KR100448448B1 - X선 센서용 스위칭소자 및 그 제조방법 - Google Patents
X선 센서용 스위칭소자 및 그 제조방법 Download PDFInfo
- Publication number
- KR100448448B1 KR100448448B1 KR10-2001-0042124A KR20010042124A KR100448448B1 KR 100448448 B1 KR100448448 B1 KR 100448448B1 KR 20010042124 A KR20010042124 A KR 20010042124A KR 100448448 B1 KR100448448 B1 KR 100448448B1
- Authority
- KR
- South Korea
- Prior art keywords
- insulating film
- tft
- protective insulating
- pixel electrode
- electrode
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims description 14
- 230000001681 protective effect Effects 0.000 claims abstract description 65
- 239000003990 capacitor Substances 0.000 claims abstract description 21
- 238000004519 manufacturing process Methods 0.000 claims abstract description 13
- 239000000758 substrate Substances 0.000 claims abstract description 12
- 230000000149 penetrating effect Effects 0.000 claims description 4
- 238000000059 patterning Methods 0.000 claims description 3
- 230000015572 biosynthetic process Effects 0.000 claims 4
- 230000005684 electric field Effects 0.000 abstract description 4
- 238000003384 imaging method Methods 0.000 abstract description 4
- 229910004205 SiNX Inorganic materials 0.000 description 6
- 229910004298 SiO 2 Inorganic materials 0.000 description 6
- 239000004065 semiconductor Substances 0.000 description 5
- 229910052814 silicon oxide Inorganic materials 0.000 description 5
- 230000005540 biological transmission Effects 0.000 description 3
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 229910052711 selenium Inorganic materials 0.000 description 2
- 239000011669 selenium Substances 0.000 description 2
- 238000009825 accumulation Methods 0.000 description 1
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 229910010272 inorganic material Inorganic materials 0.000 description 1
- 239000011147 inorganic material Substances 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03B—APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
- G03B42/00—Obtaining records using waves other than optical waves; Visualisation of such records by using optical means
- G03B42/02—Obtaining records using waves other than optical waves; Visualisation of such records by using optical means using X-rays
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/124—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or layout of the wiring layers specially adapted to the circuit arrangement, e.g. scanning lines in LCD pixel circuits
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Nonlinear Science (AREA)
- Mathematical Physics (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Thin Film Transistor (AREA)
Abstract
Description
Claims (8)
- 투명기판(101) 위에 구성되는 TFT(112)와, 상기 TFT를 포함하여 덮는 제1보호절연막(108)과, 상기 제1보호절연막 위에 접지배선(102)과 연결되고 그 일부가 적어도 상기 TFT 영역을 차폐하도록 구성되는 용량전극(109a,109c)과, 상기 제1보호절연막 위에 형성된 상기 용량전극을 덮도록 구성되는 제2보호절연막(115)과, 상기 제2보호절연막 위에 상기 TFT의 한 단자(106b)와 연결되도록 구성되는 화소전극(107)을 구비하되, 상기 화소전극은 상기 용량전극 형성 영역과 TFT 형성 영역을 포함하여 덮도록 구성되는 것을 특징으로 하는 X선 센서용 스위칭소자.
- 제1항에 있어서,상기 접지배선(102)은 상기 제1보호절연막(108)의 하부에 구성되고 상기 제1보호절연막을 관통하는 콘택홀에 의하여 연결되도록 구성되는 것을 특징으로 하는 X선 센서용 스위칭소자.
- 제1항에 있어서,상기 화소전극(107)은 상기 제1보호절연막(108) 및 제2보호절연막(115)을 관통하는 콘택홀을 통하여 상기 TFT의 한 단자(106b)와 연결되도록 구성되는 것을 특징으로 하는 X선 센서용 스위칭소자.
- 제1항에 있어서,상기 제1보호절연막(108) 및 제2보호절연막(115)은 무기절연막으로 구성되는 것을 특징으로 하는 X선 센서용 스위칭소자.
- 투명기판(101) 위에 TFT(112) 및 접지배선(102)을 형성하는 단계,상기 TFT 및 접지배선을 포함하여 덮는 제1보호절연막(108)을 형성하는 단계, 적어도 상기 접지배선부 위에 제1콘택홀을 형성하고 상기 접지배선과 연결되는 용량전극(109a,109c)을 상기 제1보호절연막 위에 패터닝하여 형성하는 단계,상기 용량전극이 패터닝되어 형성된 제1보호절연막 위에 제2보호절연막(115)을 형성하는 단계,상기 TFT의 한 단자부 위에 제2콘택홀을 형성하고 상기 TFT의 한 단자와 연결되는 화소전극(107)을 상기 용량전극의 형성 영역과 TFT 형성 영역을 포함하여 덮도록 상기 제2보호절연막 위에 형성하는 단계를 포함하는 것을 특징으로 하는 X선 센서용 스위칭소자 제조방법.
- 제5항에 있어서,상기 제1콘택홀 형성 시에 상기 TFT의 한 단자의 일부가 동시에 노출되도록 콘택홀이 형성되고 상기 콘택홀과 상기 제2콘택홀을 통하여 상기 화소전극과 상기TFT의 한 단자가 접촉되도록 하는 것을 특징으로 하는 X선 센서용 스위칭소자 제조방법.
- 제5항에 있어서,상기 용량전극의 일부(109a)는 상기 TFT(112) 영역을 차폐하도록 구성되는 것을 특징으로 하는 X선 센서용 스위칭소자 제조방법.
- 제5항에 있어서,상기 제1보호절연막(108) 및 제2보호절연막(115)은 무기절연막으로 구성되는 것을 특징으로 하는 X선 센서용 스위칭소자 제조방법.
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2001-0042124A KR100448448B1 (ko) | 2001-07-12 | 2001-07-12 | X선 센서용 스위칭소자 및 그 제조방법 |
US09/988,359 US6806472B2 (en) | 2001-07-12 | 2001-11-19 | Switching device of an X-ray sensor and method for manufacturing the same |
FR0210136A FR2843488B1 (fr) | 2001-07-12 | 2002-08-09 | Dispositif de commutation pour un capteur a rayons x |
DE10237149A DE10237149B4 (de) | 2001-07-12 | 2002-08-13 | Schalt-Vorrichtung eines Röntgenstrahl-Sensors und Verfahren zum Herstellen derselben |
JP2002243882A JP3845605B2 (ja) | 2001-07-12 | 2002-08-23 | X線センサー用スイッチング素子およびその製造方法 |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2001-0042124A KR100448448B1 (ko) | 2001-07-12 | 2001-07-12 | X선 센서용 스위칭소자 및 그 제조방법 |
FR0210136A FR2843488B1 (fr) | 2001-07-12 | 2002-08-09 | Dispositif de commutation pour un capteur a rayons x |
DE10237149A DE10237149B4 (de) | 2001-07-12 | 2002-08-13 | Schalt-Vorrichtung eines Röntgenstrahl-Sensors und Verfahren zum Herstellen derselben |
JP2002243882A JP3845605B2 (ja) | 2001-07-12 | 2002-08-23 | X線センサー用スイッチング素子およびその製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20030006408A KR20030006408A (ko) | 2003-01-23 |
KR100448448B1 true KR100448448B1 (ko) | 2004-09-13 |
Family
ID=32854350
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR10-2001-0042124A KR100448448B1 (ko) | 2001-07-12 | 2001-07-12 | X선 센서용 스위칭소자 및 그 제조방법 |
Country Status (5)
Country | Link |
---|---|
US (1) | US6806472B2 (ko) |
JP (1) | JP3845605B2 (ko) |
KR (1) | KR100448448B1 (ko) |
DE (1) | DE10237149B4 (ko) |
FR (1) | FR2843488B1 (ko) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9190524B2 (en) | 2010-09-09 | 2015-11-17 | Sharp Kabushiki Kaisha | Thin film transistor substrate, method for producing the same, and display device |
Families Citing this family (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4456806B2 (ja) * | 2002-03-19 | 2010-04-28 | セイコーエプソン株式会社 | 液晶表示装置、電気光学装置とその製造方法、電子機器 |
JP4323827B2 (ja) * | 2003-02-14 | 2009-09-02 | キヤノン株式会社 | 固体撮像装置及び放射線撮像装置 |
KR100701087B1 (ko) * | 2004-02-27 | 2007-03-29 | 비오이 하이디스 테크놀로지 주식회사 | 엑스-레이 검출기 |
US7242956B2 (en) | 2004-12-20 | 2007-07-10 | Motorola, Inc. | Rapid channel quality based power control for high speed channels |
KR100722094B1 (ko) | 2005-07-14 | 2007-05-25 | 삼성에스디아이 주식회사 | 반도체 장치 및 유기 발광 표시장치 |
US7524711B2 (en) * | 2005-10-20 | 2009-04-28 | Hannstar Display Corp. | Method of manufacturing an image TFT array for an indirect X-ray sensor and structure thereof |
JP5280671B2 (ja) * | 2006-12-20 | 2013-09-04 | 富士フイルム株式会社 | 画像検出器および放射線検出システム |
US7638772B2 (en) * | 2007-02-28 | 2009-12-29 | Canon Kabushiki Kaisha | Imaging apparatus and radiation imaging system |
KR101218089B1 (ko) * | 2007-12-07 | 2013-01-18 | 엘지디스플레이 주식회사 | 디지털 엑스레이 디텍터 및 그 제조방법 |
US8791419B2 (en) | 2010-12-15 | 2014-07-29 | Carestream Health, Inc. | High charge capacity pixel architecture, photoelectric conversion apparatus, radiation image pickup system and methods for same |
JP5978625B2 (ja) * | 2011-06-07 | 2016-08-24 | ソニー株式会社 | 放射線撮像装置、放射線撮像表示システムおよびトランジスタ |
KR102009801B1 (ko) * | 2012-11-27 | 2019-08-12 | 엘지디스플레이 주식회사 | 디지털 엑스레이 검출기용 박막트랜지스터 어레이 기판 |
JP6126470B2 (ja) * | 2013-06-12 | 2017-05-10 | ソニーセミコンダクタソリューションズ株式会社 | 放射線撮像装置および放射線撮像表示システム |
JP6125017B2 (ja) * | 2013-08-07 | 2017-05-10 | シャープ株式会社 | X線イメージセンサー用基板 |
CN106663685A (zh) | 2014-06-06 | 2017-05-10 | 夏普株式会社 | 半导体装置及其制造方法 |
CN104979367B (zh) * | 2015-06-17 | 2019-01-25 | 京东方科技集团股份有限公司 | 探测器背板及其制作方法、x射线平板探测器、摄像系统 |
CN105575961B (zh) * | 2016-03-18 | 2019-10-11 | 京东方科技集团股份有限公司 | 显示基板及其制造方法、显示装置 |
CN105720063B (zh) | 2016-04-13 | 2019-02-15 | 京东方科技集团股份有限公司 | 阵列基板及其制备方法、传感器和探测设备 |
CN105789324B (zh) * | 2016-04-15 | 2019-05-03 | 京东方科技集团股份有限公司 | 传感器及其制造方法、电子设备 |
TWI625847B (zh) * | 2016-09-09 | 2018-06-01 | 友達光電股份有限公司 | 畫素結構及其製作方法 |
CN108242462B (zh) * | 2018-01-12 | 2020-08-18 | 京东方科技集团股份有限公司 | 有机发光显示面板及其制备方法、显示装置 |
JP2019174963A (ja) | 2018-03-27 | 2019-10-10 | 株式会社ジャパンディスプレイ | 指紋検出装置及び表示装置 |
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KR20000019853A (en) * | 1998-09-16 | 2000-04-15 | Lg Philips Lcd Co Ltd | Device for sensing x-ray video and manufacturing method thereof |
KR20010066258A (ko) * | 1999-12-31 | 2001-07-11 | 구본준, 론 위라하디락사 | 엑스레이 영상 감지소자 및 그 제조방법 |
KR20020072772A (ko) * | 2001-03-12 | 2002-09-18 | 엘지.필립스 엘시디 주식회사 | 엑스레이 영상 감지소자 및 그 제조방법 |
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JPS613118A (ja) * | 1984-06-16 | 1986-01-09 | Canon Inc | トランジスタ基板 |
GB9414639D0 (en) * | 1994-07-20 | 1994-09-07 | Philips Electronics Uk Ltd | An image detector |
TW578130B (en) * | 1997-02-17 | 2004-03-01 | Seiko Epson Corp | Display unit |
US6541918B1 (en) * | 1998-03-12 | 2003-04-01 | Seiko Epson Corporation | Active-matrix emitting apparatus and fabrication method therefor |
TW522453B (en) * | 1999-09-17 | 2003-03-01 | Semiconductor Energy Lab | Display device |
KR100577410B1 (ko) * | 1999-11-30 | 2006-05-08 | 엘지.필립스 엘시디 주식회사 | 엑스레이 영상 감지소자 및 그 제조방법 |
-
2001
- 2001-07-12 KR KR10-2001-0042124A patent/KR100448448B1/ko active IP Right Grant
- 2001-11-19 US US09/988,359 patent/US6806472B2/en not_active Expired - Lifetime
-
2002
- 2002-08-09 FR FR0210136A patent/FR2843488B1/fr not_active Expired - Fee Related
- 2002-08-13 DE DE10237149A patent/DE10237149B4/de not_active Expired - Fee Related
- 2002-08-23 JP JP2002243882A patent/JP3845605B2/ja not_active Expired - Fee Related
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20000019853A (en) * | 1998-09-16 | 2000-04-15 | Lg Philips Lcd Co Ltd | Device for sensing x-ray video and manufacturing method thereof |
KR20010066258A (ko) * | 1999-12-31 | 2001-07-11 | 구본준, 론 위라하디락사 | 엑스레이 영상 감지소자 및 그 제조방법 |
KR20020072772A (ko) * | 2001-03-12 | 2002-09-18 | 엘지.필립스 엘시디 주식회사 | 엑스레이 영상 감지소자 및 그 제조방법 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9190524B2 (en) | 2010-09-09 | 2015-11-17 | Sharp Kabushiki Kaisha | Thin film transistor substrate, method for producing the same, and display device |
Also Published As
Publication number | Publication date |
---|---|
FR2843488A1 (fr) | 2004-02-13 |
US20030010922A1 (en) | 2003-01-16 |
FR2843488B1 (fr) | 2005-10-21 |
US6806472B2 (en) | 2004-10-19 |
DE10237149B4 (de) | 2012-05-24 |
JP2004087604A (ja) | 2004-03-18 |
JP3845605B2 (ja) | 2006-11-15 |
KR20030006408A (ko) | 2003-01-23 |
DE10237149A1 (de) | 2004-03-04 |
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