KR0125681Y1 - 웨이퍼 세정조 - Google Patents
웨이퍼 세정조Info
- Publication number
- KR0125681Y1 KR0125681Y1 KR2019950021654U KR19950021654U KR0125681Y1 KR 0125681 Y1 KR0125681 Y1 KR 0125681Y1 KR 2019950021654 U KR2019950021654 U KR 2019950021654U KR 19950021654 U KR19950021654 U KR 19950021654U KR 0125681 Y1 KR0125681 Y1 KR 0125681Y1
- Authority
- KR
- South Korea
- Prior art keywords
- cleaning tank
- wafer
- cleaning
- internal
- pipe
- Prior art date
Links
- 238000005406 washing Methods 0.000 title description 2
- 238000004140 cleaning Methods 0.000 claims abstract description 94
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 20
- 239000007788 liquid Substances 0.000 claims description 12
- 238000000926 separation method Methods 0.000 claims description 11
- 239000006185 dispersion Substances 0.000 claims description 9
- 238000009826 distribution Methods 0.000 claims description 3
- 238000007599 discharging Methods 0.000 claims description 2
- 239000000126 substance Substances 0.000 abstract description 13
- 238000000034 method Methods 0.000 abstract description 4
- 235000012431 wafers Nutrition 0.000 description 24
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 6
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- 229910052814 silicon oxide Inorganic materials 0.000 description 3
- 238000005530 etching Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- PXGOKWXKJXAPGV-UHFFFAOYSA-N Fluorine Chemical compound FF PXGOKWXKJXAPGV-UHFFFAOYSA-N 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000010419 fine particle Substances 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67057—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing with the semiconductor substrates being dipped in baths or vessels
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/04—Cleaning involving contact with liquid
- B08B3/048—Overflow-type cleaning, e.g. tanks in which the liquid flows over the tank in which the articles are placed
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Abstract
Description
Claims (5)
- 웨이퍼 세정조에 있어서, 외부 세정조와, 상기 외부 세정조와 소정거리 이격된 내부에 형성되며 상기 외부 세정조보다 높이가 낮고 세정액이 넘쳐흐를 수 있도록 상부에 배수홈이 형성된 내부 세정조와, 상기 내부 세정조의 상부에 위치되며 세정액을 공급하기 위한 공급관과, 상기 외부 세정조 일측면의 하부에 형성되며 상기 내부 세정조에 세정액을 공급하기 위한 공급노즐과, 상기 외부 세정조의 다른 일측면의 하부에 형성되며 세정액을 외부로 배출시키기 위한 배수관과, 상기 공급 노즐로부터 접속되며 상기 내부 세정조의 저면에 위치된 분리관과, 상기 분리관의 상부에 위치되며 세정액을 상기 내부 세정조에 균일하게 분산시키기 위한 분산판으로 이루어지는 것을 특징으로 하는 웨이퍼 세정조.
- 제1항에 있어서, 상기 분리관은 상기 공급 노즐과 연결되는 하나의 관으로부터 공급되는 세정액이 상기 내부 세정조에 균일하게 분리되어 공급되도록 다수의 관이 접속된 것을 특징으로 하는 웨이퍼 세정조.
- 제2항에 있어서, 상기 다수의 관 각각에는 공급된 세정액이 상기 내부 세정조의 저면을 향해 분사되도록 양측부에 다수의 홀이 형성된 것을 특징으로 하는 웨이퍼 세정조.
- 제1항에 있어서, 상기 분산판은 상면에 다수의 홀이 규칙적으로 형성되고, 하면에 양측부로부터 길게 연장된 홀이 일정 간격으로 형성된 것을 특징으로 하는 웨이퍼 세정조.
- 제4항에 있어서, 상기 길게 연장된 홀은 상기 공급 노즐을 통해 공급되는 순수의 방향과 직각을 이루도록 형성된 것을 특징으로 하는 웨이퍼 세정조.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019950021654U KR0125681Y1 (ko) | 1995-08-22 | 1995-08-22 | 웨이퍼 세정조 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR2019950021654U KR0125681Y1 (ko) | 1995-08-22 | 1995-08-22 | 웨이퍼 세정조 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR970011198U KR970011198U (ko) | 1997-03-29 |
KR0125681Y1 true KR0125681Y1 (ko) | 1998-11-02 |
Family
ID=19421266
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR2019950021654U KR0125681Y1 (ko) | 1995-08-22 | 1995-08-22 | 웨이퍼 세정조 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR0125681Y1 (ko) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100334058B1 (ko) * | 1999-07-15 | 2002-04-26 | 김광교 | 반도체 웨이퍼 제조용 세정조의 세척수안정화 장치 |
-
1995
- 1995-08-22 KR KR2019950021654U patent/KR0125681Y1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR970011198U (ko) | 1997-03-29 |
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