JP7494905B2 - 分光測定装置 - Google Patents

分光測定装置 Download PDF

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Publication number
JP7494905B2
JP7494905B2 JP2022516832A JP2022516832A JP7494905B2 JP 7494905 B2 JP7494905 B2 JP 7494905B2 JP 2022516832 A JP2022516832 A JP 2022516832A JP 2022516832 A JP2022516832 A JP 2022516832A JP 7494905 B2 JP7494905 B2 JP 7494905B2
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Japan
Prior art keywords
spectrum
unit
peak
light
wavelength
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JP2022516832A
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English (en)
Japanese (ja)
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JPWO2021215032A1 (https=
JPWO2021215032A5 (https=
Inventor
亮二 平岡
善央 米澤
徹也 永井
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Shimadzu Corp
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Shimadzu Corp
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Publication of JPWO2021215032A5 publication Critical patent/JPWO2021215032A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/021—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using plane or convex mirrors, parallel phase plates, or particular reflectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/027—Control of working procedures of a spectrometer; Failure detection; Bandwidth calculation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J2003/2859—Peak detecting in spectrum
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0264—Electrical interface; User interface

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Lasers (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP2022516832A 2020-04-23 2020-10-30 分光測定装置 Active JP7494905B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020076923 2020-04-23
JP2020076923 2020-04-23
PCT/JP2020/040843 WO2021215032A1 (ja) 2020-04-23 2020-10-30 分光測定装置

Publications (3)

Publication Number Publication Date
JPWO2021215032A1 JPWO2021215032A1 (https=) 2021-10-28
JPWO2021215032A5 JPWO2021215032A5 (https=) 2022-09-16
JP7494905B2 true JP7494905B2 (ja) 2024-06-04

Family

ID=78270439

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022516832A Active JP7494905B2 (ja) 2020-04-23 2020-10-30 分光測定装置

Country Status (4)

Country Link
US (1) US12228452B2 (https=)
JP (1) JP7494905B2 (https=)
CN (1) CN115335668B (https=)
WO (1) WO2021215032A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN119394438B (zh) * 2025-01-03 2025-03-21 中国科学院长春光学精密机械与物理研究所 一种宽波段、高工作效率太阳光谱仪

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000310507A (ja) 1999-04-26 2000-11-07 Canon Inc 干渉装置
JP2002064235A (ja) 2000-08-21 2002-02-28 Hitachi Ltd 光増幅装置
JP2002250947A (ja) 2001-02-23 2002-09-06 Fujitsu Ltd ラマン励起制御方法及び、これを用いる光伝送装置
JP2003161654A (ja) 2001-11-26 2003-06-06 Ando Electric Co Ltd 光スペクトラムアナライザ及び光スペクトル測定方法
US20050128476A1 (en) 2003-12-16 2005-06-16 New Chromex, Inc. Raman spectroscope
JP2008016698A (ja) 2006-07-07 2008-01-24 Sony Corp レーザ光源システムおよびレーザ光源の制御方法
JP2008522421A (ja) 2004-12-01 2008-06-26 カール・ツァイス・エスエムティー・アーゲー 投影露光系、ビーム伝送系及び光ビームの生成方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0139788Y2 (https=) 1984-12-29 1989-11-29
JPS6439788A (en) * 1987-08-06 1989-02-10 Nec Corp Judgment device for uniaxial mode operation of distributed feedback semiconductor laser
JP2837868B2 (ja) * 1988-05-24 1998-12-16 アンリツ株式会社 分光装置
JPH04315928A (ja) * 1991-04-15 1992-11-06 Mitsubishi Electric Corp 発光分光分析装置
EP1811619A3 (en) * 2003-05-23 2007-08-08 Rohm and Haas Electronic Materials, L.L.C. External cavity semiconductor laser and method for fabrication thereof
JP2015127680A (ja) * 2013-12-27 2015-07-09 スリーエム イノベイティブ プロパティズ カンパニー 計測装置、システムおよびプログラム
US9778110B1 (en) * 2014-04-17 2017-10-03 Picarro, Inc. Self-referencing cavity enhanced spectroscopy (SRCES) systems and methods
EP3226555B1 (en) * 2016-03-28 2019-11-20 Ricoh Company, Ltd. Wavelength estimation device, light-source device, image display apparatus, wavelength estimation method, and light-source control method
US9606053B1 (en) * 2016-11-22 2017-03-28 Airware, Inc. Reduction of scattering noise when using NDIR with a liquid sample
CN109946267B (zh) * 2019-04-18 2022-02-25 南昌航空大学 气体瑞利-布里渊散射谱线的测量装置及方法

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000310507A (ja) 1999-04-26 2000-11-07 Canon Inc 干渉装置
JP2002064235A (ja) 2000-08-21 2002-02-28 Hitachi Ltd 光増幅装置
JP2002250947A (ja) 2001-02-23 2002-09-06 Fujitsu Ltd ラマン励起制御方法及び、これを用いる光伝送装置
JP2003161654A (ja) 2001-11-26 2003-06-06 Ando Electric Co Ltd 光スペクトラムアナライザ及び光スペクトル測定方法
US20050128476A1 (en) 2003-12-16 2005-06-16 New Chromex, Inc. Raman spectroscope
JP2008522421A (ja) 2004-12-01 2008-06-26 カール・ツァイス・エスエムティー・アーゲー 投影露光系、ビーム伝送系及び光ビームの生成方法
JP2008016698A (ja) 2006-07-07 2008-01-24 Sony Corp レーザ光源システムおよびレーザ光源の制御方法

Also Published As

Publication number Publication date
WO2021215032A1 (ja) 2021-10-28
US12228452B2 (en) 2025-02-18
CN115335668A (zh) 2022-11-11
JPWO2021215032A1 (https=) 2021-10-28
US20230168125A1 (en) 2023-06-01
CN115335668B (zh) 2025-04-11

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