JPWO2021085475A5 - - Google Patents

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Publication number
JPWO2021085475A5
JPWO2021085475A5 JP2021553653A JP2021553653A JPWO2021085475A5 JP WO2021085475 A5 JPWO2021085475 A5 JP WO2021085475A5 JP 2021553653 A JP2021553653 A JP 2021553653A JP 2021553653 A JP2021553653 A JP 2021553653A JP WO2021085475 A5 JPWO2021085475 A5 JP WO2021085475A5
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Japan
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voltage
terminal
circuit
current
resistance
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JP2021553653A
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English (en)
Japanese (ja)
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JP7257712B2 (ja
JPWO2021085475A1 (https=
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Priority claimed from PCT/JP2020/040436 external-priority patent/WO2021085475A1/ja
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Publication of JPWO2021085475A5 publication Critical patent/JPWO2021085475A5/ja
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JP2021553653A 2019-11-01 2020-10-28 電流センサおよび電力変換回路 Active JP7257712B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2019200205 2019-11-01
JP2019200205 2019-11-01
PCT/JP2020/040436 WO2021085475A1 (ja) 2019-11-01 2020-10-28 電流センサおよび電力変換回路

Publications (3)

Publication Number Publication Date
JPWO2021085475A1 JPWO2021085475A1 (https=) 2021-05-06
JPWO2021085475A5 true JPWO2021085475A5 (https=) 2022-06-21
JP7257712B2 JP7257712B2 (ja) 2023-04-14

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JP2021553653A Active JP7257712B2 (ja) 2019-11-01 2020-10-28 電流センサおよび電力変換回路

Country Status (4)

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US (1) US12095348B2 (https=)
JP (1) JP7257712B2 (https=)
CN (1) CN114556113B (https=)
WO (1) WO2021085475A1 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11784570B2 (en) * 2020-08-21 2023-10-10 Richtek Technology Corporation Power path switch circuit
JP7827721B2 (ja) * 2021-07-05 2026-03-10 ローム株式会社 電流センサ

Family Cites Families (26)

* Cited by examiner, † Cited by third party
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US4725791A (en) 1986-09-18 1988-02-16 Motorola, Inc. Circuit utilizing resistors trimmed by metal migration
JPH0668522B2 (ja) 1986-11-28 1994-08-31 山武ハネウエル株式会社 電流検出回路
JP2000206155A (ja) 1999-01-13 2000-07-28 Hitachi Ltd 熱結合型デジタル入力装置
EP1153434A1 (en) 1999-02-17 2001-11-14 International Business Machines Corporation Microelectronic device for storing information and method thereof
JP4501914B2 (ja) * 2002-04-03 2010-07-14 ソニー株式会社 集積回路、および集積回路装置
JP2004198143A (ja) * 2002-12-16 2004-07-15 Nissan Motor Co Ltd 電流検出装置
JP2006300677A (ja) 2005-04-19 2006-11-02 Ntt Data Ex Techno Corp 電流検出装置
JP4922645B2 (ja) * 2006-03-31 2012-04-25 ルネサスエレクトロニクス株式会社 半導体装置
JP2008157892A (ja) * 2006-12-26 2008-07-10 Susumu Co Ltd 電流検出器、電流検出用具及び電流検出方法
JP4805865B2 (ja) * 2007-03-19 2011-11-02 シャープ株式会社 可変抵抗素子
JP2010287582A (ja) * 2007-10-15 2010-12-24 Panasonic Corp 不揮発性記憶素子およびその製造方法、並びにその不揮発性記憶素子を用いた不揮発性半導体装置
US7960775B2 (en) 2007-11-07 2011-06-14 Imec Method for manufacturing a memory element comprising a resistivity-switching NiO layer and devices obtained thereof
US9261539B2 (en) 2010-03-18 2016-02-16 Magna Steyr Fahrzeugtechnik Ag & Co Kg Method for measuring an electrical current and apparatus for this purpose
JP2012156659A (ja) * 2011-01-25 2012-08-16 Sanyo Semiconductor Co Ltd 電流検出回路
US9602014B2 (en) * 2013-04-24 2017-03-21 Richtek Technology Corporation Voltage converter circuit and voltage converter controller and parameter setting method therefor
US9791480B2 (en) * 2013-05-21 2017-10-17 Analog Devices Global Current sensing of switching power regulators
DE102014202634A1 (de) 2014-02-13 2015-08-13 Robert Bosch Gmbh Stromdetektionseinrichtung und Verfahren zum Erfassen eines elektrischen Stroms
TWI476973B (zh) 2014-03-25 2015-03-11 Winbond Electronics Corp 記憶體元件及形成方法
JP6554317B2 (ja) 2015-05-18 2019-07-31 ローム株式会社 同期整流回路、その制御回路、ワイヤレス受電装置および電子機器
US9863982B2 (en) * 2015-09-30 2018-01-09 Qualcomm Incorporated Bi-directional current sensing circuit
CN107276434B (zh) 2016-04-18 2019-08-13 南京矽力杰半导体技术有限公司 同步整流电路及其控制方法
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JP6716373B2 (ja) * 2016-07-12 2020-07-01 日置電機株式会社 測定装置
KR101907605B1 (ko) * 2016-07-20 2018-12-05 주식회사 모브릭 전도성 기판과 mit 소자 기반의 전류감지소자 및 그를 포함하는 전류 제어 시스템
DE102016010012B4 (de) * 2016-08-17 2018-06-21 Isabellenhütte Heusler Gmbh & Co. Kg Messanordnung zur Messung eines elektrischen Stroms im Hochstrombereich
US10224800B2 (en) * 2017-06-09 2019-03-05 Analog Devices Global Load current detection techniques for discontinuous conduction mode

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