KR100401388B1 - 기판건조장치 - Google Patents

기판건조장치 Download PDF

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Publication number
KR100401388B1
KR100401388B1 KR1019950043996A KR19950043996A KR100401388B1 KR 100401388 B1 KR100401388 B1 KR 100401388B1 KR 1019950043996 A KR1019950043996 A KR 1019950043996A KR 19950043996 A KR19950043996 A KR 19950043996A KR 100401388 B1 KR100401388 B1 KR 100401388B1
Authority
KR
South Korea
Prior art keywords
organic solvent
drying apparatus
treatment tank
substrate drying
heat
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR1019950043996A
Other languages
English (en)
Korean (ko)
Other versions
KR970030433A (ko
Inventor
타루이데쓰야
아사노히로미쓰
오노다하지메
Original Assignee
샤프 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 샤프 가부시키가이샤 filed Critical 샤프 가부시키가이샤
Publication of KR970030433A publication Critical patent/KR970030433A/ko
Application granted granted Critical
Publication of KR100401388B1 publication Critical patent/KR100401388B1/ko
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
    • H10P72/04—Apparatus for manufacture or treatment
    • H10P72/0402—Apparatus for fluid treatment
    • H10P72/0406—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H10P72/0408—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for drying
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F26—DRYING
    • F26B—DRYING SOLID MATERIALS OR OBJECTS BY REMOVING LIQUID THEREFROM
    • F26B21/00—Arrangements for supplying or controlling air or other gases for drying solid materials or objects
    • F26B21/40—Arrangements for supplying or controlling air or other gases for drying solid materials or objects using gases other than air
    • F26B21/471—Arrangements for supplying or controlling air or other gases for drying solid materials or objects using gases other than air condensing vapours onto the surface of the materials to be dried
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F26—DRYING
    • F26B—DRYING SOLID MATERIALS OR OBJECTS BY REMOVING LIQUID THEREFROM
    • F26B3/00—Drying solid materials or objects by processes involving the application of heat
    • F26B3/28—Drying solid materials or objects by processes involving the application of heat by radiation, e.g. from the sun
    • F26B3/30—Drying solid materials or objects by processes involving the application of heat by radiation, e.g. from the sun from infrared-emitting elements

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Combustion & Propulsion (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Microbiology (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Drying Of Solid Materials (AREA)
KR1019950043996A 1994-11-29 1995-11-27 기판건조장치 Expired - Fee Related KR100401388B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP29527794 1994-11-29
JPJP-P-1994-00295277 1994-11-29
JP94-295277 1995-11-29

Publications (2)

Publication Number Publication Date
KR970030433A KR970030433A (ko) 1997-06-26
KR100401388B1 true KR100401388B1 (ko) 2003-12-11

Family

ID=17818523

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019950043996A Expired - Fee Related KR100401388B1 (ko) 1994-11-29 1995-11-27 기판건조장치

Country Status (4)

Country Link
US (1) US5657553A (https=)
JP (1) JP3461642B2 (https=)
KR (1) KR100401388B1 (https=)
TW (1) TW301761B (https=)

Families Citing this family (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6050275A (en) 1996-09-27 2000-04-18 Tokyo Electron Limited Apparatus for and method of cleaning objects to be processed
US5864966A (en) * 1996-12-19 1999-02-02 California Institute Of Technology Two solvent vapor drying technique
JP3171807B2 (ja) * 1997-01-24 2001-06-04 東京エレクトロン株式会社 洗浄装置及び洗浄方法
JP3230051B2 (ja) * 1997-05-16 2001-11-19 東京エレクトロン株式会社 乾燥処理方法及びその装置
JPH10321585A (ja) * 1997-05-22 1998-12-04 Mitsubishi Electric Corp 乾燥装置および乾燥方法
JPH10321584A (ja) * 1997-05-22 1998-12-04 Mitsubishi Electric Corp 乾燥装置および乾燥方法
KR100707107B1 (ko) * 1997-07-17 2007-12-27 동경 엘렉트론 주식회사 세정.건조처리방법및장치
JP3897404B2 (ja) * 1997-07-22 2007-03-22 オメガセミコン電子株式会社 ベーパ乾燥装置及び乾燥方法
US6026589A (en) * 1998-02-02 2000-02-22 Silicon Valley Group, Thermal Systems Llc Wafer carrier and semiconductor apparatus for processing a semiconductor substrate
US6108932A (en) * 1998-05-05 2000-08-29 Steag Microtech Gmbh Method and apparatus for thermocapillary drying
US6199564B1 (en) * 1998-11-03 2001-03-13 Tokyo Electron Limited Substrate processing method and apparatus
GB2346953A (en) * 1999-02-16 2000-08-23 Stephen Rodger Henly Removing water from articles
US6192600B1 (en) * 1999-09-09 2001-02-27 Semitool, Inc. Thermocapillary dryer
KR20040014467A (ko) * 2001-03-15 2004-02-14 아크리온 엘엘씨 건조 증기 발생기
US6405452B1 (en) * 2001-03-28 2002-06-18 Taiwan Semiconductor Manufacturing Co., Ltd Method and apparatus for drying wafers after wet bench
US6649883B2 (en) * 2001-04-12 2003-11-18 Memc Electronic Materials, Inc. Method of calibrating a semiconductor wafer drying apparatus
US20030136429A1 (en) * 2002-01-22 2003-07-24 Semitool, Inc. Vapor cleaning and liquid rinsing process vessel
DE10216786C5 (de) * 2002-04-15 2009-10-15 Ers Electronic Gmbh Verfahren und Vorrichtung zur Konditionierung von Halbleiterwafern und/oder Hybriden
US10086511B2 (en) 2003-11-10 2018-10-02 Brooks Automation, Inc. Semiconductor manufacturing systems
US20070269297A1 (en) 2003-11-10 2007-11-22 Meulen Peter V D Semiconductor wafer handling and transport
US20050223837A1 (en) * 2003-11-10 2005-10-13 Blueshift Technologies, Inc. Methods and systems for driving robotic components of a semiconductor handling system
US7458763B2 (en) 2003-11-10 2008-12-02 Blueshift Technologies, Inc. Mid-entry load lock for semiconductor handling system
CN100573826C (zh) * 2004-04-02 2009-12-23 东京毅力科创株式会社 基板处理装置、基板处理方法、记录介质以及软件
US7637029B2 (en) * 2005-07-08 2009-12-29 Tokyo Electron Limited Vapor drying method, apparatus and recording medium for use in the method
JP2008082569A (ja) * 2006-09-26 2008-04-10 Kojiro Okawa 水切り乾燥装置及び水切り乾燥方法
JP5104174B2 (ja) 2007-10-01 2012-12-19 富士通株式会社 洗浄乾燥装置及び洗浄乾燥方法
JP2009124025A (ja) * 2007-11-16 2009-06-04 Fujitsu Ltd 洗浄乾燥装置及び洗浄乾燥方法
JP5362503B2 (ja) * 2009-09-24 2013-12-11 東京エレクトロン株式会社 洗浄・乾燥処理方法、洗浄・乾燥処理装置、および記録媒体
US9377423B2 (en) 2012-12-31 2016-06-28 Cascade Microtech, Inc. Systems and methods for handling substrates at below dew point temperatures
CN113418383B (zh) * 2021-06-24 2022-05-17 长沙韶光铬版有限公司 一种铬版湿法清洗工艺干燥用异丙醇蒸汽回流装置
JP7660446B2 (ja) * 2021-06-29 2025-04-11 株式会社荏原製作所 基板乾燥装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62260325A (ja) * 1986-05-07 1987-11-12 Sigma Gijutsu Kogyo Kk 基板乾燥方法
JPH05304132A (ja) * 1992-04-27 1993-11-16 Mitsubishi Electric Corp 蒸気乾燥方法及び蒸気乾燥槽
JPH06196470A (ja) * 1992-12-25 1994-07-15 Tokyo Electron Ltd 処理装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4393657A (en) * 1981-04-29 1983-07-19 Isao Takatama Method for recovering waste heat as motive power
US4800362A (en) * 1986-02-10 1989-01-24 Toyota Jidosha Kabushiki Kaisha Organic solvent cleaning apparatus
US4822429A (en) * 1986-07-07 1989-04-18 Mccord James W Liquid circulating means for a vapor generating and recovery apparatus
US4977688A (en) * 1989-10-27 1990-12-18 Semifab Incorporated Vapor device and method for drying articles such as semiconductor wafers with substances such as isopropyl alcohol
JP2902222B2 (ja) * 1992-08-24 1999-06-07 東京エレクトロン株式会社 乾燥処理装置
US5539995A (en) * 1994-03-16 1996-07-30 Verteq, Inc. Continuous flow vapor dryer system

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62260325A (ja) * 1986-05-07 1987-11-12 Sigma Gijutsu Kogyo Kk 基板乾燥方法
JPH05304132A (ja) * 1992-04-27 1993-11-16 Mitsubishi Electric Corp 蒸気乾燥方法及び蒸気乾燥槽
JPH06196470A (ja) * 1992-12-25 1994-07-15 Tokyo Electron Ltd 処理装置

Also Published As

Publication number Publication date
JPH08241881A (ja) 1996-09-17
TW301761B (https=) 1997-04-01
JP3461642B2 (ja) 2003-10-27
US5657553A (en) 1997-08-19
KR970030433A (ko) 1997-06-26

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