KR100966661B1 - 보안 스캔 테스트를 위한 방법 및 장치 - Google Patents

보안 스캔 테스트를 위한 방법 및 장치 Download PDF

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Publication number
KR100966661B1
KR100966661B1 KR1020047017475A KR20047017475A KR100966661B1 KR 100966661 B1 KR100966661 B1 KR 100966661B1 KR 1020047017475 A KR1020047017475 A KR 1020047017475A KR 20047017475 A KR20047017475 A KR 20047017475A KR 100966661 B1 KR100966661 B1 KR 100966661B1
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South Korea
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scan
data
signal
reset
processor
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Expired - Fee Related
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Korean (ko)
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KR20040104678A (ko
Inventor
토머스 트카키크
존 이. 주니어. 스피탈
조나단 루츠
로렌스 케이스
더글라스 하르디
마크 레드만
그레고리 스미드트
스티븐 투게버그
마이클 디. 피츠시몬스
다렐 엘. 카더
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프리스케일 세미컨덕터, 인크.
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
    • G06F21/70—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer
    • G06F21/71—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer to assure secure computing or processing of information
    • G06F21/75—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer to assure secure computing or processing of information by inhibiting the analysis of circuitry or operation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31719—Security aspects, e.g. preventing unauthorised access during test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318516—Test of programmable logic devices [PLDs]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318544—Scanning methods, algorithms and patterns

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Security & Cryptography (AREA)
  • Computer Hardware Design (AREA)
  • Mathematical Physics (AREA)
  • Software Systems (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Storage Device Security (AREA)
KR1020047017475A 2002-04-30 2003-04-14 보안 스캔 테스트를 위한 방법 및 장치 Expired - Fee Related KR100966661B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US10/135,877 2002-04-30
US10/135,877 US7185249B2 (en) 2002-04-30 2002-04-30 Method and apparatus for secure scan testing
PCT/US2003/011399 WO2004051294A1 (en) 2002-04-30 2003-04-14 Method and apparatus for secure scan testing

Publications (2)

Publication Number Publication Date
KR20040104678A KR20040104678A (ko) 2004-12-10
KR100966661B1 true KR100966661B1 (ko) 2010-06-29

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KR1020047017475A Expired - Fee Related KR100966661B1 (ko) 2002-04-30 2003-04-14 보안 스캔 테스트를 위한 방법 및 장치

Country Status (9)

Country Link
US (2) US7185249B2 (https=)
EP (1) EP1499906B1 (https=)
JP (1) JP2006505798A (https=)
KR (1) KR100966661B1 (https=)
CN (1) CN100381834C (https=)
AU (1) AU2003224959A1 (https=)
DE (1) DE60303126T2 (https=)
TW (1) TWI270768B (https=)
WO (1) WO2004051294A1 (https=)

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KR20190083996A (ko) * 2018-01-05 2019-07-15 주식회사 아이씨티케이 홀딩스 테스트 모드에서 데이터 보호 장치 및 방법

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KR100538404B1 (ko) 1997-09-16 2005-12-22 테라다인 인코퍼레이티드 테스팅의 병렬 및 스캔 모드용으로 단일 메모리를사용하는 집적회로용 테스트 시스템

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20190083996A (ko) * 2018-01-05 2019-07-15 주식회사 아이씨티케이 홀딩스 테스트 모드에서 데이터 보호 장치 및 방법
KR102220662B1 (ko) * 2018-01-05 2021-03-17 주식회사 아이씨티케이 홀딩스 테스트 모드에서 데이터 보호 장치 및 방법

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WO2004051294A1 (en) 2004-06-17
KR20040104678A (ko) 2004-12-10
AU2003224959A1 (en) 2004-06-23
JP2006505798A (ja) 2006-02-16
US20030204801A1 (en) 2003-10-30
DE60303126D1 (de) 2006-03-30
EP1499906A1 (en) 2005-01-26
US7185249B2 (en) 2007-02-27
EP1499906B1 (en) 2006-01-04
CN1650183A (zh) 2005-08-03
TWI270768B (en) 2007-01-11
US7725788B2 (en) 2010-05-25

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