KR100593291B1 - 플라즈마 처리장치 및 방법 - Google Patents
플라즈마 처리장치 및 방법 Download PDFInfo
- Publication number
- KR100593291B1 KR100593291B1 KR1020030086759A KR20030086759A KR100593291B1 KR 100593291 B1 KR100593291 B1 KR 100593291B1 KR 1020030086759 A KR1020030086759 A KR 1020030086759A KR 20030086759 A KR20030086759 A KR 20030086759A KR 100593291 B1 KR100593291 B1 KR 100593291B1
- Authority
- KR
- South Korea
- Prior art keywords
- dielectric
- plasma processing
- cooling medium
- temperature
- cooling
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32458—Vessel
- H01J37/32522—Temperature
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32192—Microwave generated discharge
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Drying Of Semiconductors (AREA)
- Plasma Technology (AREA)
- Chemical Vapour Deposition (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPJP-P-2002-00351756 | 2002-12-03 | ||
| JP2002351756A JP4136630B2 (ja) | 2002-12-03 | 2002-12-03 | プラズマ処理装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20040048838A KR20040048838A (ko) | 2004-06-10 |
| KR100593291B1 true KR100593291B1 (ko) | 2006-06-26 |
Family
ID=32588081
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020030086759A Expired - Fee Related KR100593291B1 (ko) | 2002-12-03 | 2003-12-02 | 플라즈마 처리장치 및 방법 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US7140321B2 (enExample) |
| JP (1) | JP4136630B2 (enExample) |
| KR (1) | KR100593291B1 (enExample) |
Families Citing this family (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4612786B2 (ja) * | 2003-03-03 | 2011-01-12 | キヤノン株式会社 | 有機電界効果型トランジスタの製造方法 |
| US7265377B2 (en) * | 2003-04-01 | 2007-09-04 | Canon Kabushiki Kaisha | Organic semiconductor device |
| JP2005079204A (ja) * | 2003-08-28 | 2005-03-24 | Canon Inc | 電界効果型トランジスタおよびその製造方法 |
| JP4401826B2 (ja) * | 2004-03-10 | 2010-01-20 | キヤノン株式会社 | 電界効果型トランジスタおよびその製造方法 |
| JP4557755B2 (ja) * | 2004-03-11 | 2010-10-06 | キヤノン株式会社 | 基板、導電性基板および有機電界効果型トランジスタの各々の製造方法 |
| JP4401836B2 (ja) * | 2004-03-24 | 2010-01-20 | キヤノン株式会社 | 電界効果型トランジスタおよびその製造方法 |
| JP4731840B2 (ja) * | 2004-06-14 | 2011-07-27 | キヤノン株式会社 | 電界効果型トランジスタおよびその製造方法 |
| US7511296B2 (en) | 2005-03-25 | 2009-03-31 | Canon Kabushiki Kaisha | Organic semiconductor device, field-effect transistor, and their manufacturing methods |
| JP2006294422A (ja) * | 2005-04-11 | 2006-10-26 | Tokyo Electron Ltd | プラズマ処理装置およびスロットアンテナおよびプラズマ処理方法 |
| US7695999B2 (en) * | 2005-09-06 | 2010-04-13 | Canon Kabushiki Kaisha | Production method of semiconductor device |
| US7435989B2 (en) * | 2005-09-06 | 2008-10-14 | Canon Kabushiki Kaisha | Semiconductor device with layer containing polysiloxane compound |
| JP2008071500A (ja) * | 2006-09-12 | 2008-03-27 | Noritsu Koki Co Ltd | プラズマ発生装置およびそれを用いるワーク処理装置 |
| KR101119627B1 (ko) * | 2007-03-29 | 2012-03-07 | 도쿄엘렉트론가부시키가이샤 | 플라즈마 처리 장치 |
| KR100856552B1 (ko) * | 2007-06-21 | 2008-09-04 | (주)아이씨디 | 플라즈마 처리 장치 |
| JP4793662B2 (ja) * | 2008-03-28 | 2011-10-12 | 独立行政法人産業技術総合研究所 | マイクロ波プラズマ処理装置 |
| US9390941B2 (en) | 2009-11-17 | 2016-07-12 | Hitachi High-Technologies Corporation | Sample processing apparatus, sample processing system, and method for processing sample |
| US9530656B2 (en) | 2011-10-07 | 2016-12-27 | Lam Research Corporation | Temperature control in RF chamber with heater and air amplifier |
| US9978565B2 (en) * | 2011-10-07 | 2018-05-22 | Lam Research Corporation | Systems for cooling RF heated chamber components |
| JP6014661B2 (ja) * | 2012-05-25 | 2016-10-25 | 東京エレクトロン株式会社 | プラズマ処理装置、及びプラズマ処理方法 |
| US9048190B2 (en) * | 2012-10-09 | 2015-06-02 | Applied Materials, Inc. | Methods and apparatus for processing substrates using an ion shield |
| TWI623960B (zh) * | 2013-03-27 | 2018-05-11 | 蘭姆研究公司 | 半導體製造設備及其處理方法 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02302507A (ja) * | 1989-05-16 | 1990-12-14 | Matsushita Electric Ind Co Ltd | 高周波焼却装置 |
| JPH08274067A (ja) | 1995-03-30 | 1996-10-18 | Hitachi Ltd | プラズマ発生装置 |
| US6059922A (en) | 1996-11-08 | 2000-05-09 | Kabushiki Kaisha Toshiba | Plasma processing apparatus and a plasma processing method |
| JPH10340892A (ja) | 1997-06-06 | 1998-12-22 | Sumitomo Metal Ind Ltd | プラズマ処理装置 |
| JP4053173B2 (ja) * | 1999-03-29 | 2008-02-27 | 東京エレクトロン株式会社 | マイクロ波プラズマ処理装置及び方法 |
| JP2002134417A (ja) * | 2000-10-23 | 2002-05-10 | Tokyo Electron Ltd | プラズマ処理装置 |
| JP3890258B2 (ja) * | 2001-05-28 | 2007-03-07 | キヤノン株式会社 | 電子源の製造方法、および、電子源の製造装置 |
-
2002
- 2002-12-03 JP JP2002351756A patent/JP4136630B2/ja not_active Expired - Fee Related
-
2003
- 2003-12-02 KR KR1020030086759A patent/KR100593291B1/ko not_active Expired - Fee Related
- 2003-12-03 US US10/725,403 patent/US7140321B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| KR20040048838A (ko) | 2004-06-10 |
| US7140321B2 (en) | 2006-11-28 |
| JP2004186440A (ja) | 2004-07-02 |
| US20040118520A1 (en) | 2004-06-24 |
| JP4136630B2 (ja) | 2008-08-20 |
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