KR100273810B1 - 기판 위치검출 및 안내장치 - Google Patents
기판 위치검출 및 안내장치 Download PDFInfo
- Publication number
- KR100273810B1 KR100273810B1 KR1019950002816A KR19950002816A KR100273810B1 KR 100273810 B1 KR100273810 B1 KR 100273810B1 KR 1019950002816 A KR1019950002816 A KR 1019950002816A KR 19950002816 A KR19950002816 A KR 19950002816A KR 100273810 B1 KR100273810 B1 KR 100273810B1
- Authority
- KR
- South Korea
- Prior art keywords
- substrate
- cassette
- lcd
- substrates
- chamber
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1303—Apparatus specially adapted to the manufacture of LCDs
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67259—Position monitoring, e.g. misposition detection or presence detection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
- H01L21/6773—Conveying cassettes, containers or carriers
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Warehouses Or Storage Devices (AREA)
- Drying Of Semiconductors (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP04037594A JP3468430B2 (ja) | 1994-02-15 | 1994-02-15 | 位置検出案内装置、位置検出案内方法及び真空処理装置 |
JP94-40375 | 1994-02-15 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR950034563A KR950034563A (ko) | 1995-12-28 |
KR100273810B1 true KR100273810B1 (ko) | 2000-12-15 |
Family
ID=12578908
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019950002816A KR100273810B1 (ko) | 1994-02-15 | 1995-02-15 | 기판 위치검출 및 안내장치 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP3468430B2 (ja) |
KR (1) | KR100273810B1 (ja) |
TW (1) | TW369210U (ja) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100860143B1 (ko) * | 2005-09-05 | 2008-09-24 | 도쿄엘렉트론가부시키가이샤 | 기판 위치 맞춤 장치 및 기판 수용 유닛 |
KR101321612B1 (ko) * | 2009-07-30 | 2013-10-23 | 도쿄엘렉트론가부시키가이샤 | 기판 위치맞춤 기구, 그것을 이용한 진공 예비실 및 기판 처리 시스템 |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6053983A (en) * | 1997-05-08 | 2000-04-25 | Tokyo Electron, Ltd. | Wafer for carrying semiconductor wafers and method detecting wafers on carrier |
TW442891B (en) | 1998-11-17 | 2001-06-23 | Tokyo Electron Ltd | Vacuum processing system |
JP4832682B2 (ja) * | 2001-09-18 | 2011-12-07 | 東京エレクトロン株式会社 | 無人搬送車 |
KR100738661B1 (ko) * | 2004-12-21 | 2007-07-11 | 주식회사 대우일렉트로닉스 | 씨알티 잔상 제거 회로 |
CN103287852B (zh) * | 2013-06-18 | 2015-06-03 | 深圳市华星光电技术有限公司 | 玻璃面板堆垛系统及堆垛方法 |
US9255896B2 (en) | 2013-06-18 | 2016-02-09 | Shenzhen China Star Optoelectronics Technology Co., Ltd | Glass panel stocking system and stocking method |
-
1994
- 1994-02-15 JP JP04037594A patent/JP3468430B2/ja not_active Expired - Fee Related
-
1995
- 1995-02-11 TW TW085200130U patent/TW369210U/zh unknown
- 1995-02-15 KR KR1019950002816A patent/KR100273810B1/ko not_active IP Right Cessation
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100860143B1 (ko) * | 2005-09-05 | 2008-09-24 | 도쿄엘렉트론가부시키가이샤 | 기판 위치 맞춤 장치 및 기판 수용 유닛 |
KR100952524B1 (ko) * | 2005-09-05 | 2010-04-12 | 도쿄엘렉트론가부시키가이샤 | 기판 수용 유닛 |
KR101321612B1 (ko) * | 2009-07-30 | 2013-10-23 | 도쿄엘렉트론가부시키가이샤 | 기판 위치맞춤 기구, 그것을 이용한 진공 예비실 및 기판 처리 시스템 |
Also Published As
Publication number | Publication date |
---|---|
JP3468430B2 (ja) | 2003-11-17 |
KR950034563A (ko) | 1995-12-28 |
TW369210U (en) | 1999-09-01 |
JPH07231031A (ja) | 1995-08-29 |
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A201 | Request for examination | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20110811 Year of fee payment: 12 |
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LAPS | Lapse due to unpaid annual fee |