JP2013539865A5 - - Google Patents

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Publication number
JP2013539865A5
JP2013539865A5 JP2013533855A JP2013533855A JP2013539865A5 JP 2013539865 A5 JP2013539865 A5 JP 2013539865A5 JP 2013533855 A JP2013533855 A JP 2013533855A JP 2013533855 A JP2013533855 A JP 2013533855A JP 2013539865 A5 JP2013539865 A5 JP 2013539865A5
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JP
Japan
Prior art keywords
infrared
array
processor
laser
surface chemistry
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JP2013533855A
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English (en)
Japanese (ja)
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JP6037340B2 (ja
JP2013539865A (ja
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Priority claimed from US12/903,548 external-priority patent/US8536529B2/en
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Publication of JP2013539865A5 publication Critical patent/JP2013539865A5/ja
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JP2013533855A 2010-10-13 2011-08-26 表面の化学的性質の非接触測定装置および方法 Active JP6037340B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/903,548 2010-10-13
US12/903,548 US8536529B2 (en) 2010-10-13 2010-10-13 Non-contact surface chemistry measurement apparatus and method
PCT/US2011/049331 WO2012050669A1 (en) 2010-10-13 2011-08-26 Non-contact surface chemistry measurement apparatus and method

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2016160335A Division JP6309583B2 (ja) 2010-10-13 2016-08-18 表面の化学的性質の非接触測定装置および方法

Publications (3)

Publication Number Publication Date
JP2013539865A JP2013539865A (ja) 2013-10-28
JP2013539865A5 true JP2013539865A5 (https=) 2014-07-17
JP6037340B2 JP6037340B2 (ja) 2016-12-07

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ID=44681417

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JP2013533855A Active JP6037340B2 (ja) 2010-10-13 2011-08-26 表面の化学的性質の非接触測定装置および方法
JP2016160335A Active JP6309583B2 (ja) 2010-10-13 2016-08-18 表面の化学的性質の非接触測定装置および方法

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JP2016160335A Active JP6309583B2 (ja) 2010-10-13 2016-08-18 表面の化学的性質の非接触測定装置および方法

Country Status (5)

Country Link
US (1) US8536529B2 (https=)
EP (1) EP2627989B1 (https=)
JP (2) JP6037340B2 (https=)
CN (1) CN103180715A (https=)
WO (1) WO2012050669A1 (https=)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5736325B2 (ja) 2012-02-21 2015-06-17 株式会社日立製作所 光学装置
US8686364B1 (en) 2012-09-17 2014-04-01 Jp3 Measurement, Llc Method and system for determining energy content and detecting contaminants in a fluid stream
FR3013118B1 (fr) * 2013-11-12 2015-11-06 Centre Nat Detudes Spatiales Cnes Spectrophotometre hyperspectral large bande pour analyser un objet dans le domaine fluorescent
DE102015106635A1 (de) * 2015-04-29 2016-11-03 Osram Opto Semiconductors Gmbh Optoelektronische Anordnung
USD796979S1 (en) * 2015-09-02 2017-09-12 Mettler-Toledo Gmbh Spectrophotometer
USD797587S1 (en) * 2015-09-02 2017-09-19 Mettler-Toledo Gmbh Spectrophotometer
JP6692651B2 (ja) * 2016-02-05 2020-05-13 株式会社ミツトヨ クロマティック共焦点センサ
USD796359S1 (en) * 2016-02-24 2017-09-05 Ocean Optics, Inc. Miniature spectrometer case
US9897484B1 (en) 2016-09-29 2018-02-20 Intel Corporation Measuring wideband spectrum information in mobile devices via an integrated optical system that uses multiple spectral sensors, multiple light sources and MEMS actuation
CN120668258A (zh) * 2017-06-01 2025-09-19 柯尼卡美能达株式会社 分光光度计
US12503611B2 (en) 2022-05-12 2025-12-23 University Of Rhode Island Board Of Trustees Glass-ceramic thermal paint system and method using UV:VIS spectroscopy

Family Cites Families (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07117499B2 (ja) * 1987-10-31 1995-12-18 石川島播磨重工業株式会社 レーザ光線による塗膜劣化診断方法
JP3124047B2 (ja) * 1991-02-04 2001-01-15 日本たばこ産業株式会社 携帯型赤外線水分測定装置
US6031233A (en) * 1995-08-31 2000-02-29 Infrared Fiber Systems, Inc. Handheld infrared spectrometer
JP3181596B2 (ja) * 1995-08-31 2001-07-03 インフラレッド ファイバー システムス,インク. ハンドヘルド赤外線分光装置
US6157033A (en) * 1998-05-18 2000-12-05 Power Distribution Services, Inc. Leak detection system
US6836325B2 (en) * 1999-07-16 2004-12-28 Textron Systems Corporation Optical probes and methods for spectral analysis
JP4498564B2 (ja) * 2000-08-10 2010-07-07 日本分光株式会社 試料識別方法およびその装置
JP3930334B2 (ja) * 2001-03-21 2007-06-13 株式会社資生堂 分光反射率測定装置
JP2003254856A (ja) 2002-02-28 2003-09-10 Tokyo Gas Co Ltd 光学式ガス漏洩検知器及びガス漏洩検知車両
US6697155B2 (en) * 2002-04-09 2004-02-24 Itt Manufacturing Enterprises, Inc. Multispectral active remote sensing without narrowband optical filters
US6784431B2 (en) 2002-06-13 2004-08-31 The Boeing Company Method of measuring anodize coating amount using infrared absorbance
US6794651B2 (en) 2002-06-13 2004-09-21 The Boeing Company Method of measuring chromated conversion coating amount using infrared absorbance
US6906327B2 (en) 2002-11-26 2005-06-14 The Boeing Company Method of measuring amount of chemical cure and amount of surface contamination using infrared absorbance
US6903339B2 (en) 2002-11-26 2005-06-07 The Boeing Company Method of measuring thickness of an opaque coating using infrared absorbance
US7174198B2 (en) 2002-12-27 2007-02-06 Igor Trofimov Non-invasive detection of analytes in a complex matrix
WO2005001431A2 (en) 2003-02-25 2005-01-06 Ceyx Technologies, Inc. Apparatus and method for chemical and biological agent sensing
US7115869B2 (en) 2003-09-30 2006-10-03 The Boeing Company Method for measurement of composite heat damage with infrared spectroscopy
JP2007509319A (ja) 2003-10-17 2007-04-12 アクサン・テクノロジーズ・インコーポレーテッド 多チャネルラマン分光システムおよび方法
US7236243B2 (en) * 2004-04-12 2007-06-26 Michael Thomas Beecroft Hand-held spectrometer
US20050264804A1 (en) * 2004-05-27 2005-12-01 Eastman Kodak Company Bi-modal control material for particle size analyzers
WO2007089770A2 (en) * 2006-01-31 2007-08-09 Polychromix Corporation Hand-held ir spectrometer with a fixed grating and a diffractive mems-array
US7796251B2 (en) * 2006-03-22 2010-09-14 Itt Manufacturing Enterprises, Inc. Method, apparatus and system for rapid and sensitive standoff detection of surface contaminants
US8180419B2 (en) 2006-09-27 2012-05-15 Nellcor Puritan Bennett Llc Tissue hydration estimation by spectral absorption bandwidth measurement
US7826509B2 (en) 2006-12-15 2010-11-02 President And Fellows Of Harvard College Broadly tunable single-mode quantum cascade laser sources and sensors
JP4766697B2 (ja) * 2007-03-22 2011-09-07 アンリツ株式会社 小型ガス検知装置
US8402819B2 (en) 2007-05-15 2013-03-26 Anasys Instruments, Inc. High frequency deflection measurement of IR absorption
CN101821603A (zh) * 2007-10-11 2010-09-01 巴斯夫欧洲公司 具有led阵列的分光仪
JP2009282007A (ja) * 2008-05-26 2009-12-03 Ritsuo Hasumi 携帯型スペクトル分析機のデータ処理方法
JP2010117272A (ja) * 2008-11-13 2010-05-27 Mitsubishi Rayon Co Ltd シリコーン異物の判別方法
CN201331382Y (zh) * 2009-01-19 2009-10-21 杭州电子科技大学 一种阵列式微型光谱仪
CN101819063B (zh) * 2009-12-29 2011-10-05 南京邮电大学 相位调制凹槽阵列微型光谱仪

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