KR101116979B1 - 반도체 제조 장치 및 반도체 제조 방법 - Google Patents

반도체 제조 장치 및 반도체 제조 방법 Download PDF

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Publication number
KR101116979B1
KR101116979B1 KR1020057007816A KR20057007816A KR101116979B1 KR 101116979 B1 KR101116979 B1 KR 101116979B1 KR 1020057007816 A KR1020057007816 A KR 1020057007816A KR 20057007816 A KR20057007816 A KR 20057007816A KR 101116979 B1 KR101116979 B1 KR 101116979B1
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KR
South Korea
Prior art keywords
flow rate
mass flow
voltage
flow controller
fluid
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Expired - Fee Related
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KR1020057007816A
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English (en)
Korean (ko)
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KR20060035575A (ko
Inventor
쯔네유끼 오까베
겐고 가네꼬
Original Assignee
도쿄엘렉트론가부시키가이샤
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Publication of KR20060035575A publication Critical patent/KR20060035575A/ko
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    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04—Apparatus for manufacture or treatment
    • H10P72/0402—Apparatus for fluid treatment
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05D—SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
    • G05D7/00—Control of flow
    • G05D7/06—Control of flow characterised by the use of electric means
    • G05D7/0617—Control of flow characterised by the use of electric means specially adapted for fluid materials
    • G05D7/0629—Control of flow characterised by the use of electric means specially adapted for fluid materials characterised by the type of regulator means
    • G05D7/0635—Control of flow characterised by the use of electric means specially adapted for fluid materials characterised by the type of regulator means by action on throttling means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01F—MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUID LEVEL; METERING BY VOLUME
    • G01F1/00—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow
    • G01F1/68—Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow by using thermal effects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01F—MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUID LEVEL; METERING BY VOLUME
    • G01F15/00—Details of, or accessories for, apparatus of groups G01F1/00 - G01F13/00 insofar as such details or appliances are not adapted to particular types of such apparatus
    • G01F15/02—Compensating or correcting for variations in pressure, density or temperature
    • G01F15/022—Compensating or correcting for variations in pressure, density or temperature using electrical means
    • G01F15/024—Compensating or correcting for variations in pressure, density or temperature using electrical means involving digital counting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01F—MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUID LEVEL; METERING BY VOLUME
    • G01F25/00—Testing or calibration of apparatus for measuring volume, volume flow or liquid level or for metering by volume
    • G01F25/10—Testing or calibration of apparatus for measuring volume, volume flow or liquid level or for metering by volume of flowmeters
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/06—Apparatus for monitoring, sorting, marking, testing or measuring
    • H10P72/0604—Process monitoring, e.g. flow or thickness monitoring

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Fluid Mechanics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Flow Control (AREA)
  • Measuring Volume Flow (AREA)
  • Chemical Vapour Deposition (AREA)
  • Semiconductor Integrated Circuits (AREA)
KR1020057007816A 2003-07-16 2004-07-14 반도체 제조 장치 및 반도체 제조 방법 Expired - Fee Related KR101116979B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JPJP-P-2003-00197936 2003-07-16
JP2003197936A JP3872776B2 (ja) 2003-07-16 2003-07-16 半導体製造装置及び半導体製造方法
PCT/JP2004/010033 WO2005008350A1 (ja) 2003-07-16 2004-07-14 半導体製造装置及び半導体製造方法

Publications (2)

Publication Number Publication Date
KR20060035575A KR20060035575A (ko) 2006-04-26
KR101116979B1 true KR101116979B1 (ko) 2012-03-15

Family

ID=34074361

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020057007816A Expired - Fee Related KR101116979B1 (ko) 2003-07-16 2004-07-14 반도체 제조 장치 및 반도체 제조 방법

Country Status (7)

Country Link
US (1) US7510884B2 (https=)
EP (1) EP1653312A4 (https=)
JP (1) JP3872776B2 (https=)
KR (1) KR101116979B1 (https=)
CN (1) CN100462887C (https=)
TW (1) TW200504822A (https=)
WO (1) WO2005008350A1 (https=)

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JP4718274B2 (ja) * 2005-08-25 2011-07-06 東京エレクトロン株式会社 半導体製造装置，半導体製造装置の流量補正方法，プログラム
JP2007214406A (ja) * 2006-02-10 2007-08-23 Hitachi Metals Ltd 流量検定機能付質量流量制御装置を搭載した半導体製造装置
US7869888B2 (en) * 2006-05-31 2011-01-11 Tokyo Electron Limited Information processing apparatus, semiconductor manufacturing system, information processing method, and storage medium
JP5134841B2 (ja) * 2007-03-16 2013-01-30 Ｃｋｄ株式会社 ガス供給ユニット
JP2009004479A (ja) * 2007-06-20 2009-01-08 Panasonic Corp 装置状態監視方法および装置状態監視装置
JP5459895B2 (ja) * 2007-10-15 2014-04-02 Ｃｋｄ株式会社 ガス分流供給ユニット
DE102007062977B4 (de) * 2007-12-21 2018-07-19 Schott Ag Verfahren zur Herstellung von Prozessgasen für die Dampfphasenabscheidung
JP2010169657A (ja) * 2008-12-25 2010-08-05 Horiba Stec Co Ltd 質量流量計及びマスフローコントローラ
JP5558871B2 (ja) * 2010-03-15 2014-07-23 株式会社ダイヘン アーク溶接装置
JP2012033150A (ja) * 2010-06-30 2012-02-16 Toshiba Corp マスフローコントローラ、マスフローコントローラシステム、基板処理装置およびガス流量調整方法
JP6047308B2 (ja) * 2012-05-28 2016-12-21 日精エー・エス・ビー機械株式会社 樹脂容器用コーティング装置
JP2016525345A (ja) * 2013-06-19 2016-08-25 フォンテン ホールディングス ４ ビーブイ 質量空気流量を検知する装置および方法
JP6216601B2 (ja) * 2013-10-09 2017-10-18 旭有機材株式会社 流量制御装置
JP6246606B2 (ja) * 2014-01-31 2017-12-13 株式会社Ｓｃｒｅｅｎホールディングス 基板処理装置
KR20160012302A (ko) * 2014-07-23 2016-02-03 삼성전자주식회사 기판 제조 방법 및 그에 사용되는 기판 제조 장치
KR102628015B1 (ko) * 2017-12-01 2024-01-23 삼성전자주식회사 질량 유량 제어기, 반도체 소자의 제조장치 및 그의 관리방법
KR102066776B1 (ko) * 2017-12-11 2020-01-15 임용일 통합 분석 제어기에 의한 질량 유량 제어기 최적화 통합 시스템
KR102101068B1 (ko) * 2017-12-11 2020-04-14 조북룡 통합 분석기에 의한 질량 유량 최적화 제어 시스템
JP7130524B2 (ja) * 2018-10-26 2022-09-05 東京エレクトロン株式会社 基板処理装置の制御装置および基板処理装置の制御方法
JP7138238B2 (ja) * 2019-03-25 2022-09-15 株式会社Kokusai Electric 基板処理装置、半導体装置の製造方法及びプログラム
JP7270489B2 (ja) * 2019-07-10 2023-05-10 東京エレクトロン株式会社 性能算出方法および処理装置
CN113552909A (zh) * 2020-04-26 2021-10-26 长鑫存储技术有限公司 阀控制系统及阀控制方法
CN115454153A (zh) * 2022-10-26 2022-12-09 北京七星华创流量计有限公司 质量流量控制器及其流量控制方法

Citations (1)

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Publication number Priority date Publication date Assignee Title
US4655089A (en) * 1985-06-07 1987-04-07 Smith Meter Inc. Mass flow meter and signal processing system

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US4335605A (en) * 1980-05-14 1982-06-22 Thermal Instrument Company Mass flow meter
GB2077434B (en) * 1980-05-30 1984-04-26 Millar John Ascertaining flow rate through valves or pumps
US5062446A (en) * 1991-01-07 1991-11-05 Sematech, Inc. Intelligent mass flow controller
EP0547617B1 (en) * 1991-12-18 1996-07-10 Pierre Delajoud Mass flow meter and method
JPH05289751A (ja) 1992-04-15 1993-11-05 Hitachi Metals Ltd マスフローコントローラのゼロ点シフト及びスパンシフトを自動補正する方法及びその自動補正機能付きマスフローコントローラ
WO1993025950A1 (en) 1992-06-12 1993-12-23 Unit Instruments, Inc. Mass flow controller
JP2982003B2 (ja) * 1992-07-28 1999-11-22 コマツ電子金属株式会社 気相成長装置および気相成長装置におけるマスフローコントローラの校正方法
JP2692770B2 (ja) * 1992-09-30 1997-12-17 シーケーディ株式会社 マスフローコントローラ流量検定システム
JPH07263350A (ja) 1994-03-18 1995-10-13 Fujitsu Ltd 半導体製造方法
JP2635929B2 (ja) * 1994-04-12 1997-07-30 シーケーディ株式会社 マスフローコントローラ絶対流量検定システム
US5594180A (en) * 1994-08-12 1997-01-14 Micro Motion, Inc. Method and apparatus for fault detection and correction in Coriolis effect mass flowmeters
JP2802246B2 (ja) * 1995-06-29 1998-09-24 久 高橋 遅れ補償機能付流量制御弁
JP3367811B2 (ja) 1996-01-05 2003-01-20 シーケーディ株式会社 ガス配管系の検定システム
US6185469B1 (en) * 1997-05-28 2001-02-06 Board Of Regents, The University Of Texas System Method and apparatus for testing and controlling a flexible manufacturing system
JP3932389B2 (ja) * 1998-01-19 2007-06-20 Ｓｍｃ株式会社 マスフローコントローラの自己診断方法
JP3684307B2 (ja) * 1998-10-19 2005-08-17 シーケーディ株式会社 ガス供給制御装置
US6339727B1 (en) * 1998-12-21 2002-01-15 Recot, Inc. Apparatus and method for controlling distribution of product in manufacturing process
US6119710A (en) * 1999-05-26 2000-09-19 Cyber Instrument Technologies Llc Method for wide range gas flow system with real time flow measurement and correction
JP3513437B2 (ja) * 1999-09-01 2004-03-31 キヤノン株式会社 基板管理方法及び半導体露光装置
JP2001077267A (ja) * 1999-09-08 2001-03-23 Mitsubishi Electric Corp 半導体製造装置及び半導体装置の製造方法
JP2001197936A (ja) 2000-01-19 2001-07-24 Fuairudo Kk ヘア−スタイリングの改良された方法

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4655089A (en) * 1985-06-07 1987-04-07 Smith Meter Inc. Mass flow meter and signal processing system

Also Published As

Publication number Publication date
TW200504822A (en) 2005-02-01
KR20060035575A (ko) 2006-04-26
US7510884B2 (en) 2009-03-31
EP1653312A4 (en) 2009-05-27
JP2005038058A (ja) 2005-02-10
WO2005008350A1 (ja) 2005-01-27
EP1653312A1 (en) 2006-05-03
CN100462887C (zh) 2009-02-18
JP3872776B2 (ja) 2007-01-24
US20060172442A1 (en) 2006-08-03
CN1751280A (zh) 2006-03-22
TWI305372B (https=) 2009-01-11

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