KR101342450B1 - 전자부품 시험장치, 소켓보드 조립체 및 인터페이스 장치 - Google Patents

전자부품 시험장치, 소켓보드 조립체 및 인터페이스 장치 Download PDF

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Publication number
KR101342450B1
KR101342450B1 KR1020120047955A KR20120047955A KR101342450B1 KR 101342450 B1 KR101342450 B1 KR 101342450B1 KR 1020120047955 A KR1020120047955 A KR 1020120047955A KR 20120047955 A KR20120047955 A KR 20120047955A KR 101342450 B1 KR101342450 B1 KR 101342450B1
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KR
South Korea
Prior art keywords
hook
board
pin
push pin
socket
Prior art date
Application number
KR1020120047955A
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English (en)
Korean (ko)
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KR20120127241A (ko
Inventor
토모유키 타카모토
유타카 와타나베
Original Assignee
가부시키가이샤 아드반테스트
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by 가부시키가이샤 아드반테스트 filed Critical 가부시키가이샤 아드반테스트
Publication of KR20120127241A publication Critical patent/KR20120127241A/ko
Application granted granted Critical
Publication of KR101342450B1 publication Critical patent/KR101342450B1/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
KR1020120047955A 2011-05-12 2012-05-07 전자부품 시험장치, 소켓보드 조립체 및 인터페이스 장치 KR101342450B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2011-107364 2011-05-12
JP2011107364A JP2012237669A (ja) 2011-05-12 2011-05-12 電子部品試験装置、ソケットボード組立体、及びインタフェース装置

Publications (2)

Publication Number Publication Date
KR20120127241A KR20120127241A (ko) 2012-11-21
KR101342450B1 true KR101342450B1 (ko) 2013-12-17

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Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020120047955A KR101342450B1 (ko) 2011-05-12 2012-05-07 전자부품 시험장치, 소켓보드 조립체 및 인터페이스 장치

Country Status (3)

Country Link
JP (1) JP2012237669A (ja)
KR (1) KR101342450B1 (ja)
TW (1) TW201305575A (ja)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101398833B1 (ko) * 2014-01-03 2014-06-11 (주)지에스티 낸드 플래시 메모리 전용의 테스트 확장장치
KR20160061761A (ko) 2014-10-31 2016-06-01 세메스 주식회사 반도체 소자들의 테스트를 위한 인터페이스 장치
KR101653594B1 (ko) * 2015-03-17 2016-09-05 (주) 네스텍코리아 교환형 전자부품 테스트 소켓
JP6744173B2 (ja) * 2016-08-09 2020-08-19 株式会社エンプラス 電気部品用ソケット
KR102039625B1 (ko) * 2017-09-25 2019-11-01 주식회사 아이에스시 검사용 소켓
KR102443572B1 (ko) 2018-04-30 2022-09-16 주식회사 아이에스시 반도체 소자들의 테스트를 위한 인터페이스 장치
KR102179191B1 (ko) 2019-04-24 2020-11-18 티비에스테스트테크놀러지스코리아 주식회사 유니버설 타입의 반도체 소자 테스트 장치
KR102377693B1 (ko) 2020-07-17 2022-03-23 주식회사 에스티아이테크 결로 방지 구조의 전자 부품용 시험 장치
KR102377694B1 (ko) 2020-07-28 2022-03-23 주식회사 에스티아이테크 보드 결합용 브래킷 및 이에 의한 보드 어셈블리

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008078048A (ja) 2006-09-22 2008-04-03 Advantest Corp コネクタ組立体、リセプタクル型コネクタ及びインタフェース装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008078048A (ja) 2006-09-22 2008-04-03 Advantest Corp コネクタ組立体、リセプタクル型コネクタ及びインタフェース装置

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Publication number Publication date
TW201305575A (zh) 2013-02-01
JP2012237669A (ja) 2012-12-06
KR20120127241A (ko) 2012-11-21

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