FR2888330B1 - Circuit integre comportant un mode de test securise par detection de l'etat d'un signal de commande - Google Patents

Circuit integre comportant un mode de test securise par detection de l'etat d'un signal de commande

Info

Publication number
FR2888330B1
FR2888330B1 FR0507281A FR0507281A FR2888330B1 FR 2888330 B1 FR2888330 B1 FR 2888330B1 FR 0507281 A FR0507281 A FR 0507281A FR 0507281 A FR0507281 A FR 0507281A FR 2888330 B1 FR2888330 B1 FR 2888330B1
Authority
FR
France
Prior art keywords
status
detecting
control signal
integrated circuit
test mode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0507281A
Other languages
English (en)
Other versions
FR2888330A1 (fr
Inventor
David Hely
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SA
Original Assignee
STMicroelectronics SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by STMicroelectronics SA filed Critical STMicroelectronics SA
Priority to FR0507281A priority Critical patent/FR2888330B1/fr
Priority to US11/484,359 priority patent/US7694197B2/en
Priority to US11/484,355 priority patent/US7577886B2/en
Publication of FR2888330A1 publication Critical patent/FR2888330A1/fr
Application granted granted Critical
Publication of FR2888330B1 publication Critical patent/FR2888330B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31719—Security aspects, e.g. preventing unauthorised access during test
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Security & Cryptography (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Logic Circuits (AREA)
FR0507281A 2005-07-08 2005-07-08 Circuit integre comportant un mode de test securise par detection de l'etat d'un signal de commande Expired - Fee Related FR2888330B1 (fr)

Priority Applications (3)

Application Number Priority Date Filing Date Title
FR0507281A FR2888330B1 (fr) 2005-07-08 2005-07-08 Circuit integre comportant un mode de test securise par detection de l'etat d'un signal de commande
US11/484,359 US7694197B2 (en) 2005-07-08 2006-07-10 Integrated circuit comprising a test mode secured by detection of the state of a control signal
US11/484,355 US7577886B2 (en) 2005-07-08 2006-07-10 Method for testing an electronic circuit comprising a test mode secured by the use of a signature, and associated electronic circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0507281A FR2888330B1 (fr) 2005-07-08 2005-07-08 Circuit integre comportant un mode de test securise par detection de l'etat d'un signal de commande

Publications (2)

Publication Number Publication Date
FR2888330A1 FR2888330A1 (fr) 2007-01-12
FR2888330B1 true FR2888330B1 (fr) 2007-10-05

Family

ID=36123107

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0507281A Expired - Fee Related FR2888330B1 (fr) 2005-07-08 2005-07-08 Circuit integre comportant un mode de test securise par detection de l'etat d'un signal de commande

Country Status (1)

Country Link
FR (1) FR2888330B1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2958063B1 (fr) * 2010-03-26 2012-04-20 Thales Sa Dispositif permettant de securiser un bus de type jtag

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1089083A1 (fr) * 1999-09-03 2001-04-04 Sony Corporation CIrcuits à semiconducteurs avec circuits de chemin de balayage
DE10044837C1 (de) * 2000-09-11 2001-09-13 Infineon Technologies Ag Schaltungsanordnung und Verfahren zum Detektieren eines unerwünschten Angriffs auf eine integrierte Schaltung
US7185249B2 (en) * 2002-04-30 2007-02-27 Freescale Semiconductor, Inc. Method and apparatus for secure scan testing

Also Published As

Publication number Publication date
FR2888330A1 (fr) 2007-01-12

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20090331