CN103180715A - 非接触表面化学测量装置和方法 - Google Patents

非接触表面化学测量装置和方法 Download PDF

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Publication number
CN103180715A
CN103180715A CN2011800491455A CN201180049145A CN103180715A CN 103180715 A CN103180715 A CN 103180715A CN 2011800491455 A CN2011800491455 A CN 2011800491455A CN 201180049145 A CN201180049145 A CN 201180049145A CN 103180715 A CN103180715 A CN 103180715A
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CN
China
Prior art keywords
infrared
beam aperture
tunable
array
processor
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Pending
Application number
CN2011800491455A
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English (en)
Chinese (zh)
Inventor
P·G·瓦伊
G·J·沃纳
P·H·谢莉
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Boeing Co
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Boeing Co
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Publication of CN103180715A publication Critical patent/CN103180715A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0289—Field-of-view determination; Aiming or pointing of a spectrometer; Adjusting alignment; Encoding angular position; Size of measurement area; Position tracking
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
    • G01J3/108—Arrangements of light sources specially adapted for spectrometry or colorimetry for measurement in the infrared range
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/274—Calibration, base line adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/93—Detection standards; Calibrating baseline adjustment, drift correction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/94—Investigating contamination, e.g. dust
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G01N2021/8427—Coatings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N2021/8472—Investigation of composite materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/02—Mechanical
    • G01N2201/022—Casings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/12—Circuits of general importance; Signal processing
    • G01N2201/129—Using chemometrical methods

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Engineering & Computer Science (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
CN2011800491455A 2010-10-13 2011-08-26 非接触表面化学测量装置和方法 Pending CN103180715A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/903,548 2010-10-13
US12/903,548 US8536529B2 (en) 2010-10-13 2010-10-13 Non-contact surface chemistry measurement apparatus and method
PCT/US2011/049331 WO2012050669A1 (en) 2010-10-13 2011-08-26 Non-contact surface chemistry measurement apparatus and method

Publications (1)

Publication Number Publication Date
CN103180715A true CN103180715A (zh) 2013-06-26

Family

ID=44681417

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2011800491455A Pending CN103180715A (zh) 2010-10-13 2011-08-26 非接触表面化学测量装置和方法

Country Status (5)

Country Link
US (1) US8536529B2 (https=)
EP (1) EP2627989B1 (https=)
JP (2) JP6037340B2 (https=)
CN (1) CN103180715A (https=)
WO (1) WO2012050669A1 (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107044822A (zh) * 2016-02-05 2017-08-15 株式会社三丰 光谱共焦传感器和测量方法

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5736325B2 (ja) 2012-02-21 2015-06-17 株式会社日立製作所 光学装置
US8686364B1 (en) 2012-09-17 2014-04-01 Jp3 Measurement, Llc Method and system for determining energy content and detecting contaminants in a fluid stream
FR3013118B1 (fr) * 2013-11-12 2015-11-06 Centre Nat Detudes Spatiales Cnes Spectrophotometre hyperspectral large bande pour analyser un objet dans le domaine fluorescent
DE102015106635A1 (de) * 2015-04-29 2016-11-03 Osram Opto Semiconductors Gmbh Optoelektronische Anordnung
USD796979S1 (en) * 2015-09-02 2017-09-12 Mettler-Toledo Gmbh Spectrophotometer
USD797587S1 (en) * 2015-09-02 2017-09-19 Mettler-Toledo Gmbh Spectrophotometer
USD796359S1 (en) * 2016-02-24 2017-09-05 Ocean Optics, Inc. Miniature spectrometer case
US9897484B1 (en) 2016-09-29 2018-02-20 Intel Corporation Measuring wideband spectrum information in mobile devices via an integrated optical system that uses multiple spectral sensors, multiple light sources and MEMS actuation
JP7358985B2 (ja) * 2017-06-01 2023-10-11 コニカミノルタ株式会社 分光測色計
US12503611B2 (en) 2022-05-12 2025-12-23 University Of Rhode Island Board Of Trustees Glass-ceramic thermal paint system and method using UV:VIS spectroscopy

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6697155B2 (en) * 2002-04-09 2004-02-24 Itt Manufacturing Enterprises, Inc. Multispectral active remote sensing without narrowband optical filters
US20050264808A1 (en) * 2003-10-17 2005-12-01 Axsun Technologies, Inc. Multi channel Raman spectroscopy system and method
US7236243B2 (en) * 2004-04-12 2007-06-26 Michael Thomas Beecroft Hand-held spectrometer
US20070194239A1 (en) * 2006-01-31 2007-08-23 Mcallister Abraham Apparatus and method providing a hand-held spectrometer
US20080144677A1 (en) * 2006-12-15 2008-06-19 Belkin Mikhail A Broadly tunable single-mode quantum cascade laser sources and sensors
CN201331382Y (zh) * 2009-01-19 2009-10-21 杭州电子科技大学 一种阵列式微型光谱仪
CN101819063A (zh) * 2009-12-29 2010-09-01 南京邮电大学 相位调制凹槽阵列微型光谱仪

Family Cites Families (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07117499B2 (ja) * 1987-10-31 1995-12-18 石川島播磨重工業株式会社 レーザ光線による塗膜劣化診断方法
JP3124047B2 (ja) * 1991-02-04 2001-01-15 日本たばこ産業株式会社 携帯型赤外線水分測定装置
JP3181596B2 (ja) * 1995-08-31 2001-07-03 インフラレッド ファイバー システムス，インク． ハンドヘルド赤外線分光装置
US6031233A (en) * 1995-08-31 2000-02-29 Infrared Fiber Systems, Inc. Handheld infrared spectrometer
US6157033A (en) * 1998-05-18 2000-12-05 Power Distribution Services, Inc. Leak detection system
US6836325B2 (en) * 1999-07-16 2004-12-28 Textron Systems Corporation Optical probes and methods for spectral analysis
JP4498564B2 (ja) * 2000-08-10 2010-07-07 日本分光株式会社 試料識別方法およびその装置
JP3930334B2 (ja) * 2001-03-21 2007-06-13 株式会社資生堂 分光反射率測定装置
JP2003254856A (ja) 2002-02-28 2003-09-10 Tokyo Gas Co Ltd 光学式ガス漏洩検知器及びガス漏洩検知車両
US6784431B2 (en) 2002-06-13 2004-08-31 The Boeing Company Method of measuring anodize coating amount using infrared absorbance
US6794651B2 (en) 2002-06-13 2004-09-21 The Boeing Company Method of measuring chromated conversion coating amount using infrared absorbance
US6903339B2 (en) 2002-11-26 2005-06-07 The Boeing Company Method of measuring thickness of an opaque coating using infrared absorbance
US6906327B2 (en) 2002-11-26 2005-06-14 The Boeing Company Method of measuring amount of chemical cure and amount of surface contamination using infrared absorbance
US7174198B2 (en) 2002-12-27 2007-02-06 Igor Trofimov Non-invasive detection of analytes in a complex matrix
JP2006528782A (ja) 2003-02-25 2006-12-21 セイックス・テクノロジーズ・インコーポレーテッド 化学物質及び生物物質検知装置及び方法
US7115869B2 (en) 2003-09-30 2006-10-03 The Boeing Company Method for measurement of composite heat damage with infrared spectroscopy
US20050264804A1 (en) * 2004-05-27 2005-12-01 Eastman Kodak Company Bi-modal control material for particle size analyzers
US7796251B2 (en) * 2006-03-22 2010-09-14 Itt Manufacturing Enterprises, Inc. Method, apparatus and system for rapid and sensitive standoff detection of surface contaminants
US8180419B2 (en) 2006-09-27 2012-05-15 Nellcor Puritan Bennett Llc Tissue hydration estimation by spectral absorption bandwidth measurement
JP4766697B2 (ja) * 2007-03-22 2011-09-07 アンリツ株式会社 小型ガス検知装置
US8402819B2 (en) 2007-05-15 2013-03-26 Anasys Instruments, Inc. High frequency deflection measurement of IR absorption
EA201000526A1 (ru) * 2007-10-11 2010-12-30 Басф Се Спектрометр со светодиодной матрицей
JP2009282007A (ja) * 2008-05-26 2009-12-03 Ritsuo Hasumi 携帯型スペクトル分析機のデータ処理方法
JP2010117272A (ja) * 2008-11-13 2010-05-27 Mitsubishi Rayon Co Ltd シリコーン異物の判別方法

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6697155B2 (en) * 2002-04-09 2004-02-24 Itt Manufacturing Enterprises, Inc. Multispectral active remote sensing without narrowband optical filters
US20050264808A1 (en) * 2003-10-17 2005-12-01 Axsun Technologies, Inc. Multi channel Raman spectroscopy system and method
US7236243B2 (en) * 2004-04-12 2007-06-26 Michael Thomas Beecroft Hand-held spectrometer
US20070194239A1 (en) * 2006-01-31 2007-08-23 Mcallister Abraham Apparatus and method providing a hand-held spectrometer
US20080144677A1 (en) * 2006-12-15 2008-06-19 Belkin Mikhail A Broadly tunable single-mode quantum cascade laser sources and sensors
CN201331382Y (zh) * 2009-01-19 2009-10-21 杭州电子科技大学 一种阵列式微型光谱仪
CN101819063A (zh) * 2009-12-29 2010-09-01 南京邮电大学 相位调制凹槽阵列微型光谱仪

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107044822A (zh) * 2016-02-05 2017-08-15 株式会社三丰 光谱共焦传感器和测量方法
CN107044822B (zh) * 2016-02-05 2021-04-27 株式会社三丰 光谱共焦传感器

Also Published As

Publication number Publication date
EP2627989B1 (en) 2021-02-17
US20120092665A1 (en) 2012-04-19
JP6037340B2 (ja) 2016-12-07
US8536529B2 (en) 2013-09-17
WO2012050669A1 (en) 2012-04-19
JP6309583B2 (ja) 2018-04-11
EP2627989A1 (en) 2013-08-21
JP2013539865A (ja) 2013-10-28
JP2016224063A (ja) 2016-12-28

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Application publication date: 20130626