KR102106724B1 - X 선 발생 장치 및 방법, 그리고 시료 측정 시스템 - Google Patents

X 선 발생 장치 및 방법, 그리고 시료 측정 시스템 Download PDF

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Publication number
KR102106724B1
KR102106724B1 KR1020187007655A KR20187007655A KR102106724B1 KR 102106724 B1 KR102106724 B1 KR 102106724B1 KR 1020187007655 A KR1020187007655 A KR 1020187007655A KR 20187007655 A KR20187007655 A KR 20187007655A KR 102106724 B1 KR102106724 B1 KR 102106724B1
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KR
South Korea
Prior art keywords
ray
electron
electron source
generator
rotating
Prior art date
Application number
KR1020187007655A
Other languages
English (en)
Korean (ko)
Other versions
KR20180042328A (ko
Inventor
가츠미 가와사키
히로시 지바
쥬지 가타야마
Original Assignee
브루커 제팬 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2015170101A external-priority patent/JP6537936B2/ja
Priority claimed from JP2015214418A external-priority patent/JP6552942B2/ja
Application filed by 브루커 제팬 가부시키가이샤 filed Critical 브루커 제팬 가부시키가이샤
Publication of KR20180042328A publication Critical patent/KR20180042328A/ko
Application granted granted Critical
Publication of KR102106724B1 publication Critical patent/KR102106724B1/ko

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00X-ray tubes
    • H01J35/24Tubes wherein the point of impact of the cathode ray on the anode or anticathode is movable relative to the surface thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00X-ray tubes
    • H01J35/02Details
    • H01J35/04Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/06Cathodes
    • H01J35/064Details of the emitter, e.g. material or structure
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00X-ray tubes
    • H01J35/02Details
    • H01J35/04Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/06Cathodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00X-ray tubes
    • H01J35/24Tubes wherein the point of impact of the cathode ray on the anode or anticathode is movable relative to the surface thereof
    • H01J35/26Tubes wherein the point of impact of the cathode ray on the anode or anticathode is movable relative to the surface thereof by rotation of the anode or anticathode
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2235/00X-ray tubes
    • H01J2235/06Cathode assembly
    • H01J2235/064Movement of cathode
    • H01J2235/066Rotation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00X-ray tubes
    • H01J35/02Details
    • H01J35/04Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/08Anodes; Anti cathodes
    • H01J35/10Rotary anodes; Arrangements for rotating anodes; Cooling rotary anodes

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
  • X-Ray Techniques (AREA)
KR1020187007655A 2015-08-31 2016-07-26 X 선 발생 장치 및 방법, 그리고 시료 측정 시스템 KR102106724B1 (ko)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2015170101A JP6537936B2 (ja) 2015-08-31 2015-08-31 X線発生装置及び方法、並びに試料測定システム
JPJP-P-2015-170101 2015-08-31
JP2015214418A JP6552942B2 (ja) 2015-10-30 2015-10-30 X線発生装置及び試料測定システム
JPJP-P-2015-214418 2015-10-30
PCT/JP2016/071811 WO2017038302A1 (fr) 2015-08-31 2016-07-26 Dispositif et procédé de génération de rayons x, et système de mesure d'échantillon

Publications (2)

Publication Number Publication Date
KR20180042328A KR20180042328A (ko) 2018-04-25
KR102106724B1 true KR102106724B1 (ko) 2020-05-04

Family

ID=58188900

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020187007655A KR102106724B1 (ko) 2015-08-31 2016-07-26 X 선 발생 장치 및 방법, 그리고 시료 측정 시스템

Country Status (4)

Country Link
EP (1) EP3346484B1 (fr)
KR (1) KR102106724B1 (fr)
MA (1) MA43905A (fr)
WO (1) WO2017038302A1 (fr)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012142114A (ja) * 2010-12-28 2012-07-26 Rigaku Corp X線発生装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6139351A (ja) * 1984-07-30 1986-02-25 Mitsubishi Heavy Ind Ltd X線発生装置
JP2827121B2 (ja) * 1988-02-09 1998-11-18 理学電機株式会社 点焦点と線焦点を切替可能なx線管球
JPH0562623A (ja) * 1991-09-04 1993-03-12 Rigaku Corp X線発生装置の冷却装置
JPH0584302U (ja) * 1992-04-23 1993-11-16 横河メディカルシステム株式会社 X線管
JPH0620629A (ja) * 1992-07-01 1994-01-28 Rigaku Corp 回転対陰極x線発生装置
JPH0765759A (ja) * 1993-08-30 1995-03-10 Rigaku Corp ライン/ポイントフォーカスを選択して取り出し可能な横型x線発生装置
JPH08162285A (ja) * 1994-10-03 1996-06-21 Rigaku Corp 回転対陰極x線管、x線発生装置、およびx線発生装置の組立方法
US7248672B2 (en) * 2005-04-21 2007-07-24 Bruker Axs, Inc. Multiple-position x-ray tube for diffractometer
US7852987B2 (en) * 2009-05-18 2010-12-14 King Fahd University Of Petroleum And Minerals X-ray tube having a rotating and linearly translating anode
US8879690B2 (en) * 2010-12-28 2014-11-04 Rigaku Corporation X-ray generator
DE102012203807A1 (de) * 2012-03-12 2013-09-12 Siemens Aktiengesellschaft Röntgenröhre
DE102012211661B4 (de) * 2012-07-04 2022-09-08 Siemens Healthcare Gmbh Röntgenaufnahmesystem zur Erzeugung von Tomosynthese-Bilddaten

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012142114A (ja) * 2010-12-28 2012-07-26 Rigaku Corp X線発生装置

Also Published As

Publication number Publication date
EP3346484A4 (fr) 2019-05-01
MA43905A (fr) 2018-12-05
EP3346484A1 (fr) 2018-07-11
EP3346484B1 (fr) 2021-10-13
WO2017038302A1 (fr) 2017-03-09
KR20180042328A (ko) 2018-04-25

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E701 Decision to grant or registration of patent right