CN115335668B - 分光测定装置 - Google Patents

分光测定装置 Download PDF

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Publication number
CN115335668B
CN115335668B CN202080099125.8A CN202080099125A CN115335668B CN 115335668 B CN115335668 B CN 115335668B CN 202080099125 A CN202080099125 A CN 202080099125A CN 115335668 B CN115335668 B CN 115335668B
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CN
China
Prior art keywords
spectrum
peak
unit
light
wavelength
Prior art date
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Active
Application number
CN202080099125.8A
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English (en)
Chinese (zh)
Other versions
CN115335668A (zh
Inventor
平冈亮二
米泽善央
永井徹也
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
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Shimadzu Corp
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Publication date
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Publication of CN115335668A publication Critical patent/CN115335668A/zh
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Publication of CN115335668B publication Critical patent/CN115335668B/zh
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/021—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using plane or convex mirrors, parallel phase plates, or particular reflectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/027—Control of working procedures of a spectrometer; Failure detection; Bandwidth calculation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J2003/2859—Peak detecting in spectrum
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0264—Electrical interface; User interface

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Lasers (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
CN202080099125.8A 2020-04-23 2020-10-30 分光测定装置 Active CN115335668B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020-076923 2020-04-23
JP2020076923 2020-04-23
PCT/JP2020/040843 WO2021215032A1 (ja) 2020-04-23 2020-10-30 分光測定装置

Publications (2)

Publication Number Publication Date
CN115335668A CN115335668A (zh) 2022-11-11
CN115335668B true CN115335668B (zh) 2025-04-11

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN202080099125.8A Active CN115335668B (zh) 2020-04-23 2020-10-30 分光测定装置

Country Status (4)

Country Link
US (1) US12228452B2 (https=)
JP (1) JP7494905B2 (https=)
CN (1) CN115335668B (https=)
WO (1) WO2021215032A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN119394438B (zh) * 2025-01-03 2025-03-21 中国科学院长春光学精密机械与物理研究所 一种宽波段、高工作效率太阳光谱仪

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9778110B1 (en) * 2014-04-17 2017-10-03 Picarro, Inc. Self-referencing cavity enhanced spectroscopy (SRCES) systems and methods

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0139788Y2 (https=) 1984-12-29 1989-11-29
JPS6439788A (en) * 1987-08-06 1989-02-10 Nec Corp Judgment device for uniaxial mode operation of distributed feedback semiconductor laser
JP2837868B2 (ja) * 1988-05-24 1998-12-16 アンリツ株式会社 分光装置
JPH04315928A (ja) * 1991-04-15 1992-11-06 Mitsubishi Electric Corp 発光分光分析装置
JP2000310507A (ja) * 1999-04-26 2000-11-07 Canon Inc 干渉装置
JP3771785B2 (ja) 2000-08-21 2006-04-26 株式会社日立製作所 光増幅装置
JP2002250947A (ja) * 2001-02-23 2002-09-06 Fujitsu Ltd ラマン励起制御方法及び、これを用いる光伝送装置
JP2003161654A (ja) 2001-11-26 2003-06-06 Ando Electric Co Ltd 光スペクトラムアナライザ及び光スペクトル測定方法
EP1811619A3 (en) * 2003-05-23 2007-08-08 Rohm and Haas Electronic Materials, L.L.C. External cavity semiconductor laser and method for fabrication thereof
US7102746B2 (en) * 2003-12-16 2006-09-05 New Chromex, Inc. Raman spectroscope
US7995280B2 (en) * 2004-12-01 2011-08-09 Carl Zeiss Smt Gmbh Projection exposure system, beam delivery system and method of generating a beam of light
JP2008016698A (ja) 2006-07-07 2008-01-24 Sony Corp レーザ光源システムおよびレーザ光源の制御方法
JP2015127680A (ja) * 2013-12-27 2015-07-09 スリーエム イノベイティブ プロパティズ カンパニー 計測装置、システムおよびプログラム
EP3226555B1 (en) * 2016-03-28 2019-11-20 Ricoh Company, Ltd. Wavelength estimation device, light-source device, image display apparatus, wavelength estimation method, and light-source control method
US9606053B1 (en) * 2016-11-22 2017-03-28 Airware, Inc. Reduction of scattering noise when using NDIR with a liquid sample
CN109946267B (zh) * 2019-04-18 2022-02-25 南昌航空大学 气体瑞利-布里渊散射谱线的测量装置及方法

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9778110B1 (en) * 2014-04-17 2017-10-03 Picarro, Inc. Self-referencing cavity enhanced spectroscopy (SRCES) systems and methods

Also Published As

Publication number Publication date
JP7494905B2 (ja) 2024-06-04
WO2021215032A1 (ja) 2021-10-28
US12228452B2 (en) 2025-02-18
CN115335668A (zh) 2022-11-11
JPWO2021215032A1 (https=) 2021-10-28
US20230168125A1 (en) 2023-06-01

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