KR101185881B1 - 카메라 시스템 및 관련 방법들 - Google Patents

카메라 시스템 및 관련 방법들 Download PDF

Info

Publication number
KR101185881B1
KR101185881B1 KR1020097003164A KR20097003164A KR101185881B1 KR 101185881 B1 KR101185881 B1 KR 101185881B1 KR 1020097003164 A KR1020097003164 A KR 1020097003164A KR 20097003164 A KR20097003164 A KR 20097003164A KR 101185881 B1 KR101185881 B1 KR 101185881B1
Authority
KR
South Korea
Prior art keywords
substrate
optical stack
detector
optical
detector substrate
Prior art date
Application number
KR1020097003164A
Other languages
English (en)
Korean (ko)
Other versions
KR20090034981A (ko
Inventor
마이클 알. 펠드만
제임스 이. 모리스
로버트 디. 테콜스트
Original Assignee
디지털옵틱스 코포레이션 이스트
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US11/487,580 external-priority patent/US8049806B2/en
Application filed by 디지털옵틱스 코포레이션 이스트 filed Critical 디지털옵틱스 코포레이션 이스트
Publication of KR20090034981A publication Critical patent/KR20090034981A/ko
Application granted granted Critical
Publication of KR101185881B1 publication Critical patent/KR101185881B1/ko

Links

Images

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/02Mountings, adjusting means, or light-tight connections, for optical elements for lenses
    • G02B7/021Mountings, adjusting means, or light-tight connections, for optical elements for lenses for more than one lens
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B13/00Optical objectives specially designed for the purposes specified below
    • G02B13/001Miniaturised objectives for electronic devices, e.g. portable telephones, webcams, PDAs, small digital cameras
    • G02B13/0015Miniaturised objectives for electronic devices, e.g. portable telephones, webcams, PDAs, small digital cameras characterised by the lens design
    • G02B13/002Miniaturised objectives for electronic devices, e.g. portable telephones, webcams, PDAs, small digital cameras characterised by the lens design having at least one aspherical surface
    • G02B13/003Miniaturised objectives for electronic devices, e.g. portable telephones, webcams, PDAs, small digital cameras characterised by the lens design having at least one aspherical surface having two lenses
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B13/00Optical objectives specially designed for the purposes specified below
    • G02B13/001Miniaturised objectives for electronic devices, e.g. portable telephones, webcams, PDAs, small digital cameras
    • G02B13/0015Miniaturised objectives for electronic devices, e.g. portable telephones, webcams, PDAs, small digital cameras characterised by the lens design
    • G02B13/002Miniaturised objectives for electronic devices, e.g. portable telephones, webcams, PDAs, small digital cameras characterised by the lens design having at least one aspherical surface
    • G02B13/0035Miniaturised objectives for electronic devices, e.g. portable telephones, webcams, PDAs, small digital cameras characterised by the lens design having at least one aspherical surface having three lenses
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B13/00Optical objectives specially designed for the purposes specified below
    • G02B13/001Miniaturised objectives for electronic devices, e.g. portable telephones, webcams, PDAs, small digital cameras
    • G02B13/0055Miniaturised objectives for electronic devices, e.g. portable telephones, webcams, PDAs, small digital cameras employing a special optical element
    • G02B13/006Miniaturised objectives for electronic devices, e.g. portable telephones, webcams, PDAs, small digital cameras employing a special optical element at least one element being a compound optical element, e.g. cemented elements
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B13/00Optical objectives specially designed for the purposes specified below
    • G02B13/001Miniaturised objectives for electronic devices, e.g. portable telephones, webcams, PDAs, small digital cameras
    • G02B13/0085Miniaturised objectives for electronic devices, e.g. portable telephones, webcams, PDAs, small digital cameras employing wafer level optics
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/02Mountings, adjusting means, or light-tight connections, for optical elements for lenses
    • G02B7/025Mountings, adjusting means, or light-tight connections, for optical elements for lenses using glue
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144Devices controlled by radiation
    • H01L27/146Imager structures
    • H01L27/14601Structural or functional details thereof
    • H01L27/14618Containers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144Devices controlled by radiation
    • H01L27/146Imager structures
    • H01L27/14601Structural or functional details thereof
    • H01L27/14625Optical elements or arrangements associated with the device
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144Devices controlled by radiation
    • H01L27/146Imager structures
    • H01L27/14683Processes or apparatus peculiar to the manufacture or treatment of these devices or parts thereof
    • H01L27/14685Process for coatings or optical elements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02Details
    • H01L31/0203Containers; Encapsulations, e.g. encapsulation of photodiodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02Details
    • H01L31/0232Optical elements or arrangements associated with the device
    • H01L31/02325Optical elements or arrangements associated with the device the optical elements not being integrated nor being directly associated with the device
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00Cameras or camera modules comprising electronic image sensors; Control thereof
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/50Constructional details
    • H04N23/55Optical parts specially adapted for electronic image sensors; Mounting thereof
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04NPICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/57Mechanical or electrical details of cameras or camera modules specially adapted for being embedded in other devices
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/24Coupling light guides
    • G02B6/42Coupling light guides with opto-electronic elements
    • G02B6/4201Packages, e.g. shape, construction, internal or external details
    • G02B6/4204Packages, e.g. shape, construction, internal or external details the coupling comprising intermediate optical elements, e.g. lenses, holograms
    • G02B6/4206Optical features
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/24Coupling light guides
    • G02B6/42Coupling light guides with opto-electronic elements
    • G02B6/4201Packages, e.g. shape, construction, internal or external details
    • G02B6/4249Packages, e.g. shape, construction, internal or external details comprising arrays of active devices and fibres
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Optics & Photonics (AREA)
  • Electromagnetism (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Signal Processing (AREA)
  • Multimedia (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Studio Devices (AREA)
  • Lens Barrels (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Cameras In General (AREA)
KR1020097003164A 2006-07-17 2007-07-17 카메라 시스템 및 관련 방법들 KR101185881B1 (ko)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US11/487,580 2006-07-17
US11/487,580 US8049806B2 (en) 2004-09-27 2006-07-17 Thin camera and associated methods
US85536506P 2006-10-31 2006-10-31
US60/855,365 2006-10-31
PCT/US2007/016156 WO2008011003A2 (en) 2006-07-17 2007-07-17 Camera system and associated methods

Publications (2)

Publication Number Publication Date
KR20090034981A KR20090034981A (ko) 2009-04-08
KR101185881B1 true KR101185881B1 (ko) 2012-09-25

Family

ID=38957311

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020097003164A KR101185881B1 (ko) 2006-07-17 2007-07-17 카메라 시스템 및 관련 방법들

Country Status (5)

Country Link
EP (1) EP2044629A4 (de)
JP (2) JP5292291B2 (de)
KR (1) KR101185881B1 (de)
CN (1) CN101512768B (de)
WO (1) WO2008011003A2 (de)

Families Citing this family (46)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080118241A1 (en) * 2006-11-16 2008-05-22 Tekolste Robert Control of stray light in camera systems employing an optics stack and associated methods
WO2008102776A1 (ja) 2007-02-19 2008-08-28 Konica Minolta Opto, Inc. 撮像レンズ、撮像装置、携帯端末、および撮像レンズの製造方法
EP2527898A3 (de) * 2007-02-19 2014-06-25 Konica Minolta Opto, Inc. Abbildungsobjektiv, Abbildungsvorrichtung und mobiles Endgerät
JPWO2008102773A1 (ja) * 2007-02-19 2010-05-27 コニカミノルタオプト株式会社 撮像レンズ、撮像装置、携帯端末、および撮像レンズの製造方法
WO2009004965A1 (ja) * 2007-07-04 2009-01-08 Konica Minolta Opto, Inc. 撮像レンズ及び撮像装置並びに携帯端末
US20110031510A1 (en) * 2007-11-27 2011-02-10 Heptagon Oy Encapsulated lens stack
TW200937642A (en) 2007-12-19 2009-09-01 Heptagon Oy Wafer stack, integrated optical device and method for fabricating the same
US8270098B2 (en) 2008-02-20 2012-09-18 Konica Minolto Opto, Inc. Image pickup lens, image pickup apparatus, mobile terminal, and method for manufacturing image pickup lens
US9118825B2 (en) 2008-02-22 2015-08-25 Nan Chang O-Film Optoelectronics Technology Ltd. Attachment of wafer level optics
JP4420141B2 (ja) * 2008-04-28 2010-02-24 コニカミノルタオプト株式会社 ウエハレンズの製造方法及びウエハレンズ
WO2009137022A1 (en) * 2008-05-06 2009-11-12 Tessera North America, Inc. Camera system including radiation shield and method of shielding radiation
FR2931587B1 (fr) * 2008-05-21 2011-05-13 Commissariat Energie Atomique Procede de realisation d'un dispositif optique a composants optoelectroniques integres
US20090321861A1 (en) * 2008-06-26 2009-12-31 Micron Technology, Inc. Microelectronic imagers with stacked lens assemblies and processes for wafer-level packaging of microelectronic imagers
JP5094802B2 (ja) * 2008-09-26 2012-12-12 シャープ株式会社 光学素子ウエハの製造方法
KR101634353B1 (ko) 2008-12-04 2016-06-28 삼성전자주식회사 마이크로 렌즈, 상기 마이크로 렌즈 제조방법, 상기 마이크로 렌즈 제조 장치, 및 상기 마이크로 렌즈를 구비한카메라 모듈
NL1036360C2 (nl) * 2008-12-23 2010-06-24 Anteryon B V Optische eenheid.
TWM364865U (en) 2009-05-07 2009-09-11 E Pin Optical Industry Co Ltd Miniature stacked glass lens module
KR20100130423A (ko) * 2009-06-03 2010-12-13 삼성전자주식회사 웨이퍼-레벨 렌즈 모듈 및 이를 구비하는 촬상 모듈
KR101648540B1 (ko) 2009-08-13 2016-08-16 삼성전자주식회사 웨이퍼-레벨 렌즈 모듈 및 이를 구비하는 촬상 장치
US9419032B2 (en) 2009-08-14 2016-08-16 Nanchang O-Film Optoelectronics Technology Ltd Wafer level camera module with molded housing and method of manufacturing
TW201109165A (en) 2009-09-11 2011-03-16 E Pin Optical Industry Co Ltd Stacked disk-shaped optical lens array, stacked disk-shaped lens module array and the method of manufacturing thereof
US8305699B2 (en) 2009-09-23 2012-11-06 Samsung Electronics Co., Ltd. Wafer-level lens module with extended depth of field and imaging device including the wafer-level lens module
JP2011085625A (ja) * 2009-10-13 2011-04-28 Toppan Printing Co Ltd カメラモジュール及びその製造方法
JP5556140B2 (ja) * 2009-11-20 2014-07-23 凸版印刷株式会社 カメラモジュール及びその製造方法
KR20130093072A (ko) * 2010-06-14 2013-08-21 헵타곤 마이크로 옵틱스 피티이. 리미티드 복수의 광학 장치를 제조하는 방법
NL2005164C2 (nl) 2010-07-28 2012-01-31 Anteryon Internat B V Optische eenheid.
FR2966936B1 (fr) 2010-11-02 2012-12-07 Commissariat Energie Atomique Systeme optique de formation d'image sur une surface spherique concave
CN102478695B (zh) * 2010-11-25 2016-05-11 鸿富锦精密工业(深圳)有限公司 镜头模组阵列、制造方法及镜头
US9910239B2 (en) * 2010-11-30 2018-03-06 Flir Systems Trading Belgium Bvba Wafer level optical elements and applications thereof
KR101262470B1 (ko) * 2011-01-31 2013-05-08 엘지이노텍 주식회사 렌즈 어셈블리 및 카메라 모듈
NL2006373C2 (nl) 2011-03-11 2012-09-17 Anteryon Internat B V Optische eenheid.
US8345360B2 (en) * 2011-06-03 2013-01-01 Visera Technologies Company Limited Camera unit and macro lens thereof
JPWO2012173252A1 (ja) * 2011-06-17 2015-02-23 コニカミノルタ株式会社 ウェハーレンズの製造方法及びウェハーレンズ、並びにレンズユニットの製造方法及びレンズユニット
JP2013007969A (ja) * 2011-06-27 2013-01-10 Sharp Corp 撮像レンズ、レンズアレイ、撮像レンズの製造方法、および撮像モジュール
US20130122247A1 (en) * 2011-11-10 2013-05-16 Omnivision Technologies, Inc. Spacer Wafer For Wafer-Level Camera And Method For Manufacturing Same
JP5469235B2 (ja) * 2012-12-20 2014-04-16 オリンパス株式会社 レンズモジュールの製造方法
CN106104804B (zh) * 2014-02-18 2019-07-12 赫普塔冈微光有限公司 包括用于焦距调整和/或倾斜减少的可定制间隔物的光学模块
WO2015151697A1 (ja) * 2014-04-04 2015-10-08 シャープ株式会社 レンズ素子、撮像装置、および撮像レンズ
US20160307881A1 (en) * 2015-04-20 2016-10-20 Advanced Semiconductor Engineering, Inc. Optical sensor module and method for manufacturing the same
US9829698B2 (en) 2015-08-31 2017-11-28 Panasonic Corporation Endoscope
JP6744119B2 (ja) * 2016-04-05 2020-08-19 パナソニックi−PROセンシングソリューションズ株式会社 内視鏡
US9778443B2 (en) 2015-10-05 2017-10-03 Omnivision Technologies, Inc. Three-surface wide field-of-view lens system
KR101701060B1 (ko) * 2015-11-03 2017-01-31 삼성전기주식회사 카메라 모듈
US10677964B2 (en) 2017-10-23 2020-06-09 Omnivision Technologies, Inc. Lens wafer assembly and associated method for manufacturing a stepped spacer wafer
WO2019193529A1 (en) * 2018-04-06 2019-10-10 Amo Wavefront Sciences, Llc Methods and systems for corneal topography with in-focus scleral imaging
KR102555577B1 (ko) * 2019-01-28 2023-07-18 삼성전자주식회사 카메라 모듈을 포함하는 전자 장치

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1067779A2 (de) 1999-06-30 2001-01-10 Canon Kabushiki Kaisha Bildaufnahmevorrichtung
US20020122124A1 (en) 2000-10-25 2002-09-05 Yasuo Suda Image sensing apparatus and its control method, control program, and storage medium
EP1244151A2 (de) 2001-03-21 2002-09-25 Canon Kabushiki Kaisha Halbleiterbauelement und Herstellungsverfahren
US20020176148A1 (en) 2000-03-03 2002-11-28 Ichiro Onuki Optical apparatus

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU2001253547A1 (en) * 2000-05-23 2001-12-03 Atmel Corporation Integrated ic chip package for electronic image sensor die
US20040012698A1 (en) * 2001-03-05 2004-01-22 Yasuo Suda Image pickup model and image pickup device
JP4506083B2 (ja) * 2002-03-25 2010-07-21 コニカミノルタホールディングス株式会社 撮像レンズ,これを備える撮像装置、撮像ユニット及び撮像ユニットを備える携帯端末
JP4030048B2 (ja) * 2002-03-28 2008-01-09 シチズン電子株式会社 小型撮像モジュール
JP2004088713A (ja) 2002-06-27 2004-03-18 Olympus Corp 撮像レンズユニットおよび撮像装置
JP4397819B2 (ja) * 2002-09-17 2010-01-13 アンテルヨン、ベスローテン、フェンノートシャップ カメラ・デバイス、ならびに、カメラ・デバイスおよびウェハスケールパッケージの製造方法
JP2005198103A (ja) * 2004-01-08 2005-07-21 Inter Action Corp カメラモジュールの組立装置および組立方法
CN1914555A (zh) * 2004-02-06 2007-02-14 皇家飞利浦电子股份有限公司 照相装置、含照相装置的移动电话、及照相装置的制备方法
KR100652375B1 (ko) 2004-06-29 2006-12-01 삼성전자주식회사 와이어 본딩 패키지를 포함하는 이미지 센서 모듈 구조물및 그 제조방법
US7511262B2 (en) 2004-08-30 2009-03-31 Micron Technology, Inc. Optical device and assembly for use with imaging dies, and wafer-label imager assembly
JP2006080597A (ja) * 2004-09-07 2006-03-23 Canon Inc 撮像モジュール及び撮像モジュールの製造方法
JP2006081043A (ja) * 2004-09-13 2006-03-23 Seiko Precision Inc 固体撮像装置およびこれを備えた電子機器
JP2008035047A (ja) * 2006-07-27 2008-02-14 Matsushita Electric Ind Co Ltd カメラ部品およびカメラと、カメラ部品の製造方法

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1067779A2 (de) 1999-06-30 2001-01-10 Canon Kabushiki Kaisha Bildaufnahmevorrichtung
US20020176148A1 (en) 2000-03-03 2002-11-28 Ichiro Onuki Optical apparatus
US20020122124A1 (en) 2000-10-25 2002-09-05 Yasuo Suda Image sensing apparatus and its control method, control program, and storage medium
EP1244151A2 (de) 2001-03-21 2002-09-25 Canon Kabushiki Kaisha Halbleiterbauelement und Herstellungsverfahren

Also Published As

Publication number Publication date
JP5372280B2 (ja) 2013-12-18
CN101512768A (zh) 2009-08-19
WO2008011003A3 (en) 2008-06-26
EP2044629A2 (de) 2009-04-08
KR20090034981A (ko) 2009-04-08
JP2009544226A (ja) 2009-12-10
EP2044629A4 (de) 2012-08-01
JP2013153537A (ja) 2013-08-08
WO2008011003A2 (en) 2008-01-24
CN101512768B (zh) 2012-11-21
JP5292291B2 (ja) 2013-09-18

Similar Documents

Publication Publication Date Title
KR101185881B1 (ko) 카메라 시스템 및 관련 방법들
US8953087B2 (en) Camera system and associated methods
US8049806B2 (en) Thin camera and associated methods
US11978752B2 (en) Aperture-metasurface and hybrid refractive-metasurface imaging systems
JP6403701B2 (ja) マルチスケール光学システム
US8426789B2 (en) Aspheric lens forming methods
KR101354478B1 (ko) 광학 적층체 및 그 제조방법
CN100403545C (zh) 固体摄像元件及其设计支持方法及摄像装置
CN201383026Y (zh) 层叠型照相机模块及其制造方法、和摄像装置
KR20100106480A (ko) 웨이퍼 스택, 집적 광학 장치 및 이를 제조하기 위한 방법
US20160252734A1 (en) Lens array modules and wafer-level techniques for fabricating the same
TW201232086A (en) Method of manufacturing a plurality of optical devices for cameras
US20060114570A1 (en) Solid-state imaging device and method for manufacturing the same
JP2004080039A (ja) Cmosイメージセンサ構造体及びこれを用いたカメラモジュールを製作する為のプロセス
KR20080094105A (ko) 이미지 센서용 집적 렌즈 시스템 및 그 제조 방법
KR20140045458A (ko) 어레이 카메라와 함께 사용하는 광학 장치
TW201214686A (en) Camera, and method of manufacturing a plurality of cameras
KR101688307B1 (ko) 비평면 광학 인터페이스를 구비한 이면 조사형 이미지 센서
JP2011100056A (ja) レンズモジュール及び撮像ユニット
JP2016025164A (ja) 固体撮像装置及びその製造方法
JPH03175403A (ja) 固体撮像装置
Duparre et al. Micro-optically fabricated artificial apposition compound eye
KR20070117026A (ko) 적층형 카메라 장치 및 제조방법
KR102443126B1 (ko) 광각 복안 카메라 및 광각 복안 카메라의 제조 방법
WO2022220271A1 (ja) マイクロレンズアレイおよびその製造方法

Legal Events

Date Code Title Description
A201 Request for examination
E902 Notification of reason for refusal
E90F Notification of reason for final refusal
E701 Decision to grant or registration of patent right
GRNT Written decision to grant
FPAY Annual fee payment

Payment date: 20150908

Year of fee payment: 4

LAPS Lapse due to unpaid annual fee