CN101855700B - 使用四极或飞行时间质谱仪的化学电离反应或质子转移反应质谱测定 - Google Patents

使用四极或飞行时间质谱仪的化学电离反应或质子转移反应质谱测定 Download PDF

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Publication number
CN101855700B
CN101855700B CN2008801159342A CN200880115934A CN101855700B CN 101855700 B CN101855700 B CN 101855700B CN 2008801159342 A CN2008801159342 A CN 2008801159342A CN 200880115934 A CN200880115934 A CN 200880115934A CN 101855700 B CN101855700 B CN 101855700B
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China
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ion
reagent
chamber
ions
microwave
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Expired - Fee Related
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CN2008801159342A
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Chinese (zh)
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CN101855700A (zh
Inventor
T·R·罗宾逊
M·爱特伍德
X·陈
W·M·霍尔伯
M·P·朗逊
J·H·波尔克
A·沙基
J·A·史密斯
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MKS Instruments Inc
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MKS Instruments Inc
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Priority claimed from US11/869,980 external-priority patent/US8003936B2/en
Priority claimed from US11/869,978 external-priority patent/US8003935B2/en
Priority claimed from US12/026,799 external-priority patent/US8334505B2/en
Application filed by MKS Instruments Inc filed Critical MKS Instruments Inc
Publication of CN101855700A publication Critical patent/CN101855700A/zh
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/105—Ion sources; Ion guns using high-frequency excitation, e.g. microwave excitation, Inductively Coupled Plasma [ICP]
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/145—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using chemical ionisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
CN2008801159342A 2007-10-10 2008-09-23 使用四极或飞行时间质谱仪的化学电离反应或质子转移反应质谱测定 Expired - Fee Related CN101855700B (zh)

Applications Claiming Priority (7)

Application Number Priority Date Filing Date Title
US11/869,978 2007-10-10
US11/869,980 2007-10-10
US11/869,980 US8003936B2 (en) 2007-10-10 2007-10-10 Chemical ionization reaction or proton transfer reaction mass spectrometry with a time-of-flight mass spectrometer
US11/869,978 US8003935B2 (en) 2007-10-10 2007-10-10 Chemical ionization reaction or proton transfer reaction mass spectrometry with a quadrupole mass spectrometer
US12/026,799 US8334505B2 (en) 2007-10-10 2008-02-06 Chemical ionization reaction or proton transfer reaction mass spectrometry
US12/026,799 2008-02-06
PCT/US2008/077365 WO2009048739A2 (en) 2007-10-10 2008-09-23 Chemical ionization reaction or proton transfer reaction mass spectrometry with a quadrupole or time-of-flight mass spectrometer

Publications (2)

Publication Number Publication Date
CN101855700A CN101855700A (zh) 2010-10-06
CN101855700B true CN101855700B (zh) 2012-12-05

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CN2008801159342A Expired - Fee Related CN101855700B (zh) 2007-10-10 2008-09-23 使用四极或飞行时间质谱仪的化学电离反应或质子转移反应质谱测定

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EP (1) EP2212903B1 (https=)
JP (3) JP2011511929A (https=)
KR (2) KR101260566B1 (https=)
CN (1) CN101855700B (https=)
TW (1) TWI368249B (https=)
WO (1) WO2009048739A2 (https=)

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CN109243960B (zh) 2017-07-10 2020-11-17 株式会社岛津制作所 一种质子转移反应质谱仪
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EP3474311A1 (en) * 2017-10-20 2019-04-24 Tofwerk AG Ion molecule reactor
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GB201808892D0 (en) * 2018-05-31 2018-07-18 Micromass Ltd Mass spectrometer
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EP3629365A1 (en) * 2018-09-28 2020-04-01 Ionicon Analytik Gesellschaft m.b.H. Imr-ms reaction chamber
CN110110743B (zh) * 2019-03-26 2019-12-31 中国检验检疫科学研究院 一种七类质谱谱图自动识别系统与方法
DE102019215319A1 (de) * 2019-10-07 2021-04-08 Leybold Gmbh Einlasssystem für ein Massenspektrometer
EP3819611B1 (en) * 2019-11-05 2024-03-27 Hitachi High-Tech Analytical Science GmbH An easily adjustable optical emission spectrometer
JP7370234B2 (ja) * 2019-12-02 2023-10-27 株式会社堀場エステック 四重極質量分析装置、四重極質量分析方法、及び、四重極質量分析装置用プログラム
CN111220697A (zh) * 2020-01-21 2020-06-02 北京雪迪龙科技股份有限公司 大气中气体的检测方法、检测系统及检测设备
US12322584B2 (en) 2020-02-28 2025-06-03 Georgetown University Apparatus and methods for detection and quantification of elements in molecules
CN112347155B (zh) * 2020-10-29 2023-11-21 南京大学 基于数据挖掘的场地污染特征因子识别和监测指标优化方法
CN112229893B (zh) * 2020-11-04 2024-07-16 肖洋 高分辨率高灵敏度快速测定挥发性有机物的在线监测系统及方法
WO2022173451A1 (en) * 2021-02-15 2022-08-18 Boronse Adrien A device for detecting explosive materials, or weapons or firearms, or knives or substances
CN113192818B (zh) * 2021-03-26 2022-07-08 广东省科学院测试分析研究所(中国广州分析测试中心) 微波等离子体炬-固相微萃取-飞行时间质谱联用系统
CN113447618B (zh) * 2021-06-29 2023-11-03 重庆大学 多传感器电子鼻的阶梯形气室、双进样检测系统及方法
CN117795644A (zh) * 2021-08-02 2024-03-29 株式会社岛津制作所 质谱分析装置和质谱分析方法
CN116153761B (zh) * 2023-04-21 2023-07-11 浙江迪谱诊断技术有限公司 飞行时间质谱仪
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CN120064430B (zh) * 2025-03-04 2025-10-10 河南省岩石矿物测试中心 一种基于大数据的矿石中金含量检测方法及系统
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Publication number Publication date
KR101260631B1 (ko) 2013-05-06
EP2212903B1 (en) 2014-08-27
JP2012037529A (ja) 2012-02-23
WO2009048739A3 (en) 2009-11-26
KR20120107010A (ko) 2012-09-27
TW200937487A (en) 2009-09-01
TWI368249B (en) 2012-07-11
EP2212903A2 (en) 2010-08-04
KR101260566B1 (ko) 2013-05-06
KR20100083785A (ko) 2010-07-22
CN101855700A (zh) 2010-10-06
JP2011511929A (ja) 2011-04-14
JP2012054239A (ja) 2012-03-15
WO2009048739A2 (en) 2009-04-16

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