KR100919391B1 - 스테이지장치 - Google Patents

스테이지장치

Info

Publication number
KR100919391B1
KR100919391B1 KR1020070059427A KR20070059427A KR100919391B1 KR 100919391 B1 KR100919391 B1 KR 100919391B1 KR 1020070059427 A KR1020070059427 A KR 1020070059427A KR 20070059427 A KR20070059427 A KR 20070059427A KR 100919391 B1 KR100919391 B1 KR 100919391B1
Authority
KR
South Korea
Prior art keywords
pair
stage
temporary
guide
supported
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR1020070059427A
Other languages
English (en)
Korean (ko)
Other versions
KR20070120441A (ko
Inventor
마코토 하라다
다츠야 고하라
유지 고바야시
Original Assignee
스미도모쥬기가이고교 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 스미도모쥬기가이고교 가부시키가이샤 filed Critical 스미도모쥬기가이고교 가부시키가이샤
Publication of KR20070120441A publication Critical patent/KR20070120441A/ko
Application granted granted Critical
Publication of KR100919391B1 publication Critical patent/KR100919391B1/ko
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68714Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
    • H01L21/68785Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the mechanical construction of the susceptor, stage or support

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Machine Tool Units (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
KR1020070059427A 2006-06-19 2007-06-18 스테이지장치 Expired - Fee Related KR100919391B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2006169422A JP4402078B2 (ja) 2006-06-19 2006-06-19 ステージ装置
JPJP-P-2006-00169422 2006-06-19

Publications (2)

Publication Number Publication Date
KR20070120441A KR20070120441A (ko) 2007-12-24
KR100919391B1 true KR100919391B1 (ko) 2009-09-29

Family

ID=38931053

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020070059427A Expired - Fee Related KR100919391B1 (ko) 2006-06-19 2007-06-18 스테이지장치

Country Status (4)

Country Link
JP (1) JP4402078B2 (enrdf_load_stackoverflow)
KR (1) KR100919391B1 (enrdf_load_stackoverflow)
CN (1) CN100521143C (enrdf_load_stackoverflow)
TW (1) TW200818217A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20230106381A (ko) * 2022-01-06 2023-07-13 에스케이실트론 주식회사 하정반 마모도 자동 보정 시스템 및 이를 구비한 웨이퍼 래핑 장치

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101339914B (zh) * 2008-08-27 2010-06-16 中国科学院长春光学精密机械与物理研究所 二维电动位移平台
JP4964853B2 (ja) * 2008-09-24 2012-07-04 住友重機械工業株式会社 ステージ装置
KR102482124B1 (ko) * 2016-01-25 2022-12-27 한화정밀기계 주식회사 칩 부품 마운터의 오차 최소화 방법
CN107580413A (zh) * 2016-07-05 2018-01-12 翔庆精密工业有限公司 平台水平自动校正装置
JP6771160B2 (ja) * 2018-08-21 2020-10-21 パナソニックIpマネジメント株式会社 搬送ステージとそれを使用したインクジェット装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003316440A (ja) * 2002-04-24 2003-11-07 Mejiro Precision:Kk ステージ装置
JP2005128783A (ja) * 2003-10-23 2005-05-19 Sumitomo Heavy Ind Ltd ステージ装置
KR20060047978A (ko) * 2004-05-20 2006-05-18 스미도모쥬기가이고교 가부시키가이샤 스테이지장치

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003316440A (ja) * 2002-04-24 2003-11-07 Mejiro Precision:Kk ステージ装置
JP2005128783A (ja) * 2003-10-23 2005-05-19 Sumitomo Heavy Ind Ltd ステージ装置
KR20060047978A (ko) * 2004-05-20 2006-05-18 스미도모쥬기가이고교 가부시키가이샤 스테이지장치

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20230106381A (ko) * 2022-01-06 2023-07-13 에스케이실트론 주식회사 하정반 마모도 자동 보정 시스템 및 이를 구비한 웨이퍼 래핑 장치
KR102704356B1 (ko) * 2022-01-06 2024-09-09 에스케이실트론 주식회사 하정반 마모도 자동 보정 시스템 및 이를 구비한 웨이퍼 래핑 장치
US12285841B2 (en) 2022-01-06 2025-04-29 Sk Siltron Co., Ltd. Automatic abrasion compensation system of lower plate and wafer lapping apparatus having the same

Also Published As

Publication number Publication date
JP4402078B2 (ja) 2010-01-20
CN100521143C (zh) 2009-07-29
TW200818217A (en) 2008-04-16
TWI360133B (enrdf_load_stackoverflow) 2012-03-11
JP2007331087A (ja) 2007-12-27
CN101093813A (zh) 2007-12-26
KR20070120441A (ko) 2007-12-24

Similar Documents

Publication Publication Date Title
KR101087529B1 (ko) 스테이지장치
US9898000B2 (en) Planar positioning system and method of using the same
KR101176781B1 (ko) Xy 스테이지장치, 반도체 검사장치, 및 반도체 노광장치
KR100919391B1 (ko) 스테이지장치
CN102317737B (zh) 坐标测量机(cmm)和补偿坐标测量机中的误差的方法
JP4782710B2 (ja) ステージ装置
US9979262B2 (en) Positioning device in gantry type of construction having a position-measurement device for measuring the position of a carriage relative to a cross-member
JPH06320391A (ja) 工作機械のためのリアルタイム直線偏差測定及び補正装置
JP4130838B2 (ja) ステージ装置
JP3940277B2 (ja) ステージ装置
JP3732763B2 (ja) ステージ装置
JP2002107142A (ja) 歯車測定機
JP4962780B2 (ja) ステージ装置およびその浮上制御方法と、ステージ装置を用いた露光装置
JP5292668B2 (ja) 形状測定装置及び方法
JP2006287098A (ja) 位置決め装置
JP6025905B2 (ja) 三次元座標測定機
CN223154875U (zh) 检测装置及pcb检测设备
JP2002189090A (ja) X−yステージ装置
JP5676045B2 (ja) 三次元座標測定機
JP5677360B2 (ja) 三次元座標測定機
CN119282823A (zh) 滚动直线导轨副导轨型面检测装置和使用方法
JP6478961B2 (ja) 三次元座標測定機
JP2006281426A (ja) 位置決め装置
JP2007218881A (ja) 形状測定装置
JPH10339785A (ja) 摺動体の支持装置

Legal Events

Date Code Title Description
A201 Request for examination
PA0109 Patent application

St.27 status event code: A-0-1-A10-A12-nap-PA0109

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

R18-X000 Changes to party contact information recorded

St.27 status event code: A-3-3-R10-R18-oth-X000

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

St.27 status event code: A-1-2-D10-D22-exm-PE0701

GRNT Written decision to grant
PR0701 Registration of establishment

St.27 status event code: A-2-4-F10-F11-exm-PR0701

PR1002 Payment of registration fee

St.27 status event code: A-2-2-U10-U11-oth-PR1002

Fee payment year number: 1

PG1601 Publication of registration

St.27 status event code: A-4-4-Q10-Q13-nap-PG1601

FPAY Annual fee payment

Payment date: 20120907

Year of fee payment: 4

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 4

FPAY Annual fee payment

Payment date: 20130903

Year of fee payment: 5

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 5

LAPS Lapse due to unpaid annual fee
PC1903 Unpaid annual fee

St.27 status event code: A-4-4-U10-U13-oth-PC1903

Not in force date: 20140923

Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

PC1903 Unpaid annual fee

St.27 status event code: N-4-6-H10-H13-oth-PC1903

Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

Not in force date: 20140923

P22-X000 Classification modified

St.27 status event code: A-4-4-P10-P22-nap-X000

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000