KR101870011B1 - 임프린트 장치, 임프린트 방법 및 물품의 제조 방법 - Google Patents

임프린트 장치, 임프린트 방법 및 물품의 제조 방법 Download PDF

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KR101870011B1
KR101870011B1 KR1020150081090A KR20150081090A KR101870011B1 KR 101870011 B1 KR101870011 B1 KR 101870011B1 KR 1020150081090 A KR1020150081090 A KR 1020150081090A KR 20150081090 A KR20150081090 A KR 20150081090A KR 101870011 B1 KR101870011 B1 KR 101870011B1
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South Korea
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imprint material
substrate
mold
pattern
information
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KR20150141893A (ko
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히로미츠 야마구치
요시카즈 미야지마
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캐논 가부시끼가이샤
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    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0002Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/16Coating processes; Apparatus therefor

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Shaping Of Tube Ends By Bending Or Straightening (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
KR1020150081090A 2014-06-10 2015-06-09 임프린트 장치, 임프린트 방법 및 물품의 제조 방법 Active KR101870011B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2014119892A JP6329437B2 (ja) 2014-06-10 2014-06-10 インプリント装置、インプリント方法、および物品の製造方法
JPJP-P-2014-119892 2014-06-10

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KR20150141893A KR20150141893A (ko) 2015-12-21
KR101870011B1 true KR101870011B1 (ko) 2018-06-22

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US (1) US10197910B2 (enExample)
JP (1) JP6329437B2 (enExample)
KR (1) KR101870011B1 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10493672B2 (en) * 2017-06-26 2019-12-03 Canon Kabushiki Kaisha Imprint apparatus, method of manufacturing article, information processing apparatus, method of supporting map editing, and storage medium
US11175598B2 (en) * 2017-06-30 2021-11-16 Canon Kabushiki Kaisha Imprint apparatus and method of manufacturing article
JP6498343B2 (ja) * 2017-08-25 2019-04-10 キヤノン株式会社 インプリント装置、インプリント方法、物品製造方法、成形装置および成形方法。
US11036130B2 (en) * 2017-10-19 2021-06-15 Canon Kabushiki Kaisha Drop placement evaluation
JP7475147B2 (ja) * 2020-01-23 2024-04-26 キヤノン株式会社 表示制御方法、編集支援方法、物品製造方法、プログラムおよび情報処理装置
US11474441B2 (en) * 2020-06-25 2022-10-18 Canon Kabushiki Kaisha Systems and methods for generating drop patterns
JP7743209B2 (ja) * 2021-06-08 2025-09-24 キヤノン株式会社 成形装置、成形方法及び物品の製造方法

Family Cites Families (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6175422B1 (en) * 1991-01-31 2001-01-16 Texas Instruments Incorporated Method and apparatus for the computer-controlled manufacture of three-dimensional objects from computer data
US6652256B2 (en) * 2000-10-27 2003-11-25 Dorsey D. Coe Three-dimensional model colorization during model construction from computer aided design data
KR20040017271A (ko) * 2001-07-03 2004-02-26 동경 엘렉트론 주식회사 도포장치 및 도포방법
JP4168795B2 (ja) * 2002-04-19 2008-10-22 セイコーエプソン株式会社 製膜方法、製膜装置、デバイス、デバイスの製造方法、及び電子機器
US7316748B2 (en) * 2002-04-24 2008-01-08 Wisconsin Alumni Research Foundation Apparatus and method of dispensing small-scale powders
JP4089375B2 (ja) 2002-09-30 2008-05-28 ヤマハ株式会社 ミキシング方法、ミキシング装置およびプログラム
JP4366538B2 (ja) * 2003-09-04 2009-11-18 リコープリンティングシステムズ株式会社 三次元積層造形物用支持体材料、三次元積層造形物の中間体、三次元積層造形物の製造方法、三次元積層造形物の製造装置
ATE477515T1 (de) * 2004-06-03 2010-08-15 Molecular Imprints Inc Fluidausgabe und tropfenausgabe nach bedarf für die herstellung im nanobereich
JP5318112B2 (ja) * 2008-09-30 2013-10-16 富士フイルム株式会社 多層被覆装置、及び多層被覆方法
US8512797B2 (en) 2008-10-21 2013-08-20 Molecular Imprints, Inc. Drop pattern generation with edge weighting
US8586126B2 (en) * 2008-10-21 2013-11-19 Molecular Imprints, Inc. Robust optimization to generate drop patterns in imprint lithography which are tolerant of variations in drop volume and drop placement
US20110206832A1 (en) * 2008-11-21 2011-08-25 Sharp Kabushiki Kaisha Method for ejecting droplet of alignment material and device for the same
KR101071973B1 (ko) * 2009-12-31 2011-10-10 주식회사 디엠에스 액정 디스플레이의 배향 패턴 형성 방법
JP5337114B2 (ja) 2010-07-30 2013-11-06 株式会社東芝 パタン形成方法
JP5214683B2 (ja) 2010-08-31 2013-06-19 株式会社東芝 インプリントレシピ作成装置及び方法並びにインプリント装置及び方法
JP2012069701A (ja) 2010-09-22 2012-04-05 Toshiba Corp インプリント方法、半導体集積回路製造方法およびドロップレシピ作成方法
JP5002695B2 (ja) * 2010-09-24 2012-08-15 株式会社東芝 微細加工方法、微細加工装置、および微細加工プログラム
JP2012114157A (ja) 2010-11-22 2012-06-14 Toshiba Corp ドロップレシピ作成方法およびデータベース作成方法
JP5761860B2 (ja) * 2011-03-25 2015-08-12 富士フイルム株式会社 インプリントシステム、及びインプリント方法
JP5727905B2 (ja) * 2011-09-15 2015-06-03 富士フイルム株式会社 インクジェットヘッドの吐出量補正方法、吐出量補正装置、及びナノインプリントシステム
JP5694219B2 (ja) 2012-03-21 2015-04-01 株式会社東芝 滴下位置設定プログラム、インプリント方法およびインプリント装置
JP5462903B2 (ja) * 2012-03-23 2014-04-02 株式会社東芝 滴状体配置方法、パターン形成方法、滴状体配置プログラム、滴状体配置装置、およびテンプレートのパターンの設計方法
US9067299B2 (en) * 2012-04-25 2015-06-30 Applied Materials, Inc. Printed chemical mechanical polishing pad
KR20140032272A (ko) * 2012-09-06 2014-03-14 엘지디스플레이 주식회사 배향막 형성장치 및 형성방법
US9102099B1 (en) * 2014-02-05 2015-08-11 MetaMason, Inc. Methods for additive manufacturing processes incorporating active deposition
US10343349B2 (en) * 2014-03-30 2019-07-09 Stanley Korn System, method and apparatus for 3D printing
US9067446B1 (en) * 2014-03-31 2015-06-30 Xerox Corporation System for detecting inoperative inkjets in three-dimensional object printing using a test pattern and an ultrasonic sensor
JP6329425B2 (ja) * 2014-05-02 2018-05-23 キヤノン株式会社 インプリント装置、インプリント方法、および物品の製造方法
CN105313332B (zh) * 2014-06-09 2020-05-05 联合工艺公司 由两部分组成的热固性树脂增材制造系统
US10571801B2 (en) * 2014-12-09 2020-02-25 Canon Kabushiki Kaisha Coating apparatus, imprint apparatus, and method of manufacturing article
US20160288378A1 (en) * 2015-04-03 2016-10-06 Canon Kabushiki Kaisha Imprint material discharging device

Also Published As

Publication number Publication date
KR20150141893A (ko) 2015-12-21
JP2015233101A (ja) 2015-12-24
US20150352756A1 (en) 2015-12-10
JP6329437B2 (ja) 2018-05-23
US10197910B2 (en) 2019-02-05

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