KR101260566B1 - 사중극 또는 비행시간형 질량 분석기를 이용한 화학적 이온화 반응 또는 양자 전이 반응 질량 분석법 - Google Patents

사중극 또는 비행시간형 질량 분석기를 이용한 화학적 이온화 반응 또는 양자 전이 반응 질량 분석법 Download PDF

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KR101260566B1
KR101260566B1 KR1020107007918A KR20107007918A KR101260566B1 KR 101260566 B1 KR101260566 B1 KR 101260566B1 KR 1020107007918 A KR1020107007918 A KR 1020107007918A KR 20107007918 A KR20107007918 A KR 20107007918A KR 101260566 B1 KR101260566 B1 KR 101260566B1
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reagent
predetermined number
reagent ions
mass
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KR20100083785A (ko
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티모시 로저 로빈슨
마크 애트우드
싱 첸
윌리암 엠. 홀버
마크 필립 롱슨
조나단 헨리 팔크
알리 사지이
존 에이. 스미스
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엠케이에스 인스트루먼츠, 인코포레이티드
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Priority claimed from US11/869,978 external-priority patent/US8003935B2/en
Priority claimed from US12/026,799 external-priority patent/US8334505B2/en
Application filed by 엠케이에스 인스트루먼츠, 인코포레이티드 filed Critical 엠케이에스 인스트루먼츠, 인코포레이티드
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/105Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/14Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/145Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using chemical ionisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
KR1020107007918A 2007-10-10 2008-09-23 사중극 또는 비행시간형 질량 분석기를 이용한 화학적 이온화 반응 또는 양자 전이 반응 질량 분석법 Expired - Fee Related KR101260566B1 (ko)

Applications Claiming Priority (6)

Application Number Priority Date Filing Date Title
US11/869,978 2007-10-10
US11/869,980 2007-10-10
US11/869,980 US8003936B2 (en) 2007-10-10 2007-10-10 Chemical ionization reaction or proton transfer reaction mass spectrometry with a time-of-flight mass spectrometer
US11/869,978 US8003935B2 (en) 2007-10-10 2007-10-10 Chemical ionization reaction or proton transfer reaction mass spectrometry with a quadrupole mass spectrometer
US12/026,799 US8334505B2 (en) 2007-10-10 2008-02-06 Chemical ionization reaction or proton transfer reaction mass spectrometry
US12/026,799 2008-02-06

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KR1020127020925A Division KR101260631B1 (ko) 2007-10-10 2008-09-23 사중극 또는 비행시간형 질량 분석기를 이용한 화학적 이온화 반응 또는 양자 전이 반응 질량 분석법

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KR20100083785A KR20100083785A (ko) 2010-07-22
KR101260566B1 true KR101260566B1 (ko) 2013-05-06

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KR1020127020925A Expired - Fee Related KR101260631B1 (ko) 2007-10-10 2008-09-23 사중극 또는 비행시간형 질량 분석기를 이용한 화학적 이온화 반응 또는 양자 전이 반응 질량 분석법

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EP (1) EP2212903B1 (https=)
JP (3) JP2011511929A (https=)
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CN (1) CN101855700B (https=)
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WO (1) WO2009048739A2 (https=)

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CN109243960B (zh) 2017-07-10 2020-11-17 株式会社岛津制作所 一种质子转移反应质谱仪
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EP3474311A1 (en) * 2017-10-20 2019-04-24 Tofwerk AG Ion molecule reactor
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GB201808912D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808892D0 (en) * 2018-05-31 2018-07-18 Micromass Ltd Mass spectrometer
GB201808893D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201810824D0 (en) 2018-06-01 2018-08-15 Micromass Ltd An outer source assembly and associated components
EP3629365A1 (en) * 2018-09-28 2020-04-01 Ionicon Analytik Gesellschaft m.b.H. Imr-ms reaction chamber
CN110110743B (zh) * 2019-03-26 2019-12-31 中国检验检疫科学研究院 一种七类质谱谱图自动识别系统与方法
DE102019215319A1 (de) * 2019-10-07 2021-04-08 Leybold Gmbh Einlasssystem für ein Massenspektrometer
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JP7370234B2 (ja) * 2019-12-02 2023-10-27 株式会社堀場エステック 四重極質量分析装置、四重極質量分析方法、及び、四重極質量分析装置用プログラム
CN111220697A (zh) * 2020-01-21 2020-06-02 北京雪迪龙科技股份有限公司 大气中气体的检测方法、检测系统及检测设备
US12322584B2 (en) 2020-02-28 2025-06-03 Georgetown University Apparatus and methods for detection and quantification of elements in molecules
CN112347155B (zh) * 2020-10-29 2023-11-21 南京大学 基于数据挖掘的场地污染特征因子识别和监测指标优化方法
CN112229893B (zh) * 2020-11-04 2024-07-16 肖洋 高分辨率高灵敏度快速测定挥发性有机物的在线监测系统及方法
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CN113447618B (zh) * 2021-06-29 2023-11-03 重庆大学 多传感器电子鼻的阶梯形气室、双进样检测系统及方法
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KR101260631B1 (ko) 2013-05-06
EP2212903B1 (en) 2014-08-27
JP2012037529A (ja) 2012-02-23
CN101855700B (zh) 2012-12-05
WO2009048739A3 (en) 2009-11-26
KR20120107010A (ko) 2012-09-27
TW200937487A (en) 2009-09-01
TWI368249B (en) 2012-07-11
EP2212903A2 (en) 2010-08-04
KR20100083785A (ko) 2010-07-22
CN101855700A (zh) 2010-10-06
JP2011511929A (ja) 2011-04-14
JP2012054239A (ja) 2012-03-15
WO2009048739A2 (en) 2009-04-16

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