KR101078078B1 - 자기식 회전각 검출기 - Google Patents
자기식 회전각 검출기 Download PDFInfo
- Publication number
- KR101078078B1 KR101078078B1 KR1020097021745A KR20097021745A KR101078078B1 KR 101078078 B1 KR101078078 B1 KR 101078078B1 KR 1020097021745 A KR1020097021745 A KR 1020097021745A KR 20097021745 A KR20097021745 A KR 20097021745A KR 101078078 B1 KR101078078 B1 KR 101078078B1
- Authority
- KR
- South Korea
- Prior art keywords
- magnetic
- magnetic sensor
- element group
- sensor elements
- rotation angle
- Prior art date
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
- G01D5/244—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing characteristics of pulses or pulse trains; generating pulses or pulse trains
- G01D5/245—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing characteristics of pulses or pulse trains; generating pulses or pulse trains using a variable number of pulses in a train
- G01D5/2451—Incremental encoders
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D1/00—Measuring arrangements giving results other than momentary value of variable, of general application
- G01D1/02—Measuring arrangements giving results other than momentary value of variable, of general application giving mean values, e.g. root means square values
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/45—Differential amplifiers
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Transmission And Conversion Of Sensor Element Output (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPJP-P-2007-111145 | 2007-04-20 | ||
JP2007111145 | 2007-04-20 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20090122299A KR20090122299A (ko) | 2009-11-26 |
KR101078078B1 true KR101078078B1 (ko) | 2011-10-28 |
Family
ID=39875530
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020097021745A KR101078078B1 (ko) | 2007-04-20 | 2008-04-17 | 자기식 회전각 검출기 |
Country Status (7)
Country | Link |
---|---|
US (1) | US8134359B2 (fr) |
JP (1) | JP5064492B2 (fr) |
KR (1) | KR101078078B1 (fr) |
CN (1) | CN101663564B (fr) |
DE (1) | DE112008001024B4 (fr) |
TW (1) | TWI393867B (fr) |
WO (1) | WO2008130002A1 (fr) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101428971B1 (ko) * | 2013-03-21 | 2014-08-13 | 숭실대학교산학협력단 | 변위 측정 장치 |
KR101449873B1 (ko) | 2013-11-29 | 2014-10-13 | 숭실대학교산학협력단 | 변위 측정 장치 |
Families Citing this family (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB0903550D0 (en) * | 2009-03-02 | 2009-04-08 | Rls Merilna Tehnika D O O | Position encoder apparatus |
JP5761181B2 (ja) * | 2010-04-26 | 2015-08-12 | Tdk株式会社 | 位置検出装置 |
EP2413154B1 (fr) * | 2010-07-30 | 2013-04-17 | Nxp B.V. | Capteur magnéto-résistif |
KR101657952B1 (ko) | 2010-11-15 | 2016-09-20 | 주식회사 고영테크놀러지 | 기판 검사방법 |
CN103221790B (zh) * | 2010-11-18 | 2016-02-03 | 三菱电机株式会社 | 旋转角度检测装置 |
JP5215370B2 (ja) * | 2010-11-22 | 2013-06-19 | 三菱電機株式会社 | 磁気式位置検出装置 |
JP5660381B2 (ja) * | 2011-03-09 | 2015-01-28 | 株式会社ジェイテクト | 回転角検出装置 |
JP5798824B2 (ja) * | 2011-07-22 | 2015-10-21 | 株式会社ミツトヨ | 目盛誤差算出装置、目盛誤差校正装置、及び目盛誤差算出方法 |
WO2013024830A1 (fr) * | 2011-08-12 | 2013-02-21 | 日立金属株式会社 | Codeur |
JP5762567B2 (ja) * | 2011-12-20 | 2015-08-12 | 三菱電機株式会社 | 回転角度検出装置 |
GB201204066D0 (en) * | 2012-03-08 | 2012-04-18 | Renishaw Plc | Magnetic encoder apparatus |
JP6064816B2 (ja) * | 2013-07-17 | 2017-01-25 | 株式会社デンソー | 回転センサ |
US9982989B2 (en) * | 2013-07-17 | 2018-05-29 | Infineon Technologies Ag | Angle sensors, systems and methods |
US9574906B2 (en) | 2013-10-28 | 2017-02-21 | Hitachi Metals, Ltd. | Magnetic medium for magnetic encoder, magnetic encoder and method for manufacturing magnetic medium |
CN104698408A (zh) * | 2013-12-10 | 2015-06-10 | 日本电产三协株式会社 | 磁传感器装置及磁性编码器装置 |
JP2015114138A (ja) * | 2013-12-10 | 2015-06-22 | 日本電産サンキョー株式会社 | 磁気センサ装置、磁気式エンコーダ装置、および磁気センサ |
US9733317B2 (en) * | 2014-03-10 | 2017-08-15 | Dmg Mori Seiki Co., Ltd. | Position detecting device |
US10082527B2 (en) * | 2015-06-03 | 2018-09-25 | Texas Instruments Incorporated | Removal of higher order magnetic interference in magnetic field based current sensors |
JP2017058328A (ja) * | 2015-09-18 | 2017-03-23 | 日本電産サンキョー株式会社 | 直動回転検出器 |
JP6656958B2 (ja) * | 2016-03-10 | 2020-03-04 | 日本電産サンキョー株式会社 | ロータリエンコーダ及びロータリエンコーダの角度補正方法 |
JP6430565B2 (ja) | 2016-03-23 | 2018-11-28 | アナログ・デヴァイシズ・グローバル | 磁界検出器 |
JP6555289B2 (ja) * | 2017-03-13 | 2019-08-07 | 株式会社デンソー | 回転センサ |
JP6331177B1 (ja) * | 2017-03-24 | 2018-05-30 | Tdk株式会社 | 角度センサシステム |
US10739165B2 (en) | 2017-07-05 | 2020-08-11 | Analog Devices Global | Magnetic field sensor |
JP7186481B2 (ja) * | 2018-05-18 | 2022-12-09 | 株式会社東海理化電機製作所 | 磁気センサ装置 |
JP2024064226A (ja) * | 2022-10-27 | 2024-05-14 | 株式会社デンソー | 位置検出装置 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001012967A (ja) | 1999-04-28 | 2001-01-19 | Asahi Optical Co Ltd | エンコーダおよび磁気式エンコーダを搭載した測量機 |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
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JPS5690213A (en) | 1979-12-24 | 1981-07-22 | Nec Corp | Position detector |
JPS62192615A (ja) | 1986-02-20 | 1987-08-24 | Nippon Kogaku Kk <Nikon> | 磁気エンコ−ダ用磁気ヘツド |
JPS62247213A (ja) * | 1986-10-20 | 1987-10-28 | Hitachi Ltd | 磁気エンコーダ |
JP2529960B2 (ja) | 1987-03-14 | 1996-09-04 | 株式会社日立製作所 | 磁気的位置検出装置 |
JP3033111B2 (ja) | 1990-03-08 | 2000-04-17 | ソニー株式会社 | 磁気センサ |
JP3308123B2 (ja) * | 1995-01-31 | 2002-07-29 | キヤノン電子株式会社 | 磁気抵抗効果センサ |
JP2001124554A (ja) | 1999-10-22 | 2001-05-11 | Asahi Optical Co Ltd | 磁気式エンコーダを備えた測量機 |
JP3930227B2 (ja) * | 2000-06-14 | 2007-06-13 | ペンタックス株式会社 | 磁気式エンコーダおよび磁気式エンコーダを搭載した測量機 |
CN2630798Y (zh) * | 2003-01-30 | 2004-08-04 | 北京科大天宇微电子材料技术开发有限公司 | 一种巨磁电阻磁编码器 |
JP4487093B2 (ja) | 2004-02-02 | 2010-06-23 | 日本電産サンキョー株式会社 | 磁気センサ |
JP2006145220A (ja) * | 2004-11-16 | 2006-06-08 | Shicoh Eng Co Ltd | 磁気式位置検出装置 |
JP2006226764A (ja) * | 2005-02-16 | 2006-08-31 | Shicoh Eng Co Ltd | 位置検出装置 |
JP2007111145A (ja) | 2005-10-19 | 2007-05-10 | Topcon Corp | 自覚式検眼装置 |
US7860681B1 (en) * | 2007-04-23 | 2010-12-28 | Schaub Stanley R | Dynamic analyzer of a mechanical motion transmission system |
US7840372B2 (en) * | 2007-07-06 | 2010-11-23 | The University Of British Columbia | Self-calibration method and apparatus for on-axis rotary encoders |
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2008
- 2008-04-15 TW TW097113565A patent/TWI393867B/zh active
- 2008-04-17 JP JP2009510855A patent/JP5064492B2/ja active Active
- 2008-04-17 CN CN200880012853XA patent/CN101663564B/zh active Active
- 2008-04-17 DE DE112008001024T patent/DE112008001024B4/de active Active
- 2008-04-17 US US12/596,729 patent/US8134359B2/en active Active
- 2008-04-17 WO PCT/JP2008/057474 patent/WO2008130002A1/fr active Application Filing
- 2008-04-17 KR KR1020097021745A patent/KR101078078B1/ko active IP Right Grant
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001012967A (ja) | 1999-04-28 | 2001-01-19 | Asahi Optical Co Ltd | エンコーダおよび磁気式エンコーダを搭載した測量機 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101428971B1 (ko) * | 2013-03-21 | 2014-08-13 | 숭실대학교산학협력단 | 변위 측정 장치 |
US9194689B2 (en) | 2013-03-21 | 2015-11-24 | Foundation Of Soongsil University-Industry Cooperation | Apparatus for measuring displacement |
KR101449873B1 (ko) | 2013-11-29 | 2014-10-13 | 숭실대학교산학협력단 | 변위 측정 장치 |
Also Published As
Publication number | Publication date |
---|---|
TWI393867B (zh) | 2013-04-21 |
CN101663564B (zh) | 2011-11-30 |
US20100052664A1 (en) | 2010-03-04 |
DE112008001024B4 (de) | 2011-06-09 |
JPWO2008130002A1 (ja) | 2010-07-22 |
DE112008001024T5 (de) | 2010-02-11 |
US8134359B2 (en) | 2012-03-13 |
JP5064492B2 (ja) | 2012-10-31 |
TW200902944A (en) | 2009-01-16 |
KR20090122299A (ko) | 2009-11-26 |
CN101663564A (zh) | 2010-03-03 |
WO2008130002A1 (fr) | 2008-10-30 |
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