
JP5753020B2 (ja) * 2011-08-03 2015-07-22 ヤマハ発動機株式会社 部品実装装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003133224A (ja) * 2001-10-30 2003-05-09 Canon Inc 表面位置設定方法、表面位置設定装置及び露光装置
JP2011149701A (ja) 2010-01-19 2011-08-04 Shonai Create Kogyo:Kk ラインセンサーカメラを用いたｘ線検査装置
JP2013228338A (ja) 2012-04-27 2013-11-07 Panasonic Corp 撮像方法

Also Published As

Publication number Publication date
WO2014156396A1 (ja) 2014-10-02
JP2014192721A (ja) 2014-10-06
JP6238541B2 (ja) 2017-11-29
KR20150135431A (ko) 2015-12-02
CN105103533B (zh) 2018-05-25
CN105103533A (zh) 2015-11-25

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