KR101560493B1 - 출력 장치 및 그 진단 방법 - Google Patents

출력 장치 및 그 진단 방법 Download PDF

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Publication number
KR101560493B1
KR101560493B1 KR1020140121817A KR20140121817A KR101560493B1 KR 101560493 B1 KR101560493 B1 KR 101560493B1 KR 1020140121817 A KR1020140121817 A KR 1020140121817A KR 20140121817 A KR20140121817 A KR 20140121817A KR 101560493 B1 KR101560493 B1 KR 101560493B1
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KR
South Korea
Prior art keywords
output
signal
blocking
load
blocking element
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Korean (ko)
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KR20150032474A (ko
Inventor
후미타카 모우리
마코토 도코
히로시 나카타니
나오야 오니시
아키라 노지마
Original Assignee
가부시끼가이샤 도시바
도시바 미쓰비시덴키 산교시스템 가부시키가이샤
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Publication of KR20150032474A publication Critical patent/KR20150032474A/ko
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/04—Programme control other than numerical control, i.e. in sequence controllers or logic controllers
    • G05B19/042—Programme control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
    • G05B19/0423—Input/output
    • G05B19/0425—Safety, monitoring

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Electronic Switches (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing And Monitoring For Control Systems (AREA)
  • Power Conversion In General (AREA)
KR1020140121817A 2013-09-18 2014-09-15 출력 장치 및 그 진단 방법 Active KR101560493B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2013-193473 2013-09-18
JP2013193473A JP6121853B2 (ja) 2013-09-18 2013-09-18 出力装置およびその診断方法

Publications (2)

Publication Number Publication Date
KR20150032474A KR20150032474A (ko) 2015-03-26
KR101560493B1 true KR101560493B1 (ko) 2015-10-14

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ID=52668658

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KR1020140121817A Active KR101560493B1 (ko) 2013-09-18 2014-09-15 출력 장치 및 그 진단 방법

Country Status (5)

Country Link
US (1) US20150081041A1 (enExample)
JP (1) JP6121853B2 (enExample)
KR (1) KR101560493B1 (enExample)
CN (1) CN104460405B (enExample)
IN (1) IN2014DE02511A (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2017081506A1 (en) * 2015-11-09 2017-05-18 Otis Elevator Company Self-diagnostic electrical circuit
CN110376932B (zh) * 2018-04-13 2021-05-07 沈阳中科博微科技股份有限公司 一种高诊断覆盖率的功能安全开关量输出模块
CN111775978B (zh) * 2020-06-25 2023-03-10 中车永济电机有限公司 机车牵引控制单元的安全架构

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000148241A (ja) 1998-11-09 2000-05-26 Mitsubishi Electric Corp 故障警報装置
JP2008083965A (ja) 2006-09-27 2008-04-10 Japan Control Engineering Co Ltd 監視装置
JP2010277220A (ja) 2009-05-27 2010-12-09 Yokogawa Electric Corp デジタル出力モジュール
JP2013054427A (ja) 2011-09-01 2013-03-21 Toshiba Corp 診断付き出力装置

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3630583B2 (ja) * 1999-04-14 2005-03-16 株式会社日立製作所 フェールセーフスイッチのオンライン診断方法および装置
DE10043483A1 (de) * 2000-09-04 2002-07-25 Infineon Technologies Ag Optisches Sendemodul
JP2002082714A (ja) * 2000-09-08 2002-03-22 Tokyo Electron Ltd 入出力回路系の自己診断回路
CN1257411C (zh) * 2002-06-14 2006-05-24 三菱电机株式会社 车载电气负载驱动系统的异常检测装置
JP4266358B2 (ja) * 2004-04-12 2009-05-20 三菱電機株式会社 車載電子制御装置
KR100714482B1 (ko) * 2005-07-11 2007-05-04 삼성전자주식회사 반도체 장치, 테스트 기판, 반도체 장치의 테스트 시스템및 반도체 장치의 테스트 방법
US7502974B2 (en) * 2006-02-22 2009-03-10 Verigy (Singapore) Pte. Ltd. Method and apparatus for determining which timing sets to pre-load into the pin electronics of a circuit test system, and for pre-loading or storing said timing sets
US20090085598A1 (en) * 2007-09-28 2009-04-02 Qimonda Ag Integrated circuit test system and method with test driver sharing
JP5020307B2 (ja) * 2009-12-07 2012-09-05 三菱電機株式会社 電気負荷の駆動制御装置
JP5404437B2 (ja) * 2010-01-13 2014-01-29 株式会社東芝 安全出力装置
JP5740791B2 (ja) * 2011-04-15 2015-07-01 横河電機株式会社 ディジタル出力回路

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000148241A (ja) 1998-11-09 2000-05-26 Mitsubishi Electric Corp 故障警報装置
JP2008083965A (ja) 2006-09-27 2008-04-10 Japan Control Engineering Co Ltd 監視装置
JP2010277220A (ja) 2009-05-27 2010-12-09 Yokogawa Electric Corp デジタル出力モジュール
JP2013054427A (ja) 2011-09-01 2013-03-21 Toshiba Corp 診断付き出力装置

Also Published As

Publication number Publication date
IN2014DE02511A (enExample) 2015-06-26
JP2015060398A (ja) 2015-03-30
CN104460405B (zh) 2017-04-12
US20150081041A1 (en) 2015-03-19
JP6121853B2 (ja) 2017-04-26
KR20150032474A (ko) 2015-03-26
CN104460405A (zh) 2015-03-25

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