KR100753705B1 - 압전 박막 공진자 및 이를 이용한 필터 - Google Patents
압전 박막 공진자 및 이를 이용한 필터 Download PDFInfo
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- KR100753705B1 KR100753705B1 KR1020050095651A KR20050095651A KR100753705B1 KR 100753705 B1 KR100753705 B1 KR 100753705B1 KR 1020050095651 A KR1020050095651 A KR 1020050095651A KR 20050095651 A KR20050095651 A KR 20050095651A KR 100753705 B1 KR100753705 B1 KR 100753705B1
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- piezoelectric
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- lower electrode
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- 239000010409 thin film Substances 0.000 title claims abstract description 54
- 239000010408 film Substances 0.000 claims abstract description 125
- 239000000758 substrate Substances 0.000 claims abstract description 32
- 230000002093 peripheral effect Effects 0.000 claims abstract description 17
- 238000000034 method Methods 0.000 claims description 13
- 229910052751 metal Inorganic materials 0.000 claims description 5
- 239000002184 metal Substances 0.000 claims description 5
- 230000001788 irregular Effects 0.000 claims description 4
- 239000000463 material Substances 0.000 claims description 4
- 238000000059 patterning Methods 0.000 claims description 3
- 239000002356 single layer Substances 0.000 claims description 3
- 229910052782 aluminium Inorganic materials 0.000 claims description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 9
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 7
- 230000000694 effects Effects 0.000 description 6
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- 230000001965 increasing effect Effects 0.000 description 3
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- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 238000010897 surface acoustic wave method Methods 0.000 description 2
- 239000011800 void material Substances 0.000 description 2
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000002708 enhancing effect Effects 0.000 description 1
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Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/15—Constructional features of resonators consisting of piezoelectric or electrostrictive material
- H03H9/17—Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02007—Details of bulk acoustic wave devices
- H03H9/02086—Means for compensation or elimination of undesirable effects
- H03H9/02149—Means for compensation or elimination of undesirable effects of ageing changes of characteristics, e.g. electro-acousto-migration
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02007—Details of bulk acoustic wave devices
- H03H9/02086—Means for compensation or elimination of undesirable effects
- H03H9/02118—Means for compensation or elimination of undesirable effects of lateral leakage between adjacent resonators
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/125—Driving means, e.g. electrodes, coils
- H03H9/13—Driving means, e.g. electrodes, coils for networks consisting of piezoelectric or electrostrictive materials
- H03H9/132—Driving means, e.g. electrodes, coils for networks consisting of piezoelectric or electrostrictive materials characterized by a particular shape
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/15—Constructional features of resonators consisting of piezoelectric or electrostrictive material
- H03H9/17—Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator
- H03H9/171—Constructional features of resonators consisting of piezoelectric or electrostrictive material having a single resonator implemented with thin-film techniques, i.e. of the film bulk acoustic resonator [FBAR] type
- H03H9/172—Means for mounting on a substrate, i.e. means constituting the material interface confining the waves to a volume
- H03H9/174—Membranes
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H3/00—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
- H03H3/007—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
- H03H3/02—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks
- H03H3/04—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of piezoelectric or electrostrictive resonators or networks for obtaining desired frequency or temperature coefficient
- H03H2003/0414—Resonance frequency
- H03H2003/0421—Modification of the thickness of an element
- H03H2003/0428—Modification of the thickness of an element of an electrode
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- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Piezo-Electric Or Mechanical Vibrators, Or Delay Or Filter Circuits (AREA)
Abstract
Description
Claims (16)
- 기판과,상기 기판 상에 형성된 하부 전극과,상기 하부 전극 및 상기 기판 상에 형성된 압전막과,상기 압전막을 사이에 두고 상기 하부 전극에 대향하는 부분을 갖도록 상기 압전막 상에 형성된 상부 전극을 포함하고,상기 대향하는 부분에서의 상기 압전막의 외주부의 적어도 일부가, 상기 상부 전극과 상기 하부 전극이 대향하여 형성된 영역의 외주부와 대략 일치하며,상기 압전막의 외주부의 25% 이상이, 상기 영역의 외주부와 대략 일치하고 있는 것을 특징으로 하는 압전 박막 공진자.
- 삭제
- 제1항에 있어서,상기 압전막의 외주부의 50% 이상이, 상기 영역의 외주부와 대략 일치하고 있는 것을 특징으로 하는 압전 박막 공진자.
- 제1항 또는 제3항에 있어서,상기 영역은 타원 형상을 갖는 것을 특징으로 하는 압전 박막 공진자.
- 제1항 또는 제3항에 있어서,상기 영역은 불규칙한 다각형이고, 상기 다각형을 형성하는 적어도 2변은 평행이 아닌 것을 특징으로 하는 압전 박막 공진자.
- 기판과,상기 기판 상에 형성된 하부 전극과,상기 하부 전극 및 상기 기판 상에 형성된 압전막과,상기 압전막을 사이에 두고 상기 하부 전극에 대향하는 부분을 갖도록 상기 압전막 상에 형성된 상부 전극을 포함하고,상기 압전막이 푸아송비 1/3 이하의 재료로 형성되며, 상기 상부 전극의 인출부 상에, 상기 대향하는 부분에 근접하여 부가막을 형성한 것을 특징으로 하는 압전 박막 공진자.
- 제6항에 있어서,상기 압전막은 AlN을 주성분으로 하고 있는 것을 특징으로 하는 압전 박막 공진자.
- 제6항 또는 제7항에 있어서,상기 부가막은 금속막인 것을 특징으로 하는 압전 박막 공진자.
- 제6항 또는 제7항에 있어서,상기 부가막은 알루미늄을 주성분으로 하는 단층막 또는 다층막인 것을 특징으로 하는 압전 박막 공진자.
- 제6항 또는 제7항에 있어서,상기 부가막과 상기 대향하는 부분의 외주부의 최단 거리가 상기 대향하는 부분의 두께의 2배 이하인 것을 특징으로 하는 압전 박막 공진자.
- 제6항 또는 제7항에 있어서,상기 부가막과 상기 대향하는 부분의 외주부의 최단 거리가 3㎛ 이하인 것을 특징으로 하는 압전 박막 공진자.
- 제6항 또는 제7항에 있어서,상기 대향하는 부분에서의 상기 압전막의 외주부의 적어도 일부가, 상기 상부 전극과 상기 하부 전극이 대향하여 형성된 영역의 외주부와 대략 일치하는 것을 특징으로 하는 압전 박막 공진자.
- 제1항, 제3항, 제6항, 또는 제7항 중 어느 한 항에 있어서,상기 기판은 상기 영역의 아래에 위치하고, 또한 그 영역보다 폭이 넓은 공극을 갖는 것을 특징으로 하는 압전 박막 공진자.
- 제1항, 제3항, 제6항, 또는 제7항 중 어느 한 항에 있어서,상기 압전막의 외주부는 패터닝으로 형성된 엣지를 포함하는 것을 특징으로 하는 압전 박막 공진자.
- 제1항, 제3항, 제6항, 또는 제7항 중 어느 한 항에 있어서,상기 영역은 두께 종진동 모드의 공진자를 형성하고 있는 것을 특징으로 하는 압전 박막 공진자.
- 제1항, 제3항, 제6항, 또는 제7항 중 어느 한 항의 압전 박막 공진자를 적어도 하나 포함하는 필터.
Applications Claiming Priority (2)
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JPJP-P-2004-00313727 | 2004-10-28 | ||
JP2004313727A JP4535841B2 (ja) | 2004-10-28 | 2004-10-28 | 圧電薄膜共振子及びこれを用いたフィルタ |
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KR20060052188A KR20060052188A (ko) | 2006-05-19 |
KR100753705B1 true KR100753705B1 (ko) | 2007-08-30 |
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KR1020050095651A KR100753705B1 (ko) | 2004-10-28 | 2005-10-11 | 압전 박막 공진자 및 이를 이용한 필터 |
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US (1) | US7884527B2 (ko) |
EP (2) | EP1653612A3 (ko) |
JP (1) | JP4535841B2 (ko) |
KR (1) | KR100753705B1 (ko) |
CN (1) | CN100505531C (ko) |
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JP4128836B2 (ja) * | 2002-09-27 | 2008-07-30 | Tdk株式会社 | 薄膜圧電共振子、それを用いたフィルタ及びデュプレクサ |
JP2005033379A (ja) * | 2003-07-09 | 2005-02-03 | Tdk Corp | 薄膜バルク波振動子およびその製造方法 |
JP2005094735A (ja) * | 2003-08-12 | 2005-04-07 | Murata Mfg Co Ltd | 電子部品およびその製造方法 |
US7242270B2 (en) * | 2003-10-30 | 2007-07-10 | Avago Technologies Wireless Ip (Singapore) Pte. Ltd. | Decoupled stacked bulk acoustic resonator-based band-pass filter |
EP1533896B1 (en) * | 2003-11-20 | 2011-11-02 | Panasonic Corporation | Piezoelectric element, composite piezoelectric element, and filter, duplexer and communication equipment using the same |
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2004
- 2004-10-28 JP JP2004313727A patent/JP4535841B2/ja active Active
-
2005
- 2005-10-11 KR KR1020050095651A patent/KR100753705B1/ko active IP Right Grant
- 2005-10-26 EP EP05256649A patent/EP1653612A3/en not_active Ceased
- 2005-10-26 EP EP10170336A patent/EP2259425A1/en not_active Ceased
- 2005-10-27 US US11/259,347 patent/US7884527B2/en active Active
- 2005-10-28 CN CNB2005101170072A patent/CN100505531C/zh active Active
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JPH0964675A (ja) * | 1995-08-17 | 1997-03-07 | Motorola Inc | 密閉空洞上の圧電共振器および製造方法 |
JP2000165187A (ja) | 1998-11-30 | 2000-06-16 | Kyocera Corp | 圧電共振子 |
JP2002372974A (ja) | 2001-06-15 | 2002-12-26 | Ube Electronics Ltd | 薄膜音響共振器及びその製造方法 |
Also Published As
Publication number | Publication date |
---|---|
EP1653612A2 (en) | 2006-05-03 |
JP4535841B2 (ja) | 2010-09-01 |
US7884527B2 (en) | 2011-02-08 |
CN1767380A (zh) | 2006-05-03 |
EP1653612A3 (en) | 2007-06-27 |
KR20060052188A (ko) | 2006-05-19 |
CN100505531C (zh) | 2009-06-24 |
US20060091764A1 (en) | 2006-05-04 |
JP2006128993A (ja) | 2006-05-18 |
EP2259425A1 (en) | 2010-12-08 |
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