KR100932562B1 - 집적 회로 및 이의 테스트 방법 - Google Patents

집적 회로 및 이의 테스트 방법 Download PDF

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Publication number
KR100932562B1
KR100932562B1 KR1020020044561A KR20020044561A KR100932562B1 KR 100932562 B1 KR100932562 B1 KR 100932562B1 KR 1020020044561 A KR1020020044561 A KR 1020020044561A KR 20020044561 A KR20020044561 A KR 20020044561A KR 100932562 B1 KR100932562 B1 KR 100932562B1
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South Korea
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test
integrated circuit
signal
processing core
asic
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Expired - Lifetime
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Korean (ko)
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KR20030011650A (ko
Inventor
테일러리챠드디
몬티에르스마크디
바딜리멜빈디
짐머맨게리
마샬존디
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마벨 인터내셔널 테크놀로지 리미티드
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Assigned to 마벨 인터내셔널 리미티드 reassignment 마벨 인터내셔널 리미티드 권리의 전부이전등록 Assignors: 마벨 인터내셔널 테크놀로지 리미티드
Assigned to 캐비엄 인터내셔널 reassignment 캐비엄 인터내셔널 권리의 전부이전등록 Assignors: 마벨 인터내셔널 리미티드
Assigned to 마벨 아시아 피티이 엘티디. reassignment 마벨 아시아 피티이 엘티디. 권리의 전부이전등록 Assignors: 캐비엄 인터내셔널
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/27—Built-in tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B20/00—Signal processing not specific to the method of recording or reproducing; Circuits therefor
    • G11B20/10—Digital recording or reproducing
    • G11B20/18—Error detection or correction; Testing, e.g. of drop-outs
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B20/00—Signal processing not specific to the method of recording or reproducing; Circuits therefor
    • G11B20/10—Digital recording or reproducing
    • G11B20/18—Error detection or correction; Testing, e.g. of drop-outs
    • G11B20/1816—Testing
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Signal Processing (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
KR1020020044561A 2001-07-30 2002-07-29 집적 회로 및 이의 테스트 방법 Expired - Lifetime KR100932562B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/917,972 2001-07-30
US09/917,972 US7418642B2 (en) 2001-07-30 2001-07-30 Built-in-self-test using embedded memory and processor in an application specific integrated circuit

Publications (2)

Publication Number Publication Date
KR20030011650A KR20030011650A (ko) 2003-02-11
KR100932562B1 true KR100932562B1 (ko) 2009-12-17

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Country Status (7)

Country Link
US (6) US7418642B2 (https=)
EP (1) EP1282041B1 (https=)
JP (1) JP2003114260A (https=)
KR (1) KR100932562B1 (https=)
DE (1) DE60212271T2 (https=)
SG (1) SG94870A1 (https=)
TW (1) TWI276107B (https=)

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US7975094B2 (en) 2004-04-15 2011-07-05 Marvell International Technology Ltd. Programmable I/O interface
US8621304B2 (en) * 2004-10-07 2013-12-31 Hewlett-Packard Development Company, L.P. Built-in self-test system and method for an integrated circuit
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US7421361B2 (en) * 2006-03-27 2008-09-02 Dell Products L.P. Automated factory install printer test process
US8286043B2 (en) 2007-02-16 2012-10-09 Freescale Semiconductor, Inc. System, computer program product and method for testing a logic circuit
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CN102332308B (zh) * 2009-11-11 2015-06-03 盛科网络（苏州）有限公司 一种对存储器接口电路进行在线调试的方法
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CN102890970B (zh) * 2011-07-21 2017-04-19 广东新岸线计算机系统芯片有限公司 一种pop封装的soc芯片dram输入/输出测试方法和装置
US9117552B2 (en) * 2012-08-28 2015-08-25 Kingtiger Technology(Canada), Inc. Systems and methods for testing memory
US9024657B2 (en) 2012-10-11 2015-05-05 Easic Corporation Architectural floorplan for a structured ASIC manufactured on a 28 NM CMOS process lithographic node or smaller
US8677306B1 (en) * 2012-10-11 2014-03-18 Easic Corporation Microcontroller controlled or direct mode controlled network-fabric on a structured ASIC
US9384108B2 (en) * 2012-12-04 2016-07-05 International Business Machines Corporation Functional built-in self test for a chip
US20150026528A1 (en) * 2013-07-16 2015-01-22 Manuel A. d'Abreu Controller based memory evaluation
US10126362B2 (en) 2014-12-15 2018-11-13 International Business Machines Corporation Controlling a test run on a device under test without controlling the test equipment testing the device under test
US9417952B2 (en) 2014-12-18 2016-08-16 Freescale Semiconductor, Inc. Direct memory access (DMA) unit with error detection
US9690681B1 (en) * 2015-09-03 2017-06-27 Cadence Design Systems, Inc. Method and system for automatically generating executable system-level tests
CN106646191A (zh) * 2016-11-25 2017-05-10 天津津航计算技术研究所 针对SiP内嵌存储器的功能测试方法
US10490291B1 (en) 2018-04-24 2019-11-26 The United States Of America, As Represented By The Secretary Of The Navy Memory check ASIC for fuzes and safety and arming devices
US10930364B2 (en) 2018-11-16 2021-02-23 International Business Machines Corporation Iterative functional test exerciser reload and execution
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DE102020121109A1 (de) * 2019-09-20 2021-03-25 Samsung Electronics Co., Ltd. Speicher-controller, speichervorrichtungen und betriebsverfahren der speichervorrichtungen
KR102416994B1 (ko) * 2020-10-23 2022-07-05 연세대학교 산학협력단 리던던시 분석 방법 및 리던던시 분석 장치
GB2631975A (en) * 2023-07-20 2025-01-22 Ibm Dynamic cache loading and verification

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Also Published As

Publication number Publication date
JP2003114260A (ja) 2003-04-18
US8566660B2 (en) 2013-10-22
DE60212271T2 (de) 2007-07-19
US20090013229A1 (en) 2009-01-08
US20140068333A1 (en) 2014-03-06
KR20030011650A (ko) 2003-02-11
US8046652B2 (en) 2011-10-25
US20110138241A1 (en) 2011-06-09
US20130080835A1 (en) 2013-03-28
EP1282041A2 (en) 2003-02-05
SG94870A1 (en) 2003-03-18
US20120036396A1 (en) 2012-02-09
US8874983B2 (en) 2014-10-28
EP1282041A3 (en) 2003-10-22
US20030023914A1 (en) 2003-01-30
TWI276107B (en) 2007-03-11
US7418642B2 (en) 2008-08-26
DE60212271D1 (de) 2006-07-27
US8321731B2 (en) 2012-11-27
US7890828B2 (en) 2011-02-15
EP1282041B1 (en) 2006-06-14

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