JPWO2021215032A5 - - Google Patents

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JPWO2021215032A5
JPWO2021215032A5 JP2022516832A JP2022516832A JPWO2021215032A5 JP WO2021215032 A5 JPWO2021215032 A5 JP WO2021215032A5 JP 2022516832 A JP2022516832 A JP 2022516832A JP 2022516832 A JP2022516832 A JP 2022516832A JP WO2021215032 A5 JPWO2021215032 A5 JP WO2021215032A5
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Japan
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spectrum
unit
peaks
peak
measuring
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JP2022516832A
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Japanese (ja)
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JP7494905B2 (ja
JPWO2021215032A1 (https=
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Priority claimed from PCT/JP2020/040843 external-priority patent/WO2021215032A1/ja
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JP2022516832A 2020-04-23 2020-10-30 分光測定装置 Active JP7494905B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020076923 2020-04-23
JP2020076923 2020-04-23
PCT/JP2020/040843 WO2021215032A1 (ja) 2020-04-23 2020-10-30 分光測定装置

Publications (3)

Publication Number Publication Date
JPWO2021215032A1 JPWO2021215032A1 (https=) 2021-10-28
JPWO2021215032A5 true JPWO2021215032A5 (https=) 2022-09-16
JP7494905B2 JP7494905B2 (ja) 2024-06-04

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JP2022516832A Active JP7494905B2 (ja) 2020-04-23 2020-10-30 分光測定装置

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US (1) US12228452B2 (https=)
JP (1) JP7494905B2 (https=)
CN (1) CN115335668B (https=)
WO (1) WO2021215032A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN119394438B (zh) * 2025-01-03 2025-03-21 中国科学院长春光学精密机械与物理研究所 一种宽波段、高工作效率太阳光谱仪

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0139788Y2 (https=) 1984-12-29 1989-11-29
JPS6439788A (en) * 1987-08-06 1989-02-10 Nec Corp Judgment device for uniaxial mode operation of distributed feedback semiconductor laser
JP2837868B2 (ja) * 1988-05-24 1998-12-16 アンリツ株式会社 分光装置
JPH04315928A (ja) * 1991-04-15 1992-11-06 Mitsubishi Electric Corp 発光分光分析装置
JP2000310507A (ja) * 1999-04-26 2000-11-07 Canon Inc 干渉装置
JP3771785B2 (ja) 2000-08-21 2006-04-26 株式会社日立製作所 光増幅装置
JP2002250947A (ja) * 2001-02-23 2002-09-06 Fujitsu Ltd ラマン励起制御方法及び、これを用いる光伝送装置
JP2003161654A (ja) 2001-11-26 2003-06-06 Ando Electric Co Ltd 光スペクトラムアナライザ及び光スペクトル測定方法
EP1811619A3 (en) * 2003-05-23 2007-08-08 Rohm and Haas Electronic Materials, L.L.C. External cavity semiconductor laser and method for fabrication thereof
US7102746B2 (en) * 2003-12-16 2006-09-05 New Chromex, Inc. Raman spectroscope
US7995280B2 (en) * 2004-12-01 2011-08-09 Carl Zeiss Smt Gmbh Projection exposure system, beam delivery system and method of generating a beam of light
JP2008016698A (ja) 2006-07-07 2008-01-24 Sony Corp レーザ光源システムおよびレーザ光源の制御方法
JP2015127680A (ja) * 2013-12-27 2015-07-09 スリーエム イノベイティブ プロパティズ カンパニー 計測装置、システムおよびプログラム
US9778110B1 (en) * 2014-04-17 2017-10-03 Picarro, Inc. Self-referencing cavity enhanced spectroscopy (SRCES) systems and methods
EP3226555B1 (en) * 2016-03-28 2019-11-20 Ricoh Company, Ltd. Wavelength estimation device, light-source device, image display apparatus, wavelength estimation method, and light-source control method
US9606053B1 (en) * 2016-11-22 2017-03-28 Airware, Inc. Reduction of scattering noise when using NDIR with a liquid sample
CN109946267B (zh) * 2019-04-18 2022-02-25 南昌航空大学 气体瑞利-布里渊散射谱线的测量装置及方法

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