KR100538718B1 - 반도체기억장치 - Google Patents
반도체기억장치 Download PDFInfo
- Publication number
- KR100538718B1 KR100538718B1 KR1019960072359A KR19960072359A KR100538718B1 KR 100538718 B1 KR100538718 B1 KR 100538718B1 KR 1019960072359 A KR1019960072359 A KR 1019960072359A KR 19960072359 A KR19960072359 A KR 19960072359A KR 100538718 B1 KR100538718 B1 KR 100538718B1
- Authority
- KR
- South Korea
- Prior art keywords
- potential
- information
- voltage
- power supply
- external power
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1015—Read-write modes for single port memories, i.e. having either a random port or a serial port
- G11C7/1045—Read-write mode select circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/22—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using ferroelectric elements
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Dram (AREA)
- Semiconductor Memories (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP95-340366 | 1995-12-27 | ||
| JP34036695A JP3622304B2 (ja) | 1995-12-27 | 1995-12-27 | 半導体記憶装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR970051144A KR970051144A (ko) | 1997-07-29 |
| KR100538718B1 true KR100538718B1 (ko) | 2006-04-28 |
Family
ID=18336262
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019960072359A Expired - Fee Related KR100538718B1 (ko) | 1995-12-27 | 1996-12-26 | 반도체기억장치 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US5910911A (enExample) |
| JP (1) | JP3622304B2 (enExample) |
| KR (1) | KR100538718B1 (enExample) |
| TW (1) | TW316980B (enExample) |
Families Citing this family (27)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11273362A (ja) * | 1998-03-18 | 1999-10-08 | Sharp Corp | 不揮発性半導体記憶装置 |
| KR100268947B1 (ko) * | 1998-04-03 | 2000-10-16 | 김영환 | 비휘발성 강유전체 메모리 및 그의 제어회로 |
| JP4490514B2 (ja) * | 1998-10-08 | 2010-06-30 | 株式会社東芝 | 強誘電体メモリ |
| JP3169920B2 (ja) * | 1998-12-22 | 2001-05-28 | 日本電気アイシーマイコンシステム株式会社 | 半導体記憶装置、その装置製造方法 |
| JP2000187990A (ja) | 1998-12-24 | 2000-07-04 | Nec Corp | センスアンプ回路及びそれを用いた記憶装置並びにそれに用いる読出し方法 |
| JP2001076493A (ja) * | 1999-09-03 | 2001-03-23 | Nec Corp | 強誘電体記憶装置 |
| JP2001093286A (ja) * | 1999-09-21 | 2001-04-06 | Nec Corp | 強誘電体記憶装置及びその製造方法 |
| JP2001319471A (ja) * | 2000-05-09 | 2001-11-16 | Fujitsu Ltd | 強誘電体メモリ |
| US6720596B2 (en) * | 2000-10-17 | 2004-04-13 | Matsushita Electric Industrial Co., Ltd. | Semiconductor device and method for driving the same |
| US6430093B1 (en) | 2001-05-24 | 2002-08-06 | Ramtron International Corporation | CMOS boosting circuit utilizing ferroelectric capacitors |
| US6535446B2 (en) | 2001-05-24 | 2003-03-18 | Ramtron International Corporation | Two stage low voltage ferroelectric boost circuit |
| KR100399437B1 (ko) | 2001-06-29 | 2003-09-29 | 주식회사 하이닉스반도체 | 내부 전원전압 발생장치 |
| JP4146628B2 (ja) | 2001-08-23 | 2008-09-10 | 松下電器産業株式会社 | メモリシステム及び半導体集積回路 |
| KR100402243B1 (ko) * | 2001-09-24 | 2003-10-17 | 주식회사 하이닉스반도체 | 개선된 주변회로를 갖는 반도체 기억장치 |
| JP2004139655A (ja) * | 2002-10-17 | 2004-05-13 | Matsushita Electric Ind Co Ltd | 半導体記憶装置及びそれが搭載された電子装置 |
| US7337282B2 (en) * | 2003-11-28 | 2008-02-26 | Infineon Technologies Ag | Memory system and process for controlling a memory component to achieve different kinds of memory characteristics on one and the same memory component |
| KR100560301B1 (ko) * | 2003-12-30 | 2006-03-10 | 주식회사 하이닉스반도체 | 트랩 가능한 부도체를 사용하는 불휘발성 디램의 구동회로 및 방법 |
| DE102005045312A1 (de) * | 2004-10-29 | 2006-05-04 | Infineon Technologies Ag | Halbleiterspeicher mit flüchtigen und nichtflüchtigen Speicherzellen |
| JP4103010B2 (ja) * | 2005-04-01 | 2008-06-18 | セイコーエプソン株式会社 | 半導体ウエハ |
| JP2007073141A (ja) * | 2005-09-07 | 2007-03-22 | Matsushita Electric Ind Co Ltd | 強誘電体メモリ装置 |
| JP5451011B2 (ja) * | 2008-08-29 | 2014-03-26 | ピーエスフォー ルクスコ エスエイアールエル | 半導体記憶装置及び情報処理システム |
| ITTO20120682A1 (it) * | 2012-07-31 | 2014-02-01 | St Microelectronics Pvt Ltd | Dispositivo di memoria non volatile con celle raggruppate |
| US9368182B2 (en) * | 2013-12-09 | 2016-06-14 | Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung E.V. | Memory cell |
| US10056140B2 (en) * | 2014-01-30 | 2018-08-21 | Hewlett Packard Enterprise Development Lp | Memristor memory with volatile and non-volatile states |
| US10153020B1 (en) * | 2017-06-09 | 2018-12-11 | Micron Technology, Inc. | Dual mode ferroelectric memory cell operation |
| US10867675B2 (en) * | 2017-07-13 | 2020-12-15 | Micron Technology, Inc. | Apparatuses and methods for memory including ferroelectric memory cells and dielectric memory cells |
| WO2019130144A1 (ja) * | 2017-12-27 | 2019-07-04 | 株式会社半導体エネルギー研究所 | 記憶装置 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07182872A (ja) * | 1993-12-22 | 1995-07-21 | Hitachi Ltd | 半導体メモリ |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5737260A (en) * | 1996-03-27 | 1998-04-07 | Sharp Kabushiki Kaisha | Dual mode ferroelectric memory reference scheme |
-
1995
- 1995-12-27 JP JP34036695A patent/JP3622304B2/ja not_active Expired - Fee Related
-
1996
- 1996-10-30 TW TW085113527A patent/TW316980B/zh not_active IP Right Cessation
- 1996-12-26 KR KR1019960072359A patent/KR100538718B1/ko not_active Expired - Fee Related
- 1996-12-27 US US08/774,907 patent/US5910911A/en not_active Expired - Lifetime
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH07182872A (ja) * | 1993-12-22 | 1995-07-21 | Hitachi Ltd | 半導体メモリ |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH09180466A (ja) | 1997-07-11 |
| JP3622304B2 (ja) | 2005-02-23 |
| US5910911A (en) | 1999-06-08 |
| KR970051144A (ko) | 1997-07-29 |
| TW316980B (enExample) | 1997-10-01 |
Similar Documents
| Publication | Publication Date | Title |
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| KR100538718B1 (ko) | 반도체기억장치 | |
| EP1058268B1 (en) | Ferroelectric memory and semiconductor memory | |
| JP3278981B2 (ja) | 半導体メモリ | |
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| JP3590115B2 (ja) | 半導体メモリ | |
| CN115171750B (zh) | 存储器及其访问方法、电子设备 | |
| US6859380B2 (en) | Ferroelectric memory and method of operating same | |
| KR100404228B1 (ko) | 불휘발성 강유전체 메모리 장치의 레퍼런스 전압발생 회로 | |
| JP7683883B2 (ja) | 持続的保持アーキテクチャ及びクリーンアップ回路を備えたdramメモリ | |
| US6438020B1 (en) | Ferroelectric memory device having an internal supply voltage, which is lower than the external supply voltage, supplied to the memory cells | |
| US7251153B2 (en) | Memory | |
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| JP4284614B2 (ja) | 強誘電体メモリ装置 | |
| KR20220112694A (ko) | 긴 보존 기간을 갖는 다이나믹 메모리 | |
| JP2828530B2 (ja) | 不揮発性記憶装置 | |
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| KR19990021587A (ko) | 강유전체 메모리 소자 및 그 구동 방법 |
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|---|---|---|---|
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