KR101774256B1 - 산화물 반도체 박막 트랜지스터 및 그 제조 방법 - Google Patents

산화물 반도체 박막 트랜지스터 및 그 제조 방법 Download PDF

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KR101774256B1
KR101774256B1 KR1020100113326A KR20100113326A KR101774256B1 KR 101774256 B1 KR101774256 B1 KR 101774256B1 KR 1020100113326 A KR1020100113326 A KR 1020100113326A KR 20100113326 A KR20100113326 A KR 20100113326A KR 101774256 B1 KR101774256 B1 KR 101774256B1
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active layer
layer
electrode
thin film
oxide semiconductor
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KR20120051942A (ko
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왕성민
윤주선
서태안
김정환
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삼성디스플레이 주식회사
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Priority to KR1020100113326A priority Critical patent/KR101774256B1/ko
Priority to US13/075,117 priority patent/US8450733B2/en
Priority to JP2011078504A priority patent/JP2012109516A/ja
Priority to TW100122812A priority patent/TWI539607B/zh
Priority to CN201110208118.XA priority patent/CN102468341B/zh
Publication of KR20120051942A publication Critical patent/KR20120051942A/ko
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    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/60—Insulated-gate field-effect transistors [IGFET]
    • H10D30/67—Thin-film transistors [TFT]
    • H10D30/6729—Thin-film transistors [TFT] characterised by the electrodes
    • H10D30/673—Thin-film transistors [TFT] characterised by the electrodes characterised by the shapes, relative sizes or dispositions of the gate electrodes
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/60—Insulated-gate field-effect transistors [IGFET]
    • H10D30/67—Thin-film transistors [TFT]
    • H10D30/6704—Thin-film transistors [TFT] having supplementary regions or layers in the thin films or in the insulated bulk substrates for controlling properties of the device
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/60—Insulated-gate field-effect transistors [IGFET]
    • H10D30/67—Thin-film transistors [TFT]
    • H10D30/674—Thin-film transistors [TFT] characterised by the active materials
    • H10D30/6755—Oxide semiconductors, e.g. zinc oxide, copper aluminium oxide or cadmium stannate
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • H10D86/421—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs having a particular composition, shape or crystalline structure of the active layer
    • H10D86/423—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs having a particular composition, shape or crystalline structure of the active layer comprising semiconductor materials not belonging to the Group IV, e.g. InGaZnO
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • H10D86/441—Interconnections, e.g. scanning lines
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • H10D86/60—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices

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  • Thin Film Transistor (AREA)
  • Liquid Crystal (AREA)
KR1020100113326A 2010-11-15 2010-11-15 산화물 반도체 박막 트랜지스터 및 그 제조 방법 Active KR101774256B1 (ko)

Priority Applications (5)

Application Number Priority Date Filing Date Title
KR1020100113326A KR101774256B1 (ko) 2010-11-15 2010-11-15 산화물 반도체 박막 트랜지스터 및 그 제조 방법
US13/075,117 US8450733B2 (en) 2010-11-15 2011-03-29 Oxide semiconductor thin film transistor, and method of manufacturing the same
JP2011078504A JP2012109516A (ja) 2010-11-15 2011-03-31 酸化物半導体薄膜トランジスタ及びその製造方法
TW100122812A TWI539607B (zh) 2010-11-15 2011-06-29 氧化物半導體薄膜電晶體以及製造其之方法
CN201110208118.XA CN102468341B (zh) 2010-11-15 2011-07-19 氧化物半导体薄膜晶体管及其制造方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020100113326A KR101774256B1 (ko) 2010-11-15 2010-11-15 산화물 반도체 박막 트랜지스터 및 그 제조 방법

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KR20120051942A KR20120051942A (ko) 2012-05-23
KR101774256B1 true KR101774256B1 (ko) 2017-09-05

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US (1) US8450733B2 (enExample)
JP (1) JP2012109516A (enExample)
KR (1) KR101774256B1 (enExample)
CN (1) CN102468341B (enExample)
TW (1) TWI539607B (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20200050744A (ko) * 2018-11-02 2020-05-12 엘지디스플레이 주식회사 트랜지스터, 패널 및 전자장치
US11950487B2 (en) 2018-09-21 2024-04-02 Samsung Display Co., Ltd. Display apparatus and method of manufacturing the same

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101680081B (zh) * 2007-03-20 2012-10-31 出光兴产株式会社 溅射靶、氧化物半导体膜及半导体器件
KR101182232B1 (ko) * 2010-06-30 2012-09-12 삼성디스플레이 주식회사 유기전계발광 표시장치
KR20120045178A (ko) * 2010-10-29 2012-05-09 삼성전자주식회사 박막 트랜지스터 및 이의 제조 방법
KR101450686B1 (ko) * 2012-07-19 2014-10-14 제이에스알 가부시끼가이샤 반도체 소자, 감방사선성 수지 조성물, 경화막 및 표시 소자
CN103855172B (zh) * 2012-12-03 2016-11-23 群康科技(深圳)有限公司 X光侦测装置
KR101982727B1 (ko) * 2012-12-11 2019-05-27 엘지디스플레이 주식회사 어레이 기판
CN103187423B (zh) 2013-02-04 2016-03-23 合肥京东方光电科技有限公司 一种氧化物薄膜晶体管阵列基板及其制作方法、显示面板
KR101421288B1 (ko) * 2013-02-28 2014-07-18 엘지디스플레이 주식회사 금속 산화물 반도체를 포함하는 박막 트랜지스터 기판
KR20140125181A (ko) * 2013-04-18 2014-10-28 삼성디스플레이 주식회사 평판표시장치용 백플레인 및 그의 제조방법
CN103258859B (zh) * 2013-05-23 2016-06-29 北京交通大学 一种氧化铟基薄膜晶体管及其制作方法
KR20150010065A (ko) * 2013-07-18 2015-01-28 삼성디스플레이 주식회사 산화물 반도체 소자의 제조 방법 및 산화물 반도체 소자를 포함하는 표시 장치의 제조 방법
JP6264090B2 (ja) * 2013-07-31 2018-01-24 株式会社リコー 電界効果型トランジスタ、及び電界効果型トランジスタの製造方法
JP2015038925A (ja) * 2013-08-19 2015-02-26 株式会社東芝 半導体装置
KR102112283B1 (ko) 2013-08-20 2020-05-19 삼성디스플레이 주식회사 박막 트랜지스터를 포함하는 표시 기판 및 이의 제조 방법
KR20150030034A (ko) 2013-09-11 2015-03-19 삼성디스플레이 주식회사 표시장치 및 그 제조방법
CN103618004B (zh) * 2013-10-16 2016-05-18 京东方科技集团股份有限公司 一种薄膜晶体管及其制作方法、阵列基板和显示装置
CN104752514B (zh) * 2013-12-26 2018-05-25 昆山工研院新型平板显示技术中心有限公司 一种薄膜晶体管及其制备方法和应用
KR102180511B1 (ko) * 2014-02-10 2020-11-19 삼성디스플레이 주식회사 박막 트랜지스터 표시판 및 이의 제조 방법
CN104064601B (zh) * 2014-06-30 2017-12-26 上海天马微电子有限公司 Tft、tft阵列基板及其制造方法、显示面板、显示装置
CN104218095B (zh) * 2014-09-01 2016-05-25 京东方科技集团股份有限公司 一种薄膜晶体管及其制备方法、阵列基板和显示装置
CN107146818B (zh) * 2017-06-27 2020-02-18 京东方科技集团股份有限公司 一种薄膜晶体管、其制作方法、阵列基板及显示装置
CN108051951B (zh) * 2017-12-29 2022-12-13 西安智盛锐芯半导体科技有限公司 Led光源、背光模组及液晶显示装置
CN108258055A (zh) * 2018-01-15 2018-07-06 北京交通大学 锌铟锡氧化物基薄膜晶体管及其制作方法
CN108987468A (zh) * 2018-06-26 2018-12-11 浙江大学 一种i-v族共掺杂非晶氧化物半导体薄膜与薄膜晶体管
KR102795466B1 (ko) 2019-12-10 2025-04-15 삼성전자주식회사 스크라이브 레인을 갖는 반도체 소자들 및 그 형성 방법
JP2022103578A (ja) * 2020-12-28 2022-07-08 株式会社ジャパンディスプレイ 半導体装置
CN114220824A (zh) * 2021-12-20 2022-03-22 北海惠科光电技术有限公司 阵列基板、制作方法和显示面板

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090256147A1 (en) * 2008-03-13 2009-10-15 Min-Kyu Kim Thin film transistor and method of manufacturing the same
US20100044699A1 (en) * 2008-08-21 2010-02-25 Samsung Mobile Display Co., Ltd. Thin film transistor and method of fabricating the same

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0595002A (ja) * 1991-10-02 1993-04-16 Sharp Corp 薄膜トランジスタ
JP3548237B2 (ja) * 1994-08-29 2004-07-28 シャープ株式会社 薄膜トランジスタ
US5641974A (en) * 1995-06-06 1997-06-24 Ois Optical Imaging Systems, Inc. LCD with bus lines overlapped by pixel electrodes and photo-imageable insulating layer therebetween
JP3939140B2 (ja) * 2001-12-03 2007-07-04 株式会社日立製作所 液晶表示装置
JP2003273364A (ja) * 2002-03-19 2003-09-26 Matsushita Electric Ind Co Ltd 薄膜トランジスタ及び液晶表示装置
KR100494455B1 (ko) * 2003-06-11 2005-06-10 엘지.필립스 엘시디 주식회사 반사투과형 액정표시장치용 어레이기판 및 그 제조방법
KR100659759B1 (ko) * 2004-10-06 2006-12-19 삼성에스디아이 주식회사 바텀 게이트형 박막트랜지스터, 그를 구비하는평판표시장치 및 박막트랜지스터의 제조방법
KR20070000025A (ko) * 2005-06-24 2007-01-02 삼성전자주식회사 박막 트랜지스터 표시판 및 그 제조 방법
US8530891B2 (en) * 2007-04-05 2013-09-10 Idemitsu Kosan Co., Ltd Field-effect transistor, and process for producing field-effect transistor
KR101389923B1 (ko) * 2008-04-21 2014-04-29 삼성디스플레이 주식회사 고개구율 어레이 기판, 액정 표시 장치 및 이들의 제조방법
US8039842B2 (en) * 2008-05-22 2011-10-18 Semiconductor Energy Laboratory Co., Ltd. Thin film transistor and display device including thin film transistor
JP5584960B2 (ja) * 2008-07-03 2014-09-10 ソニー株式会社 薄膜トランジスタおよび表示装置
KR101671544B1 (ko) * 2008-11-21 2016-11-01 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치, 표시 장치 및 전자 기기

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20090256147A1 (en) * 2008-03-13 2009-10-15 Min-Kyu Kim Thin film transistor and method of manufacturing the same
US20100044699A1 (en) * 2008-08-21 2010-02-25 Samsung Mobile Display Co., Ltd. Thin film transistor and method of fabricating the same

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11950487B2 (en) 2018-09-21 2024-04-02 Samsung Display Co., Ltd. Display apparatus and method of manufacturing the same
KR20200050744A (ko) * 2018-11-02 2020-05-12 엘지디스플레이 주식회사 트랜지스터, 패널 및 전자장치
KR102711211B1 (ko) * 2018-11-02 2024-09-27 엘지디스플레이 주식회사 트랜지스터, 패널 및 전자장치

Also Published As

Publication number Publication date
CN102468341A (zh) 2012-05-23
TWI539607B (zh) 2016-06-21
KR20120051942A (ko) 2012-05-23
JP2012109516A (ja) 2012-06-07
US20120119206A1 (en) 2012-05-17
US8450733B2 (en) 2013-05-28
TW201238053A (en) 2012-09-16
CN102468341B (zh) 2016-10-05

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