KR101576109B1 - 광원의 액티브 스펙트럼 제어 - Google Patents

광원의 액티브 스펙트럼 제어 Download PDF

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Publication number
KR101576109B1
KR101576109B1 KR1020127007614A KR20127007614A KR101576109B1 KR 101576109 B1 KR101576109 B1 KR 101576109B1 KR 1020127007614 A KR1020127007614 A KR 1020127007614A KR 20127007614 A KR20127007614 A KR 20127007614A KR 101576109 B1 KR101576109 B1 KR 101576109B1
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South Korea
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light beam
characteristic value
spectral property
spectral
optical
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Korean (ko)
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KR20120080181A (ko
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낙근 성
이반 비. 라로빅
니겔 알. 패럴
로버트 제이. 라팍
조셉 제이. 벤딕
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사이머 엘엘씨
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    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
    • G03F7/7055—Exposure light control in all parts of the microlithographic apparatus, e.g. pulse length control or light interruption
    • G03F7/70575—Wavelength control, e.g. control of bandwidth, multiple wavelength, selection of wavelength or matching of optical components to wavelength
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
    • H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
    • H01S3/13—Stabilisation of laser output parameters, e.g. frequency or amplitude
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
    • G03F7/70491—Information management, e.g. software; Active and passive control, e.g. details of controlling exposure processes or exposure tool monitoring processes
    • G03F7/70525—Controlling normal operating mode, e.g. matching different apparatus, remote control or prediction of failure

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Optics & Photonics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Lasers (AREA)
KR1020127007614A 2009-08-25 2010-08-24 광원의 액티브 스펙트럼 제어 Active KR101576109B1 (ko)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US23684809P 2009-08-25 2009-08-25
US61/236,848 2009-08-25
US12/860,288 2010-08-20
US12/860,288 US8520186B2 (en) 2009-08-25 2010-08-20 Active spectral control of optical source

Publications (2)

Publication Number Publication Date
KR20120080181A KR20120080181A (ko) 2012-07-16
KR101576109B1 true KR101576109B1 (ko) 2015-12-09

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KR1020127007614A Active KR101576109B1 (ko) 2009-08-25 2010-08-24 광원의 액티브 스펙트럼 제어

Country Status (7)

Country Link
US (1) US8520186B2 (enExample)
EP (1) EP2471150B1 (enExample)
JP (1) JP5395269B2 (enExample)
KR (1) KR101576109B1 (enExample)
CN (1) CN102484350B (enExample)
TW (1) TWI427878B (enExample)
WO (1) WO2011028246A1 (enExample)

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101486372B1 (ko) 2007-07-25 2015-01-26 엘지전자 주식회사 디지털 방송 시스템 및 데이터 처리 방법
US8624209B1 (en) * 2013-03-14 2014-01-07 Cymer, Llc Controlling spatial properties in an excimer ring amplifier
US9715180B2 (en) * 2013-06-11 2017-07-25 Cymer, Llc Wafer-based light source parameter control
JP2016122676A (ja) * 2014-12-24 2016-07-07 株式会社アドバンテスト 露光装置および露光方法
CN104658942A (zh) * 2015-03-13 2015-05-27 合肥京东方光电科技有限公司 关键尺寸测量设备的光源亮度调整系统和方法
NL2014572B1 (en) * 2015-04-01 2017-01-06 Suss Microtec Lithography Gmbh Method for regulating a light source of a photolithography exposure system and exposure assembly for a photolithography device.
US9785050B2 (en) 2015-06-26 2017-10-10 Cymer, Llc Pulsed light beam spectral feature control
CN106502055B (zh) * 2015-09-06 2019-04-19 中芯国际集成电路制造(上海)有限公司 光刻失焦的检测方法
WO2017102321A1 (en) * 2015-12-14 2017-06-22 Cymer, Llc Optimization of source and bandwidth for new and existing patterning devices
US10345714B2 (en) * 2016-07-12 2019-07-09 Cymer, Llc Lithography optics adjustment and monitoring
US9997888B2 (en) * 2016-10-17 2018-06-12 Cymer, Llc Control of a spectral feature of a pulsed light beam
US9989866B2 (en) 2016-10-17 2018-06-05 Cymer, Llc Wafer-based light source parameter control
US9835959B1 (en) 2016-10-17 2017-12-05 Cymer, Llc Controlling for wafer stage vibration
US10451890B2 (en) * 2017-01-16 2019-10-22 Cymer, Llc Reducing speckle in an excimer light source
US9966725B1 (en) 2017-03-24 2018-05-08 Cymer, Llc Pulsed light beam spectral feature control
DE102017115365B4 (de) 2017-07-10 2020-10-15 Carl Zeiss Smt Gmbh Inspektionsvorrichtung für Masken für die Halbleiterlithographie und Verfahren
KR102428750B1 (ko) 2017-10-19 2022-08-02 사이머 엘엘씨 단일의 리소그래피 노광 패스로 복수의 에어리얼 이미지를 형성하는 방법
WO2019103299A1 (ko) * 2017-11-23 2019-05-31 주식회사 프로텍 인쇄 전자 시스템용 레이저 장치 및 그의 작동 방법
CN114997408A (zh) * 2018-06-14 2022-09-02 诺威有限公司 半导体度量方法和半导体度量系统
WO2020197719A1 (en) * 2019-03-27 2020-10-01 Cymer, Llc Pressure-controlled spectral feature adjuster
JP7454038B2 (ja) 2020-03-19 2024-03-21 ギガフォトン株式会社 露光システム、レーザ制御パラメータの作成方法、及び電子デバイスの製造方法
WO2021186697A1 (ja) 2020-03-19 2021-09-23 ギガフォトン株式会社 露光システム及び電子デバイスの製造方法
US20230266168A1 (en) * 2020-08-18 2023-08-24 Cymer, Llc Predictive calibration scheduling apparatus and method
CN115997171B (zh) 2020-09-24 2025-08-15 极光先进雷射株式会社 电子器件的制造方法
WO2022135843A1 (en) * 2020-12-24 2022-06-30 Asml Netherlands B.V. Lithographic method
JP2024525290A (ja) * 2021-07-13 2024-07-12 サイマー リミテッド ライアビリティ カンパニー 光学源のための予測装置及び方法

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4678917A (en) 1985-02-19 1987-07-07 The Perkin-Elmer Corporation Instantaneous reading multichannel polychromatic spectrophotometer method and apparatus
US5627639A (en) 1995-06-06 1997-05-06 Lockheed Missiles & Space Company, Inc. Coded aperture imaging spectrometer
JP2005514180A (ja) 2002-01-09 2005-05-19 シメッド　ライフ　システムズ　インコーポレイテッド 流体管理バルブ
US7701555B2 (en) 2005-07-01 2010-04-20 Nikon Corporation Exposure apparatus, exposure method, device manufacturing method, and system

Family Cites Families (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4937619A (en) * 1986-08-08 1990-06-26 Hitachi, Ltd. Projection aligner and exposure method
JP2830492B2 (ja) * 1991-03-06 1998-12-02 株式会社ニコン 投影露光装置及び投影露光方法
US5303002A (en) * 1993-03-31 1994-04-12 Intel Corporation Method and apparatus for enhancing the focus latitude in lithography
JP3255312B2 (ja) * 1993-04-28 2002-02-12 株式会社ニコン 投影露光装置
US5835520A (en) * 1997-04-23 1998-11-10 Cymer, Inc. Very narrow band KrF laser
US6671294B2 (en) * 1997-07-22 2003-12-30 Cymer, Inc. Laser spectral engineering for lithographic process
US6853653B2 (en) * 1997-07-22 2005-02-08 Cymer, Inc. Laser spectral engineering for lithographic process
US6393037B1 (en) * 1999-02-03 2002-05-21 Lambda Physik Ag Wavelength selector for laser with adjustable angular dispersion
JP2000106463A (ja) * 1998-08-19 2000-04-11 Lambda Physik G Zur Herstellung Von Lasern Mbh エキシマレ―ザに対する波長較正方法及びシステム
US6218077B1 (en) * 1998-10-26 2001-04-17 Agere Systems Guardian Corp. Method of manufacturing an integrated circuit using a scanning system and a scanning system
CA2390123A1 (en) * 1999-11-30 2001-06-07 Richard L. Sandstrom High power gas discharge laser with helium purged line narrowing unit
US6738406B2 (en) * 2000-06-19 2004-05-18 Lambda Physik Ag Precision measurement of wavelengths emitted by a molecular fluorine laser at 157nm
EP1246014A1 (en) * 2001-03-30 2002-10-02 ASML Netherlands B.V. Lithographic apparatus
US7088758B2 (en) * 2001-07-27 2006-08-08 Cymer, Inc. Relax gas discharge laser lithography light source
US7154928B2 (en) * 2004-06-23 2006-12-26 Cymer Inc. Laser output beam wavefront splitter for bandwidth spectrum control
JP4154144B2 (ja) * 2001-11-13 2008-09-24 キヤノン株式会社 露光装置、発光制御方法、およびデバイス製造方法
US6952267B2 (en) * 2003-07-07 2005-10-04 Cymer, Inc. Method and apparatus for measuring bandwidth of a laser output
US6829040B1 (en) * 2003-11-07 2004-12-07 Advanced Micro Devices, Inc. Lithography contrast enhancement technique by varying focus with wavelength modulation
US7053979B2 (en) * 2004-05-12 2006-05-30 Litel Instruments Process for amelioration of scanning synchronization error
US20060114956A1 (en) * 2004-11-30 2006-06-01 Sandstrom Richard L High power high pulse repetition rate gas discharge laser system bandwidth management
US7366219B2 (en) * 2004-11-30 2008-04-29 Cymer, Inc. Line narrowing module
US7317536B2 (en) * 2005-06-27 2008-01-08 Cymer, Inc. Spectral bandwidth metrology for high repetition rate gas discharge lasers
US7653095B2 (en) * 2005-06-30 2010-01-26 Cymer, Inc. Active bandwidth control for a laser
US7439001B2 (en) * 2005-08-18 2008-10-21 International Business Machines Corporation Focus blur measurement and control method
US7822084B2 (en) * 2006-02-17 2010-10-26 Cymer, Inc. Method and apparatus for stabilizing and tuning the bandwidth of laser light
US7852889B2 (en) * 2006-02-17 2010-12-14 Cymer, Inc. Active spectral control of DUV light source
JP2007305611A (ja) * 2006-05-08 2007-11-22 Sony Corp 露光装置
US8259764B2 (en) * 2006-06-21 2012-09-04 Cymer, Inc. Bandwidth control device
US7455939B2 (en) * 2006-07-31 2008-11-25 International Business Machines Corporation Method of improving grating test pattern for lithography monitoring and controlling
JP2008166612A (ja) * 2006-12-28 2008-07-17 Nikon Corp レーザ装置、露光装置、並びに制御方法、露光方法及びデバイス製造方法
US7659529B2 (en) * 2007-04-13 2010-02-09 Cymer, Inc. Method and apparatus for vibration reduction in laser system line narrowing unit wavelength selection optical element
US8144739B2 (en) * 2008-10-24 2012-03-27 Cymer, Inc. System method and apparatus for selecting and controlling light source bandwidth
JP2010153650A (ja) * 2008-12-25 2010-07-08 Canon Inc 露光装置およびデバイス製造方法
JP2011171521A (ja) * 2010-02-18 2011-09-01 Nikon Corp レーザ光源の評価方法、並びに露光方法及び装置

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4678917A (en) 1985-02-19 1987-07-07 The Perkin-Elmer Corporation Instantaneous reading multichannel polychromatic spectrophotometer method and apparatus
US5627639A (en) 1995-06-06 1997-05-06 Lockheed Missiles & Space Company, Inc. Coded aperture imaging spectrometer
JP2005514180A (ja) 2002-01-09 2005-05-19 シメッド　ライフ　システムズ　インコーポレイテッド 流体管理バルブ
US7701555B2 (en) 2005-07-01 2010-04-20 Nikon Corporation Exposure apparatus, exposure method, device manufacturing method, and system

Also Published As

Publication number Publication date
TW201129874A (en) 2011-09-01
CN102484350A (zh) 2012-05-30
US20110205512A1 (en) 2011-08-25
WO2011028246A1 (en) 2011-03-10
US8520186B2 (en) 2013-08-27
KR20120080181A (ko) 2012-07-16
EP2471150A1 (en) 2012-07-04
JP5395269B2 (ja) 2014-01-22
CN102484350B (zh) 2014-07-23
TWI427878B (zh) 2014-02-21
JP2013503477A (ja) 2013-01-31
EP2471150A4 (en) 2017-12-27
EP2471150B1 (en) 2019-01-23

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