KR101591088B1 - 가열 처리 장치 - Google Patents
가열 처리 장치 Download PDFInfo
- Publication number
- KR101591088B1 KR101591088B1 KR1020090026382A KR20090026382A KR101591088B1 KR 101591088 B1 KR101591088 B1 KR 101591088B1 KR 1020090026382 A KR1020090026382 A KR 1020090026382A KR 20090026382 A KR20090026382 A KR 20090026382A KR 101591088 B1 KR101591088 B1 KR 101591088B1
- Authority
- KR
- South Korea
- Prior art keywords
- substrate
- chamber
- heating means
- processing space
- members
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012545 processing Methods 0.000 title claims description 41
- 238000010438 heat treatment Methods 0.000 claims abstract description 73
- 239000000758 substrate Substances 0.000 claims abstract description 67
- 238000000034 method Methods 0.000 claims abstract description 9
- 230000005855 radiation Effects 0.000 claims description 15
- 239000000463 material Substances 0.000 claims description 14
- 239000011248 coating agent Substances 0.000 claims description 12
- 238000000576 coating method Methods 0.000 claims description 12
- 230000001965 increasing effect Effects 0.000 claims description 7
- 238000004519 manufacturing process Methods 0.000 description 7
- 229910052782 aluminium Inorganic materials 0.000 description 6
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 6
- 239000007769 metal material Substances 0.000 description 4
- 238000007872 degassing Methods 0.000 description 3
- 230000002708 enhancing effect Effects 0.000 description 3
- 238000009434 installation Methods 0.000 description 3
- 238000005192 partition Methods 0.000 description 3
- 238000007789 sealing Methods 0.000 description 3
- 239000004973 liquid crystal related substance Substances 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000005507 spraying Methods 0.000 description 2
- 238000004381 surface treatment Methods 0.000 description 2
- 238000003466 welding Methods 0.000 description 2
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 1
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- WGLPBDUCMAPZCE-UHFFFAOYSA-N Trioxochromium Chemical compound O=[Cr](=O)=O WGLPBDUCMAPZCE-UHFFFAOYSA-N 0.000 description 1
- 229910045601 alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 239000011651 chromium Substances 0.000 description 1
- 229910000423 chromium oxide Inorganic materials 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000000638 solvent extraction Methods 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67126—Apparatus for sealing, encapsulating, glassing, decapsulating or the like
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Muffle Furnaces And Rotary Kilns (AREA)
- Furnace Details (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009012401A JP5274275B2 (ja) | 2009-01-22 | 2009-01-22 | 加熱処理装置 |
| JPJP-P-2009-012401 | 2009-01-22 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20100086399A KR20100086399A (ko) | 2010-07-30 |
| KR101591088B1 true KR101591088B1 (ko) | 2016-02-02 |
Family
ID=42532520
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020090026382A Active KR101591088B1 (ko) | 2009-01-22 | 2009-03-27 | 가열 처리 장치 |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP5274275B2 (enExample) |
| KR (1) | KR101591088B1 (enExample) |
| CN (1) | CN101789358B (enExample) |
| TW (1) | TWI452251B (enExample) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7272639B1 (en) | 1995-06-07 | 2007-09-18 | Soverain Software Llc | Internet server access control and monitoring systems |
| US9900305B2 (en) | 1998-01-12 | 2018-02-20 | Soverain Ip, Llc | Internet server access control and monitoring systems |
| US7257132B1 (en) | 1998-02-26 | 2007-08-14 | Hitachi, Ltd. | Receiver set, information apparatus and receiving system |
| CN104197668B (zh) * | 2014-09-24 | 2016-03-02 | 南京耀天干燥设备有限公司 | 一种改进的低温真空干燥箱 |
| JP7406749B2 (ja) * | 2019-06-28 | 2023-12-28 | 日新イオン機器株式会社 | 加熱装置 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000114151A (ja) * | 1998-10-08 | 2000-04-21 | Hitachi Ltd | 基板加熱装置 |
| JP2008124366A (ja) * | 2006-11-15 | 2008-05-29 | Tokyo Electron Ltd | 減圧乾燥装置 |
| KR100837599B1 (ko) * | 2007-03-27 | 2008-06-13 | 주식회사 에스에프에이 | 기판 지지용 스테이지 |
| JP2008197374A (ja) * | 2007-02-13 | 2008-08-28 | Ulvac Japan Ltd | 真空チャンバ、ロードロックチャンバ、及び処理装置 |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0769391A (ja) * | 1993-01-19 | 1995-03-14 | Gold Kogyo Kk | 精密部品搬送用トレー |
| JP2008311250A (ja) * | 2007-06-12 | 2008-12-25 | Tokyo Electron Ltd | リフローシステムおよびリフロー方法 |
-
2009
- 2009-01-22 JP JP2009012401A patent/JP5274275B2/ja active Active
- 2009-03-24 TW TW098109525A patent/TWI452251B/zh active
- 2009-03-27 KR KR1020090026382A patent/KR101591088B1/ko active Active
- 2009-03-30 CN CN200910129865.7A patent/CN101789358B/zh active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000114151A (ja) * | 1998-10-08 | 2000-04-21 | Hitachi Ltd | 基板加熱装置 |
| JP2008124366A (ja) * | 2006-11-15 | 2008-05-29 | Tokyo Electron Ltd | 減圧乾燥装置 |
| JP2008197374A (ja) * | 2007-02-13 | 2008-08-28 | Ulvac Japan Ltd | 真空チャンバ、ロードロックチャンバ、及び処理装置 |
| KR100837599B1 (ko) * | 2007-03-27 | 2008-06-13 | 주식회사 에스에프에이 | 기판 지지용 스테이지 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN101789358A (zh) | 2010-07-28 |
| CN101789358B (zh) | 2014-02-19 |
| JP2010171206A (ja) | 2010-08-05 |
| TW201028629A (en) | 2010-08-01 |
| KR20100086399A (ko) | 2010-07-30 |
| JP5274275B2 (ja) | 2013-08-28 |
| TWI452251B (zh) | 2014-09-11 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
Patent event code: PA01091R01D Comment text: Patent Application Patent event date: 20090327 |
|
| PG1501 | Laying open of application | ||
| A201 | Request for examination | ||
| PA0201 | Request for examination |
Patent event code: PA02012R01D Patent event date: 20140120 Comment text: Request for Examination of Application Patent event code: PA02011R01I Patent event date: 20090327 Comment text: Patent Application |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 20150519 Patent event code: PE09021S01D |
|
| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
Patent event code: PE07011S01D Comment text: Decision to Grant Registration Patent event date: 20151027 |
|
| GRNT | Written decision to grant | ||
| PR0701 | Registration of establishment |
Comment text: Registration of Establishment Patent event date: 20160127 Patent event code: PR07011E01D |
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| PR1002 | Payment of registration fee |
Payment date: 20160127 End annual number: 3 Start annual number: 1 |
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| PG1601 | Publication of registration | ||
| FPAY | Annual fee payment |
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