JP6716373B2 - 測定装置 - Google Patents
測定装置 Download PDFInfo
- Publication number
- JP6716373B2 JP6716373B2 JP2016137411A JP2016137411A JP6716373B2 JP 6716373 B2 JP6716373 B2 JP 6716373B2 JP 2016137411 A JP2016137411 A JP 2016137411A JP 2016137411 A JP2016137411 A JP 2016137411A JP 6716373 B2 JP6716373 B2 JP 6716373B2
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- JP
- Japan
- Prior art keywords
- voltage
- value
- resistance
- current
- resistance measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/14—Measuring resistance by measuring current or voltage obtained from a reference source
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/08—Circuits for altering the measuring range
- G01R15/09—Autoranging circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/12—Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will
- G01R15/125—Circuits for multi-testers, i.e. multimeters, e.g. for measuring voltage, current, or impedance at will for digital multimeters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16504—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the components employed
- G01R19/16523—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the components employed using diodes, e.g. Zener diodes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
- G01R19/1659—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 to indicate that the value is within or outside a predetermined range of values (window)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
Description
2,3 入力端子
4 電圧検出部
5 A/D変換部
7 保護抵抗
8 第1スイッチ
9 電流供給部
10 処理部
21 入力抵抗
22,23 分圧抵抗
25 第2スイッチ
Dv 電圧データ
Li 電流供給ライン
Lv1 第1電圧検出ライン
Lv2 第2電圧検出ライン
V1 端子間電圧
V2,V3 検出電圧
Claims (2)
- 一対の入力端子と、前記一対の入力端子間の端子間電圧を検出して当該端子間電圧の電圧値に応じた検出電圧を出力する電圧検出部と、前記一対の入力端子間に測定電流を供給可能な電流供給部と、前記検出電圧に基づいて前記電圧値を測定する電圧測定処理および前記測定電流の供給時における当該電圧測定処理で測定した前記電圧値と当該測定電流の電流値とに基づいて前記一対の入力端子間に接続された測定対象の抵抗値を測定する抵抗測定処理を実行する処理部とを備え、
前記一対の入力端子の一方と前記電流供給部との間に保護抵抗が配設されると共に、短絡状態および開放状態のうちの任意の一方の状態に移行可能な第1スイッチが前記保護抵抗に並列接続され、
前記処理部は、前記第1スイッチを前記開放状態に移行させた状態において前記電圧測定処理を実行して前記電圧値を測定すると共に当該測定した電圧値と予め規定された基準電圧値とを比較して、前記測定した電圧値が前記基準電圧値以下のときに前記第1スイッチを前記短絡状態に移行させて前記抵抗測定処理を実行する測定装置であって、
前記電流供給部は、複数の抵抗測定レンジに対応した電流値で前記測定電流を供給可能に構成され、
前記処理部は、前記抵抗測定処理において、現在の抵抗測定レンジで測定した前記抵抗値が当該抵抗測定レンジでの下限しきい値以上であって第1上限しきい値以下のときには当該測定された抵抗値を前記測定対象の抵抗値として取得し、当該測定した抵抗値が前記現在の抵抗測定レンジでの前記第1上限しきい値を超え当該第1上限しきい値よりも大きな第2上限しきい値以下のときには1つ上位側の抵抗測定レンジに切り替え、当該測定した抵抗値が前記現在の抵抗測定レンジでの前記第2上限しきい値を上回っているときには前記第1スイッチを開放状態に移行させて当該抵抗測定処理を終了する測定装置。 - 表示部を備え、
前記処理部は、前記抵抗測定処理において、前記測定した抵抗値が前記現在の抵抗測定レンジでの前記第2上限しきい値を上回っているときには、前記複数の抵抗測定レンジのうちの最上位の測定レンジにおいて入力範囲外である旨を前記表示部に表示させて当該抵抗測定処理を終了する請求項1記載の測定装置。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016137411A JP6716373B2 (ja) | 2016-07-12 | 2016-07-12 | 測定装置 |
CN201780038605.1A CN109328305B (zh) | 2016-07-12 | 2017-07-06 | 测定装置 |
PCT/JP2017/024762 WO2018012388A1 (ja) | 2016-07-12 | 2017-07-06 | 測定装置 |
US16/245,398 US10928428B2 (en) | 2016-07-12 | 2019-01-11 | Measuring apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016137411A JP6716373B2 (ja) | 2016-07-12 | 2016-07-12 | 測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2018009828A JP2018009828A (ja) | 2018-01-18 |
JP6716373B2 true JP6716373B2 (ja) | 2020-07-01 |
Family
ID=60952928
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2016137411A Active JP6716373B2 (ja) | 2016-07-12 | 2016-07-12 | 測定装置 |
Country Status (4)
Country | Link |
---|---|
US (1) | US10928428B2 (ja) |
JP (1) | JP6716373B2 (ja) |
CN (1) | CN109328305B (ja) |
WO (1) | WO2018012388A1 (ja) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101973070B1 (ko) * | 2018-11-22 | 2019-04-26 | 울산과학기술원 | 저항 측정 장치 및 방법 |
CN111679105B (zh) * | 2020-04-29 | 2022-11-29 | 深圳市科陆精密仪器有限公司 | 一种用于电表的量程切换方法、电表及存储介质 |
CN114062744B (zh) * | 2021-11-12 | 2023-02-10 | 沈阳铁路信号有限责任公司 | 一种电阻测量电路的保护电路及方法 |
US11817697B2 (en) * | 2022-04-05 | 2023-11-14 | International Business Machines Corporation | Method to limit the time a semiconductor device operates above a maximum operating voltage |
Family Cites Families (19)
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US5047751A (en) * | 1989-02-03 | 1991-09-10 | Nec Corporation | Power supply voltage monitoring circuit |
JPH0737482A (ja) * | 1993-07-23 | 1995-02-07 | Fuji Electric Co Ltd | 漏電遮断器 |
FR2749939B1 (fr) * | 1996-06-13 | 1998-07-31 | Sgs Thomson Microelectronics | Detecteur de gamme de tension d'alimentation dans un circuit integre |
WO2001063306A1 (en) * | 2000-02-22 | 2001-08-30 | Sanyo Electric Co., Ltd. | Circuit for detecting leakage in power supply |
JP2005114517A (ja) * | 2003-10-07 | 2005-04-28 | Iwatsu Test Instruments Corp | 測定装置 |
US7230456B2 (en) * | 2004-02-24 | 2007-06-12 | Intel Corporation | Low current consumption detector circuit and applications |
JP2006105902A (ja) * | 2004-10-08 | 2006-04-20 | Adc:Kk | 抵抗測定装置 |
US7388387B2 (en) * | 2006-01-11 | 2008-06-17 | Stratosphere Solutions, Inc. | Method and apparatus for measurement of electrical resistance |
US7642788B2 (en) * | 2006-12-04 | 2010-01-05 | Fluke Corporation | Voltage measurement instrument and method having improved automatic mode operation |
US7990162B2 (en) * | 2007-08-14 | 2011-08-02 | Fluke Corporation | Systems and methods for an open circuit current limiter |
JP2009074829A (ja) * | 2007-09-19 | 2009-04-09 | Chubu Electric Power Co Inc | 補助開閉器等の接点間の接触抵抗測定器 |
JP5065192B2 (ja) * | 2008-02-01 | 2012-10-31 | 山洋電気株式会社 | モータ制御装置及びモータの絶縁劣化検出方法 |
CN201422009Y (zh) * | 2009-05-20 | 2010-03-10 | 黄华道 | 漏电检测保护电路 |
JP5518657B2 (ja) * | 2010-09-21 | 2014-06-11 | 日置電機株式会社 | 接地抵抗計 |
KR101348526B1 (ko) * | 2011-04-27 | 2014-01-06 | 미쓰비시덴키 가부시키가이샤 | 전원회로 및 이 전원회로를 이용한 누전 차단기 |
CN202290375U (zh) * | 2012-02-01 | 2012-07-04 | 常州亚美柯机械设备有限公司 | 静电喷雾装置所用高电压供给系统 |
JP5474114B2 (ja) | 2012-03-16 | 2014-04-16 | 三菱電機株式会社 | 車載高電圧機器の漏電抵抗検出装置およびその漏電抵抗検出方法 |
TWI594285B (zh) | 2013-02-05 | 2017-08-01 | Dexerials Corp | Short circuit components and circuits using this |
US9568504B2 (en) * | 2013-03-15 | 2017-02-14 | Milwaukee Electric Tool Corporation | Digital multi-meter |
-
2016
- 2016-07-12 JP JP2016137411A patent/JP6716373B2/ja active Active
-
2017
- 2017-07-06 CN CN201780038605.1A patent/CN109328305B/zh active Active
- 2017-07-06 WO PCT/JP2017/024762 patent/WO2018012388A1/ja active Application Filing
-
2019
- 2019-01-11 US US16/245,398 patent/US10928428B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
CN109328305A (zh) | 2019-02-12 |
JP2018009828A (ja) | 2018-01-18 |
CN109328305B (zh) | 2021-06-15 |
US10928428B2 (en) | 2021-02-23 |
US20190146018A1 (en) | 2019-05-16 |
WO2018012388A1 (ja) | 2018-01-18 |
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