KR101970290B1 - 설정가능한 인터페이스를 가진 테스트 기기 - Google Patents

설정가능한 인터페이스를 가진 테스트 기기 Download PDF

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Publication number
KR101970290B1
KR101970290B1 KR1020147014230A KR20147014230A KR101970290B1 KR 101970290 B1 KR101970290 B1 KR 101970290B1 KR 1020147014230 A KR1020147014230 A KR 1020147014230A KR 20147014230 A KR20147014230 A KR 20147014230A KR 101970290 B1 KR101970290 B1 KR 101970290B1
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South Korea
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test
processing system
port
programmable logic
different settings
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Korean (ko)
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KR20140091719A (ko
Inventor
스티븐 제이. 부라사
마이클 프란시스 맥골드릭
데이비드 카우샨스키
마이클 토마스 플루엣
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테라다인 인코퍼레이티드
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G01R31/2889—Interfaces, e.g. between probe and tester
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31704—Design for test; Design verification
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
KR1020147014230A 2011-10-28 2012-09-20 설정가능한 인터페이스를 가진 테스트 기기 Active KR101970290B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/284,378 US9470759B2 (en) 2011-10-28 2011-10-28 Test instrument having a configurable interface
US13/284,378 2011-10-28
PCT/US2012/056247 WO2013062692A1 (en) 2011-10-28 2012-09-20 Test instrument having a configurable interface

Publications (2)

Publication Number Publication Date
KR20140091719A KR20140091719A (ko) 2014-07-22
KR101970290B1 true KR101970290B1 (ko) 2019-04-18

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Country Status (6)

Country Link
US (1) US9470759B2 (cg-RX-API-DMAC7.html)
EP (1) EP2771704A4 (cg-RX-API-DMAC7.html)
JP (1) JP2014532862A (cg-RX-API-DMAC7.html)
KR (1) KR101970290B1 (cg-RX-API-DMAC7.html)
IN (1) IN2014CN02499A (cg-RX-API-DMAC7.html)
WO (1) WO2013062692A1 (cg-RX-API-DMAC7.html)

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US12315585B2 (en) 2019-08-06 2025-05-27 Advantest Corporation Automated test equipment comprising a plurality of communication interfaces to a device under test

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US11169203B1 (en) 2018-09-26 2021-11-09 Teradyne, Inc. Determining a configuration of a test system
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US11408927B2 (en) 2019-06-18 2022-08-09 Teradyne, Inc. Functional testing with inline parametric testing
US11461222B2 (en) 2020-04-16 2022-10-04 Teradyne, Inc. Determining the complexity of a test program
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CN113868038B (zh) * 2021-08-30 2024-06-04 中科可控信息产业有限公司 信号测试方法、装置、计算机设备和存储介质
CN114020554A (zh) * 2021-10-30 2022-02-08 江苏信而泰智能装备有限公司 一种测试仪的端口隔离方法和具有端口隔离功能的测试仪
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Also Published As

Publication number Publication date
IN2014CN02499A (cg-RX-API-DMAC7.html) 2015-06-26
US9470759B2 (en) 2016-10-18
US20130110446A1 (en) 2013-05-02
EP2771704A4 (en) 2015-03-25
WO2013062692A1 (en) 2013-05-02
JP2014532862A (ja) 2014-12-08
KR20140091719A (ko) 2014-07-22
EP2771704A1 (en) 2014-09-03

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