KR101507611B1 - 화학적 기계적 연마를 위한 상호침투 망상조직 - Google Patents
화학적 기계적 연마를 위한 상호침투 망상조직 Download PDFInfo
- Publication number
- KR101507611B1 KR101507611B1 KR1020080079827A KR20080079827A KR101507611B1 KR 101507611 B1 KR101507611 B1 KR 101507611B1 KR 1020080079827 A KR1020080079827 A KR 1020080079827A KR 20080079827 A KR20080079827 A KR 20080079827A KR 101507611 B1 KR101507611 B1 KR 101507611B1
- Authority
- KR
- South Korea
- Prior art keywords
- polishing
- abrasive
- chemical mechanical
- pad
- polishing pad
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/22—Lapping pads for working plane surfaces characterised by a multi-layered structure
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/26—Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/24—Structurally defined web or sheet [e.g., overall dimension, etc.]
- Y10T428/24355—Continuous and nonuniform or irregular surface on layer or component [e.g., roofing, etc.]
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/839,376 US7635290B2 (en) | 2007-08-15 | 2007-08-15 | Interpenetrating network for chemical mechanical polishing |
| US11/839,376 | 2007-08-15 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20090017993A KR20090017993A (ko) | 2009-02-19 |
| KR101507611B1 true KR101507611B1 (ko) | 2015-03-31 |
Family
ID=40029278
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020080079827A Active KR101507611B1 (ko) | 2007-08-15 | 2008-08-14 | 화학적 기계적 연마를 위한 상호침투 망상조직 |
Country Status (7)
| Country | Link |
|---|---|
| US (2) | US7635290B2 (https=) |
| EP (1) | EP2025458B1 (https=) |
| JP (1) | JP5216473B2 (https=) |
| KR (1) | KR101507611B1 (https=) |
| CN (2) | CN102554767B (https=) |
| SG (1) | SG150466A1 (https=) |
| TW (1) | TWI438835B (https=) |
Families Citing this family (44)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8221196B2 (en) * | 2007-08-15 | 2012-07-17 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing pad and methods of making and using same |
| US7530887B2 (en) * | 2007-08-16 | 2009-05-12 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing pad with controlled wetting |
| US8067305B2 (en) * | 2008-09-03 | 2011-11-29 | Ultratech, Inc. | Electrically conductive structure on a semiconductor substrate formed from printing |
| US8500515B2 (en) | 2010-03-12 | 2013-08-06 | Wayne O. Duescher | Fixed-spindle and floating-platen abrasive system using spherical mounts |
| US8602842B2 (en) | 2010-03-12 | 2013-12-10 | Wayne O. Duescher | Three-point fixed-spindle floating-platen abrasive system |
| US8740668B2 (en) | 2010-03-12 | 2014-06-03 | Wayne O. Duescher | Three-point spindle-supported floating abrasive platen |
| US8647171B2 (en) | 2010-03-12 | 2014-02-11 | Wayne O. Duescher | Fixed-spindle floating-platen workpiece loader apparatus |
| US20110287698A1 (en) * | 2010-05-18 | 2011-11-24 | Hitachi Global Storage Technologies Netherlands B.V. | System, method and apparatus for elastomer pad for fabricating magnetic recording disks |
| US8257545B2 (en) * | 2010-09-29 | 2012-09-04 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing pad with light stable polymeric endpoint detection window and method of polishing therewith |
| SG188621A1 (en) * | 2010-10-21 | 2013-04-30 | Moresco Corp | Lubricant composition for polishing glass substrates and polishing slurry |
| JP5404673B2 (ja) * | 2011-02-25 | 2014-02-05 | 株式会社東芝 | Cmp装置、研磨パッド及びcmp方法 |
| US10309018B2 (en) * | 2011-05-31 | 2019-06-04 | United Technologies Corporation | Composite article having layer with co-continuous material regions |
| US9108291B2 (en) | 2011-09-22 | 2015-08-18 | Dow Global Technologies Llc | Method of forming structured-open-network polishing pads |
| US8894799B2 (en) | 2011-09-22 | 2014-11-25 | Dow Global Technologies Llc | Method of forming layered-open-network polishing pads |
| US8801949B2 (en) | 2011-09-22 | 2014-08-12 | Dow Global Technologies Llc | Method of forming open-network polishing pads |
| JP6239354B2 (ja) * | 2012-12-04 | 2017-11-29 | 不二越機械工業株式会社 | ウェーハ研磨装置 |
| JP6067481B2 (ja) * | 2013-05-23 | 2017-01-25 | 株式会社東芝 | 研磨パッド、研磨方法、および研磨パッドの製造方法 |
| US20160354896A1 (en) * | 2014-02-10 | 2016-12-08 | President And Fellows Of Harvard College | 3d-printed polishing pad for chemical-mechanical planarization (cmp) |
| US9873180B2 (en) | 2014-10-17 | 2018-01-23 | Applied Materials, Inc. | CMP pad construction with composite material properties using additive manufacturing processes |
| US10821573B2 (en) | 2014-10-17 | 2020-11-03 | Applied Materials, Inc. | Polishing pads produced by an additive manufacturing process |
| US9776361B2 (en) | 2014-10-17 | 2017-10-03 | Applied Materials, Inc. | Polishing articles and integrated system and methods for manufacturing chemical mechanical polishing articles |
| US10875145B2 (en) | 2014-10-17 | 2020-12-29 | Applied Materials, Inc. | Polishing pads produced by an additive manufacturing process |
| US11745302B2 (en) | 2014-10-17 | 2023-09-05 | Applied Materials, Inc. | Methods and precursor formulations for forming advanced polishing pads by use of an additive manufacturing process |
| US10399201B2 (en) | 2014-10-17 | 2019-09-03 | Applied Materials, Inc. | Advanced polishing pads having compositional gradients by use of an additive manufacturing process |
| KR20240015167A (ko) | 2014-10-17 | 2024-02-02 | 어플라이드 머티어리얼스, 인코포레이티드 | 애디티브 제조 프로세스들을 이용한 복합 재료 특성들을 갖는 cmp 패드 구성 |
| US10875153B2 (en) | 2014-10-17 | 2020-12-29 | Applied Materials, Inc. | Advanced polishing pad materials and formulations |
| JP2016087770A (ja) * | 2014-11-11 | 2016-05-23 | 株式会社東芝 | 研磨布および研磨方法 |
| TWI754275B (zh) * | 2015-10-16 | 2022-02-01 | 美商應用材料股份有限公司 | 拋光墊及形成其之方法 |
| JP6940495B2 (ja) | 2015-10-30 | 2021-09-29 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | 所望のゼータ電位を有する研磨用物品を形成するための装置及び方法 |
| US10593574B2 (en) | 2015-11-06 | 2020-03-17 | Applied Materials, Inc. | Techniques for combining CMP process tracking data with 3D printed CMP consumables |
| CN105729250B (zh) * | 2015-12-29 | 2018-01-30 | 广东工业大学 | 一种自修整磁流变柔性抛光砂轮及其磨抛方法 |
| US10391605B2 (en) | 2016-01-19 | 2019-08-27 | Applied Materials, Inc. | Method and apparatus for forming porous advanced polishing pads using an additive manufacturing process |
| KR102587473B1 (ko) | 2016-02-08 | 2023-10-11 | 어플라이드 머티어리얼스, 인코포레이티드 | 화학적 연마를 위한 시스템들, 장치, 및 방법들 |
| US20180304539A1 (en) | 2017-04-21 | 2018-10-25 | Applied Materials, Inc. | Energy delivery system with array of energy sources for an additive manufacturing apparatus |
| US11471999B2 (en) | 2017-07-26 | 2022-10-18 | Applied Materials, Inc. | Integrated abrasive polishing pads and manufacturing methods |
| US11072050B2 (en) | 2017-08-04 | 2021-07-27 | Applied Materials, Inc. | Polishing pad with window and manufacturing methods thereof |
| WO2019032286A1 (en) | 2017-08-07 | 2019-02-14 | Applied Materials, Inc. | ABRASIVE DISTRIBUTION POLISHING PADS AND METHODS OF MAKING SAME |
| TWI639486B (zh) * | 2018-05-31 | 2018-11-01 | 國立清華大學 | 全向整合式調節裝置 |
| WO2020050932A1 (en) | 2018-09-04 | 2020-03-12 | Applied Materials, Inc. | Formulations for advanced polishing pads |
| US20210053056A1 (en) * | 2019-08-23 | 2021-02-25 | Lawrence Livermore National Security, Llc | Systems and methods for reaction and transport engineering via cellular fluidics |
| US11813712B2 (en) | 2019-12-20 | 2023-11-14 | Applied Materials, Inc. | Polishing pads having selectively arranged porosity |
| US11806829B2 (en) | 2020-06-19 | 2023-11-07 | Applied Materials, Inc. | Advanced polishing pads and related polishing pad manufacturing methods |
| US11878389B2 (en) | 2021-02-10 | 2024-01-23 | Applied Materials, Inc. | Structures formed using an additive manufacturing process for regenerating surface texture in situ |
| CN117103107A (zh) * | 2022-05-16 | 2023-11-24 | 成都高真科技有限公司 | 还原料浆用抛光装置 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20060026437A (ko) * | 2003-06-23 | 2006-03-23 | 캐보트 마이크로일렉트로닉스 코포레이션 | 전기화학적-기계적 연마용 연마 패드 |
| KR101109324B1 (ko) | 2004-09-01 | 2012-01-31 | 캐보트 마이크로일렉트로닉스 코포레이션 | 미세다공성 영역을 갖는 연마 패드 |
Family Cites Families (37)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4927432A (en) * | 1986-03-25 | 1990-05-22 | Rodel, Inc. | Pad material for grinding, lapping and polishing |
| US4931287A (en) * | 1988-06-14 | 1990-06-05 | University Of Utah | Heterogeneous interpenetrating polymer networks for the controlled release of drugs |
| US6069080A (en) * | 1992-08-19 | 2000-05-30 | Rodel Holdings, Inc. | Fixed abrasive polishing system for the manufacture of semiconductor devices, memory disks and the like |
| US6099394A (en) * | 1998-02-10 | 2000-08-08 | Rodel Holdings, Inc. | Polishing system having a multi-phase polishing substrate and methods relating thereto |
| MY114512A (en) * | 1992-08-19 | 2002-11-30 | Rodel Inc | Polymeric substrate with polymeric microelements |
| US5976000A (en) * | 1996-05-28 | 1999-11-02 | Micron Technology, Inc. | Polishing pad with incompressible, highly soluble particles for chemical-mechanical planarization of semiconductor wafers |
| JPH11285961A (ja) * | 1998-04-03 | 1999-10-19 | Nikon Corp | 研磨パッド及び研磨方法 |
| JP3668046B2 (ja) * | 1998-05-11 | 2005-07-06 | 株式会社東芝 | 研磨布及びこの研磨布を用いた半導体装置の製造方法 |
| CN1137013C (zh) * | 1999-01-21 | 2004-02-04 | 罗德尔控股公司 | 改进的抛光垫及其抛光方法 |
| US6656018B1 (en) * | 1999-04-13 | 2003-12-02 | Freudenberg Nonwovens Limited Partnership | Polishing pads useful in chemical mechanical polishing of substrates in the presence of a slurry containing abrasive particles |
| US6296717B1 (en) * | 1999-06-11 | 2001-10-02 | International Business Machines Corporation | Regeneration of chemical mechanical polishing pads in-situ |
| US6533645B2 (en) * | 2000-01-18 | 2003-03-18 | Applied Materials, Inc. | Substrate polishing article |
| US6712681B1 (en) * | 2000-06-23 | 2004-03-30 | International Business Machines Corporation | Polishing pads with polymer filled fibrous web, and methods for fabricating and using same |
| JP2002190460A (ja) * | 2000-10-12 | 2002-07-05 | Toshiba Corp | 研磨布、研磨装置および半導体装置の製造方法 |
| US6857941B2 (en) * | 2001-06-01 | 2005-02-22 | Applied Materials, Inc. | Multi-phase polishing pad |
| JP2002361564A (ja) * | 2001-06-06 | 2002-12-18 | Nihon Micro Coating Co Ltd | 研磨シート及びその製造方法 |
| TW561541B (en) * | 2001-10-09 | 2003-11-11 | Hitachi Chemical Co Ltd | Polishing pad for CMP, method for polishing substrate using it and method for producing polishing pad for CMP |
| US7037184B2 (en) * | 2003-01-22 | 2006-05-02 | Raytech Innovation Solutions, Llc | Polishing pad for use in chemical-mechanical planarization of semiconductor wafers and method of making same |
| TWI228768B (en) | 2002-08-08 | 2005-03-01 | Jsr Corp | Processing method of polishing pad for semiconductor wafer and polishing pad for semiconductor wafer |
| KR20050052513A (ko) * | 2002-09-25 | 2005-06-02 | 피피지 인더스트리즈 오하이오 인코포레이티드 | 평탄화를 위한 윈도를 가진 연마 패드 |
| US20040226620A1 (en) * | 2002-09-26 | 2004-11-18 | Daniel Therriault | Microcapillary networks |
| US7311862B2 (en) * | 2002-10-28 | 2007-12-25 | Cabot Microelectronics Corporation | Method for manufacturing microporous CMP materials having controlled pore size |
| JP4039214B2 (ja) * | 2002-11-05 | 2008-01-30 | Jsr株式会社 | 研磨パッド |
| US6979713B2 (en) * | 2002-11-25 | 2005-12-27 | 3M Innovative Properties Company | Curable compositions and abrasive articles therefrom |
| CN1768417A (zh) * | 2003-04-03 | 2006-05-03 | 日立化成工业株式会社 | 研磨垫、其制造方法以及使用该研磨垫的研磨方法 |
| US6802878B1 (en) * | 2003-04-17 | 2004-10-12 | 3M Innovative Properties Company | Abrasive particles, abrasive articles, and methods of making and using the same |
| US7160178B2 (en) * | 2003-08-07 | 2007-01-09 | 3M Innovative Properties Company | In situ activation of a three-dimensional fixed abrasive article |
| US7059950B1 (en) * | 2004-12-14 | 2006-06-13 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | CMP polishing pad having grooves arranged to improve polishing medium utilization |
| KR100709392B1 (ko) | 2005-07-20 | 2007-04-20 | 에스케이씨 주식회사 | 액상의 비닐계 모노머가 상호침투 가교된 형태를 갖는폴리우레탄 연마 패드 |
| TW200720017A (en) * | 2005-09-19 | 2007-06-01 | Rohm & Haas Elect Mat | Water-based polishing pads having improved adhesion properties and methods of manufacture |
| US7604529B2 (en) * | 2006-02-16 | 2009-10-20 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Three-dimensional network for chemical mechanical polishing |
| US7503833B2 (en) * | 2006-02-16 | 2009-03-17 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Three-dimensional network for chemical mechanical polishing |
| US8192257B2 (en) * | 2006-04-06 | 2012-06-05 | Micron Technology, Inc. | Method of manufacture of constant groove depth pads |
| JP5289787B2 (ja) * | 2007-02-01 | 2013-09-11 | 株式会社クラレ | 研磨パッド及び研磨パッドの製造方法 |
| US7517277B2 (en) | 2007-08-16 | 2009-04-14 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Layered-filament lattice for chemical mechanical polishing |
| US7530887B2 (en) | 2007-08-16 | 2009-05-12 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing pad with controlled wetting |
| US7828634B2 (en) | 2007-08-16 | 2010-11-09 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Interconnected-multi-element-lattice polishing pad |
-
2007
- 2007-08-15 US US11/839,376 patent/US7635290B2/en active Active
-
2008
- 2008-08-05 TW TW097129622A patent/TWI438835B/zh active
- 2008-08-13 SG SG200806006-3A patent/SG150466A1/en unknown
- 2008-08-14 CN CN201210031219.9A patent/CN102554767B/zh active Active
- 2008-08-14 EP EP08162352.2A patent/EP2025458B1/en not_active Ceased
- 2008-08-14 CN CN2008102104936A patent/CN101367204B/zh active Active
- 2008-08-14 KR KR1020080079827A patent/KR101507611B1/ko active Active
- 2008-08-15 JP JP2008209139A patent/JP5216473B2/ja active Active
-
2009
- 2009-07-16 US US12/504,189 patent/US7635291B2/en active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20060026437A (ko) * | 2003-06-23 | 2006-03-23 | 캐보트 마이크로일렉트로닉스 코포레이션 | 전기화학적-기계적 연마용 연마 패드 |
| KR101109324B1 (ko) | 2004-09-01 | 2012-01-31 | 캐보트 마이크로일렉트로닉스 코포레이션 | 미세다공성 영역을 갖는 연마 패드 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP2025458A2 (en) | 2009-02-18 |
| JP2009056585A (ja) | 2009-03-19 |
| TWI438835B (zh) | 2014-05-21 |
| CN101367204A (zh) | 2009-02-18 |
| US7635291B2 (en) | 2009-12-22 |
| SG150466A1 (en) | 2009-03-30 |
| JP5216473B2 (ja) | 2013-06-19 |
| KR20090017993A (ko) | 2009-02-19 |
| EP2025458A3 (en) | 2014-04-02 |
| CN102554767A (zh) | 2012-07-11 |
| US20090280725A1 (en) | 2009-11-12 |
| EP2025458B1 (en) | 2015-06-03 |
| US20090047871A1 (en) | 2009-02-19 |
| US7635290B2 (en) | 2009-12-22 |
| CN102554767B (zh) | 2015-11-25 |
| TW200913042A (en) | 2009-03-16 |
| CN101367204B (zh) | 2012-11-14 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR101507611B1 (ko) | 화학적 기계적 연마를 위한 상호침투 망상조직 | |
| KR101539462B1 (ko) | 화학적 기계적 연마를 위한 적층된-필라멘트 격자 | |
| KR101483306B1 (ko) | 상호연결된-다중-요소-격자 연마 패드 | |
| KR101268613B1 (ko) | 화학 기계적 연마를 위한 3차원 네트워크 | |
| JP5317574B2 (ja) | 濡れ制御を備えたケミカルメカニカル研磨パッド | |
| US7604529B2 (en) | Three-dimensional network for chemical mechanical polishing | |
| CN100584536C (zh) | 用于化学机械抛光的三维网络结构 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |
|
| A201 | Request for examination | ||
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
|
| E13-X000 | Pre-grant limitation requested |
St.27 status event code: A-2-3-E10-E13-lim-X000 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |
|
| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
St.27 status event code: A-1-2-D10-D22-exm-PE0701 |
|
| GRNT | Written decision to grant | ||
| PR0701 | Registration of establishment |
St.27 status event code: A-2-4-F10-F11-exm-PR0701 |
|
| PR1002 | Payment of registration fee |
St.27 status event code: A-2-2-U10-U11-oth-PR1002 Fee payment year number: 1 |
|
| PG1601 | Publication of registration |
St.27 status event code: A-4-4-Q10-Q13-nap-PG1601 |
|
| FPAY | Annual fee payment |
Payment date: 20180228 Year of fee payment: 4 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 4 |
|
| FPAY | Annual fee payment |
Payment date: 20190227 Year of fee payment: 5 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 5 |
|
| FPAY | Annual fee payment |
Payment date: 20200227 Year of fee payment: 6 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 6 |
|
| FPAY | Annual fee payment |
Payment date: 20210302 Year of fee payment: 7 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 7 |
|
| FPAY | Annual fee payment |
Payment date: 20220216 Year of fee payment: 8 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 8 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 9 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 10 |
|
| PN2301 | Change of applicant |
St.27 status event code: A-5-5-R10-R13-asn-PN2301 St.27 status event code: A-5-5-R10-R11-asn-PN2301 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 11 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-4-4-P10-P22-nap-X000 |