KR101933723B1 - 프로그램가능 프로토콜 발생기 - Google Patents

프로그램가능 프로토콜 발생기 Download PDF

Info

Publication number
KR101933723B1
KR101933723B1 KR1020127009910A KR20127009910A KR101933723B1 KR 101933723 B1 KR101933723 B1 KR 101933723B1 KR 1020127009910 A KR1020127009910 A KR 1020127009910A KR 20127009910 A KR20127009910 A KR 20127009910A KR 101933723 B1 KR101933723 B1 KR 101933723B1
Authority
KR
South Korea
Prior art keywords
data
semiconductor device
pattern generator
under test
patgen
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
KR1020127009910A
Other languages
English (en)
Korean (ko)
Other versions
KR20120093888A (ko
Inventor
조지 더블유. 코너
Original Assignee
테라다인 인코퍼레이티드
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 테라다인 인코퍼레이티드 filed Critical 테라다인 인코퍼레이티드
Publication of KR20120093888A publication Critical patent/KR20120093888A/ko
Application granted granted Critical
Publication of KR101933723B1 publication Critical patent/KR101933723B1/ko
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2601—Apparatus or methods therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318314—Tools, e.g. program interfaces, test suite, test bench, simulation hardware, test compiler, test program languages

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
KR1020127009910A 2009-10-08 2010-02-05 프로그램가능 프로토콜 발생기 Active KR101933723B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/575,800 US8269520B2 (en) 2009-10-08 2009-10-08 Using pattern generators to control flow of data to and from a semiconductor device under test
US12/575,800 2009-10-08
PCT/US2010/023280 WO2011043832A1 (en) 2009-10-08 2010-02-05 Programmable protocol generator

Related Child Applications (1)

Application Number Title Priority Date Filing Date
KR1020167023561A Division KR20160105984A (ko) 2009-10-08 2010-02-05 프로그램가능 프로토콜 발생기

Publications (2)

Publication Number Publication Date
KR20120093888A KR20120093888A (ko) 2012-08-23
KR101933723B1 true KR101933723B1 (ko) 2018-12-28

Family

ID=43855798

Family Applications (2)

Application Number Title Priority Date Filing Date
KR1020127009910A Active KR101933723B1 (ko) 2009-10-08 2010-02-05 프로그램가능 프로토콜 발생기
KR1020167023561A Ceased KR20160105984A (ko) 2009-10-08 2010-02-05 프로그램가능 프로토콜 발생기

Family Applications After (1)

Application Number Title Priority Date Filing Date
KR1020167023561A Ceased KR20160105984A (ko) 2009-10-08 2010-02-05 프로그램가능 프로토콜 발생기

Country Status (9)

Country Link
US (1) US8269520B2 (https=)
EP (1) EP2449391B1 (https=)
JP (1) JP5732464B2 (https=)
KR (2) KR101933723B1 (https=)
CN (1) CN102549443B (https=)
MY (1) MY155209A (https=)
SG (1) SG178186A1 (https=)
TW (1) TWI470242B (https=)
WO (1) WO2011043832A1 (https=)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ATE441120T1 (de) * 2004-07-07 2009-09-15 Verigy Pte Ltd Singapore Auswertung eines ausgangssignals eines gerade geprüften bausteins
US8838406B2 (en) 2008-11-11 2014-09-16 Advantest (Singapore) Pte Ltd Re-configurable test circuit, method for operating an automated test equipment, apparatus, method and computer program for setting up an automated test equipment
TW201314233A (zh) * 2011-09-21 2013-04-01 Hon Hai Prec Ind Co Ltd 測試卡
US9910086B2 (en) 2012-01-17 2018-03-06 Allen Czamara Test IP-based A.T.E. instrument architecture
US9952276B2 (en) * 2013-02-21 2018-04-24 Advantest Corporation Tester with mixed protocol engine in a FPGA block
US9411701B2 (en) * 2013-03-13 2016-08-09 Xilinx, Inc. Analog block and test blocks for testing thereof
US9195261B2 (en) 2013-09-03 2015-11-24 Teradyne, Inc. Synchronizing data from different clock domains by bridges one of the clock signals to appear to run an integer of cycles more than the other clock signal
WO2016018236A1 (en) * 2014-07-28 2016-02-04 Intel Corporation Semiconductor device tester with dut data streaming
KR102675841B1 (ko) * 2016-05-17 2024-06-18 삼성전자주식회사 바이너리 벡터 기반의 테스트 장치
US10914784B2 (en) * 2018-07-27 2021-02-09 Advantest Corporation Method and apparatus for providing UFS terminated and unterminated pulse width modulation support using dual channels
US10976361B2 (en) 2018-12-20 2021-04-13 Advantest Corporation Automated test equipment (ATE) support framework for solid state device (SSD) odd sector sizes and protection modes
US11137910B2 (en) * 2019-03-04 2021-10-05 Advantest Corporation Fast address to sector number/offset translation to support odd sector size testing
US11237202B2 (en) 2019-03-12 2022-02-01 Advantest Corporation Non-standard sector size system support for SSD testing
US10884847B1 (en) 2019-08-20 2021-01-05 Advantest Corporation Fast parallel CRC determination to support SSD testing
US12140609B2 (en) * 2020-03-31 2024-11-12 Advantest Corporation Universal test interface systems and methods
US12140632B2 (en) * 2020-11-17 2024-11-12 Synopsys, Inc. Device under test synchronization with automated test equipment check cycle
JP2024014520A (ja) 2022-07-22 2024-02-01 株式会社アドバンテスト 自動試験装置およびそのインタフェース装置
JP2024014519A (ja) 2022-07-22 2024-02-01 株式会社アドバンテスト 自動試験装置およびそのインタフェース装置
JP2024014521A (ja) * 2022-07-22 2024-02-01 株式会社アドバンテスト 自動試験装置およびそのインタフェース装置
EP4415324A1 (en) * 2023-02-10 2024-08-14 Rohde & Schwarz GmbH & Co. KG Automated compliance testing of a dut with communication interfaces

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005315605A (ja) 2004-04-27 2005-11-10 Yamaha Corp 半導体装置の試験装置および試験方法
US20080307283A1 (en) 2007-06-11 2008-12-11 Romero Gabriel L Complex Pattern Generator for Analysis of High Speed Serial Streams

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0481675A (ja) * 1990-07-25 1992-03-16 Mitsubishi Electric Corp 半導体デバイステスト装置
JPH0557678U (ja) * 1991-12-27 1993-07-30 株式会社アドバンテスト Ｉｃ試験装置
US5694399A (en) * 1996-04-10 1997-12-02 Xilinix, Inc. Processing unit for generating signals for communication with a test access port
JPH09288153A (ja) * 1996-04-19 1997-11-04 Advantest Corp 半導体試験装置
JP3356205B2 (ja) * 1997-09-09 2002-12-16 横河電機株式会社 Ｌｓｉ試験装置
JPH11184678A (ja) * 1997-12-25 1999-07-09 Toshiba Corp パターン発生器
US6651203B1 (en) * 1999-05-17 2003-11-18 Infineon Technologies Ag On chip programmable data pattern generator for semiconductor memories
US6553527B1 (en) * 1999-11-08 2003-04-22 International Business Machines Corporation Programmable array built-in self test method and controller with programmable expect generator
JP2002174661A (ja) * 2000-12-06 2002-06-21 Fuji Xerox Co Ltd 集積回路テスト制御装置
US20040193982A1 (en) * 2003-03-31 2004-09-30 Arraycomm, Inc. Built-in self-test for digital transmitters
US20050154953A1 (en) * 2004-01-12 2005-07-14 Norskog Allen C. Multiple function pattern generator and comparator having self-seeding test function
US7479803B1 (en) * 2004-10-06 2009-01-20 Altera Corporation Techniques for debugging hard intellectual property blocks
US7409618B2 (en) * 2004-10-06 2008-08-05 Lsi Corporation Self verifying communications testing
US7519891B2 (en) * 2005-09-28 2009-04-14 Intel Corporation IO self test method and apparatus for memory
JP5025638B2 (ja) * 2006-04-19 2012-09-12 株式会社アドバンテスト 信号出力装置、試験装置、およびプログラム
JP4967881B2 (ja) * 2006-07-31 2012-07-04 セイコーエプソン株式会社 更新データ送信方法、ファームウェア書き換えシステム及び更新データ送信プログラム
KR100736675B1 (ko) * 2006-08-01 2007-07-06 주식회사 유니테스트 반도체 소자 테스트 장치
KR100736680B1 (ko) * 2006-08-10 2007-07-06 주식회사 유니테스트 반도체 소자 테스트 장치의 캘리브레이션 방법
CN101191819B (zh) * 2006-11-21 2012-05-23 国际商业机器公司 Fpga、fpga配置、调试系统和方法
US20090112548A1 (en) * 2007-10-30 2009-04-30 Conner George W A method for testing in a reconfigurable tester
CN101196557A (zh) * 2007-12-18 2008-06-11 上海华为技术有限公司 一种现场可编程门阵列测试的方法、装置和系统

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005315605A (ja) 2004-04-27 2005-11-10 Yamaha Corp 半導体装置の試験装置および試験方法
US20080307283A1 (en) 2007-06-11 2008-12-11 Romero Gabriel L Complex Pattern Generator for Analysis of High Speed Serial Streams

Also Published As

Publication number Publication date
KR20160105984A (ko) 2016-09-08
SG178186A1 (en) 2012-03-29
US8269520B2 (en) 2012-09-18
CN102549443A (zh) 2012-07-04
EP2449391B1 (en) 2016-07-13
MY155209A (en) 2015-09-30
EP2449391A1 (en) 2012-05-09
WO2011043832A1 (en) 2011-04-14
TW201113536A (en) 2011-04-16
TWI470242B (zh) 2015-01-21
CN102549443B (zh) 2015-04-01
US20110087942A1 (en) 2011-04-14
JP2013507610A (ja) 2013-03-04
JP5732464B2 (ja) 2015-06-10
EP2449391A4 (en) 2015-02-25
KR20120093888A (ko) 2012-08-23

Similar Documents

Publication Publication Date Title
KR101933723B1 (ko) 프로그램가능 프로토콜 발생기
JP2013507610A5 (https=)
US7231560B2 (en) Apparatus and method for testing motherboard having PCI express devices
US7546501B2 (en) Selecting test circuitry from header signals on power lead
US10175296B2 (en) Testing a board assembly using test cards
WO2013062692A1 (en) Test instrument having a configurable interface
CN108897647B (zh) 测试系统、测试方法及装置
US7650555B2 (en) Method and apparatus for characterizing components of a device under test using on-chip trace logic analyzer
CN101750578A (zh) 一种集成电路板级自动测试系统
US6959257B1 (en) Apparatus and method to test high speed devices with a low speed tester
US8103927B2 (en) Field mounting-type test apparatus and method for testing memory component or module in actual PC environment
CN113014339A (zh) PCIe外插卡接收通道的质量测试方法、装置及设备
US11953550B2 (en) Server JTAG component adaptive interconnection system and method
US7409618B2 (en) Self verifying communications testing
CN113949654A (zh) 一种用于m.2接口的测试治具及其使用方法
CN100416284C (zh) 一种电缆测试装置及方法
CN118260145A (zh) 一种测试板卡和测试设备
CN108155979B (zh) 一种检测设备
Ungar et al. Testing and Diagnosing High-Speed Circuits for Military Applications Through Standard Input/Output Ports
CN121410503A (zh) 调试系统和调试方法
CN121633779A (zh) 芯片dft测试系统、方法、设备及存储介质
CN117330942A (zh) 芯片调试方法及相关装置
CN121996477A (zh) 一种用于测试的接口组件及测试系统
CN118018162A (zh) 适用于phy的通用型rx通道误码率检测系统及检测方法

Legal Events

Date Code Title Description
PA0105 International application

St.27 status event code: A-0-1-A10-A15-nap-PA0105

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

P22-X000 Classification modified

St.27 status event code: A-2-2-P10-P22-nap-X000

A201 Request for examination
PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

AMND Amendment
P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

E601 Decision to refuse application
PE0601 Decision on rejection of patent

St.27 status event code: N-2-6-B10-B15-exm-PE0601

X091 Application refused [patent]
AMND Amendment
E13-X000 Pre-grant limitation requested

St.27 status event code: A-2-3-E10-E13-lim-X000

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

PX0901 Re-examination

St.27 status event code: A-2-3-E10-E12-rex-PX0901

PX0601 Decision of rejection after re-examination

St.27 status event code: N-2-6-B10-B17-rex-PX0601

X601 Decision of rejection after re-examination
A107 Divisional application of patent
J201 Request for trial against refusal decision
PA0104 Divisional application for international application

St.27 status event code: A-0-1-A10-A18-div-PA0104

St.27 status event code: A-0-1-A10-A16-div-PA0104

PJ0201 Trial against decision of rejection

St.27 status event code: A-3-3-V10-V11-apl-PJ0201

J301 Trial decision

Free format text: TRIAL NUMBER: 2016101005009; TRIAL DECISION FOR APPEAL AGAINST DECISION TO DECLINE REFUSAL REQUESTED 20160826

Effective date: 20180716

PJ1301 Trial decision

St.27 status event code: A-3-3-V10-V15-crt-PJ1301

Decision date: 20180716

Appeal event data comment text: Appeal Kind Category : Appeal against decision to decline refusal, Appeal Ground Text : 2012 7009910

Appeal request date: 20160826

Appellate body name: Patent Examination Board

Decision authority category: Office appeal board

Decision identifier: 2016101005009

PS0901 Examination by remand of revocation

St.27 status event code: A-6-3-E10-E12-rex-PS0901

S901 Examination by remand of revocation
E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

E13-X000 Pre-grant limitation requested

St.27 status event code: A-2-3-E10-E13-lim-X000

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

GRNO Decision to grant (after opposition)
PS0701 Decision of registration after remand of revocation

St.27 status event code: A-3-4-F10-F13-rex-PS0701

GRNT Written decision to grant
PR0701 Registration of establishment

St.27 status event code: A-2-4-F10-F11-exm-PR0701

PR1002 Payment of registration fee

St.27 status event code: A-2-2-U10-U12-oth-PR1002

Fee payment year number: 1

PG1601 Publication of registration

St.27 status event code: A-4-4-Q10-Q13-nap-PG1601

FPAY Annual fee payment

Payment date: 20211118

Year of fee payment: 4

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 4

FPAY Annual fee payment

Payment date: 20221116

Year of fee payment: 5

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 5

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 6

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 7

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 8

U11 Full renewal or maintenance fee paid

Free format text: ST27 STATUS EVENT CODE: A-4-4-U10-U11-OTH-PR1001 (AS PROVIDED BY THE NATIONAL OFFICE)

Year of fee payment: 8