KR0121284B1 - 프로그램 메모리의 메모리 셀 내용의 검사방법 - Google Patents
프로그램 메모리의 메모리 셀 내용의 검사방법Info
- Publication number
- KR0121284B1 KR0121284B1 KR1019880003089A KR880003089A KR0121284B1 KR 0121284 B1 KR0121284 B1 KR 0121284B1 KR 1019880003089 A KR1019880003089 A KR 1019880003089A KR 880003089 A KR880003089 A KR 880003089A KR 0121284 B1 KR0121284 B1 KR 0121284B1
- Authority
- KR
- South Korea
- Prior art keywords
- memory
- program
- memory cell
- checksum
- contents
- Prior art date
Links
Images
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
- G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
- G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
- G06F11/1004—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's to protect a block of data words, e.g. CRC or checksum
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/52—Protection of memory contents; Detection of errors in memory contents
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Security & Cryptography (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Detection And Correction Of Errors (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DEP3709524.2 | 1987-03-23 | ||
DE3709524A DE3709524C2 (de) | 1987-03-23 | 1987-03-23 | Verfahren zur Überprüfung der Speicherzelleninhalte eines Programmspeichers |
DE3709524.2 | 1987-03-23 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR880011662A KR880011662A (ko) | 1988-10-29 |
KR0121284B1 true KR0121284B1 (ko) | 1997-11-22 |
Family
ID=6323799
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019880003089A KR0121284B1 (ko) | 1987-03-23 | 1988-03-23 | 프로그램 메모리의 메모리 셀 내용의 검사방법 |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP3124278B2 (de) |
KR (1) | KR0121284B1 (de) |
DE (1) | DE3709524C2 (de) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2647924B1 (fr) * | 1989-06-06 | 1994-06-17 | Bull Cp8 | Procede pour verifier l'integrite d'un logiciel ou de donnees, et systeme pour la mise en oeuvre de ce procede |
US5023813A (en) * | 1989-08-03 | 1991-06-11 | International Business Machines Corporation | Non-volatile memory usage |
JP2701591B2 (ja) * | 1991-05-31 | 1998-01-21 | 日本電気株式会社 | 自動車電話装置の自己診断方法 |
DE4308464A1 (de) * | 1993-03-17 | 1994-09-22 | Vdo Schindling | Verfahren zur Erkennung von Hardwarefehlern auf den Leitungen eines Adressbusses in Mikroprozessoren |
JP2000305859A (ja) * | 1999-04-22 | 2000-11-02 | Matsushita Electric Ind Co Ltd | プロセッサ |
DE10058220A1 (de) * | 2000-11-23 | 2002-05-29 | Daimler Chrysler Ag | Verfahren zum Betreiben einer einen Datenspeicher aufweisenden Vorrichtung |
EP1538509A1 (de) * | 2003-12-04 | 2005-06-08 | Axalto S.A. | Methode zum Absichern einer Programmausführung gegen Strahlungsangriffe |
DE102004006645A1 (de) * | 2004-02-11 | 2005-09-22 | Giesecke & Devrient Gmbh | Verfahren zum sicheren Berechnen einer Prüfsumme |
DE102016104012A1 (de) * | 2016-03-04 | 2017-09-07 | Infineon Technologies Ag | Verarbeitung eines Datenworts |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5378127A (en) * | 1976-12-22 | 1978-07-11 | Sharp Corp | Self diagnosis system of fixed program memory unit |
JPS5888899A (ja) * | 1981-11-19 | 1983-05-27 | Mitsubishi Electric Corp | Ram制御回路 |
US4488300A (en) * | 1982-12-01 | 1984-12-11 | The Singer Company | Method of checking the integrity of a source of additional memory for use in an electronically controlled sewing machine |
JPS59178695A (ja) * | 1983-03-30 | 1984-10-09 | Nittan Co Ltd | 読出し専用メモリチエツク装置 |
JPS60254258A (ja) * | 1984-05-31 | 1985-12-14 | Mitsubishi Electric Corp | 読み出し専用メモリデ−タの破壊検知方法 |
-
1987
- 1987-03-23 DE DE3709524A patent/DE3709524C2/de not_active Expired - Lifetime
-
1988
- 1988-03-22 JP JP63065957A patent/JP3124278B2/ja not_active Expired - Lifetime
- 1988-03-23 KR KR1019880003089A patent/KR0121284B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR880011662A (ko) | 1988-10-29 |
DE3709524C2 (de) | 1996-08-14 |
DE3709524A1 (de) | 1988-10-06 |
JP3124278B2 (ja) | 2001-01-15 |
JPS63254548A (ja) | 1988-10-21 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20070817 Year of fee payment: 11 |
|
LAPS | Lapse due to unpaid annual fee |