JPWO2020136470A5 - - Google Patents

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Publication number
JPWO2020136470A5
JPWO2020136470A5 JP2020561969A JP2020561969A JPWO2020136470A5 JP WO2020136470 A5 JPWO2020136470 A5 JP WO2020136470A5 JP 2020561969 A JP2020561969 A JP 2020561969A JP 2020561969 A JP2020561969 A JP 2020561969A JP WO2020136470 A5 JPWO2020136470 A5 JP WO2020136470A5
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JP
Japan
Prior art keywords
silicon substrate
transistor
conductor
extraction electrode
semiconductor device
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2020561969A
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English (en)
Japanese (ja)
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JPWO2020136470A1 (https=
JP7597581B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/IB2019/059960 external-priority patent/WO2020136470A1/ja
Publication of JPWO2020136470A1 publication Critical patent/JPWO2020136470A1/ja
Publication of JPWO2020136470A5 publication Critical patent/JPWO2020136470A5/ja
Priority to JP2024206931A priority Critical patent/JP7748531B2/ja
Application granted granted Critical
Publication of JP7597581B2 publication Critical patent/JP7597581B2/ja
Priority to JP2025155886A priority patent/JP2025181913A/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2020561969A 2018-12-27 2019-11-20 半導体装置 Active JP7597581B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2024206931A JP7748531B2 (ja) 2018-12-27 2024-11-28 半導体装置
JP2025155886A JP2025181913A (ja) 2018-12-27 2025-09-19 半導体装置

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2018243859 2018-12-27
JP2018243859 2018-12-27
PCT/IB2019/059960 WO2020136470A1 (ja) 2018-12-27 2019-11-20 半導体装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2024206931A Division JP7748531B2 (ja) 2018-12-27 2024-11-28 半導体装置

Publications (3)

Publication Number Publication Date
JPWO2020136470A1 JPWO2020136470A1 (https=) 2020-07-02
JPWO2020136470A5 true JPWO2020136470A5 (https=) 2022-11-10
JP7597581B2 JP7597581B2 (ja) 2024-12-10

Family

ID=71127579

Family Applications (3)

Application Number Title Priority Date Filing Date
JP2020561969A Active JP7597581B2 (ja) 2018-12-27 2019-11-20 半導体装置
JP2024206931A Active JP7748531B2 (ja) 2018-12-27 2024-11-28 半導体装置
JP2025155886A Pending JP2025181913A (ja) 2018-12-27 2025-09-19 半導体装置

Family Applications After (2)

Application Number Title Priority Date Filing Date
JP2024206931A Active JP7748531B2 (ja) 2018-12-27 2024-11-28 半導体装置
JP2025155886A Pending JP2025181913A (ja) 2018-12-27 2025-09-19 半導体装置

Country Status (3)

Country Link
US (2) US12205892B2 (https=)
JP (3) JP7597581B2 (https=)
WO (1) WO2020136470A1 (https=)

Family Cites Families (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2776149B2 (ja) * 1992-06-15 1998-07-16 日本電気株式会社 半導体集積回路
JP3111948B2 (ja) * 1997-10-31 2000-11-27 日本電気株式会社 半導体集積回路
US6121659A (en) 1998-03-27 2000-09-19 International Business Machines Corporation Buried patterned conductor planes for semiconductor-on-insulator integrated circuit
KR100644028B1 (ko) 2005-05-11 2006-11-10 매그나칩 반도체 유한회사 반도체 칩 및 반도체 칩 패키지
US8169019B2 (en) * 2009-09-10 2012-05-01 Niko Semiconductor Co., Ltd. Metal-oxide-semiconductor chip and fabrication method thereof
KR101772639B1 (ko) 2009-10-16 2017-08-29 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
KR20130061678A (ko) 2010-04-16 2013-06-11 가부시키가이샤 한도오따이 에네루기 켄큐쇼 전원 회로
JP5912394B2 (ja) 2011-10-13 2016-04-27 株式会社半導体エネルギー研究所 半導体装置
US9929276B2 (en) 2012-08-10 2018-03-27 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
JP6325229B2 (ja) 2012-10-17 2018-05-16 株式会社半導体エネルギー研究所 酸化物膜の作製方法
US9385058B1 (en) 2012-12-29 2016-07-05 Monolithic 3D Inc. Semiconductor device and structure
JP6020731B2 (ja) 2013-08-29 2016-11-02 三菱電機株式会社 半導体モジュール、半導体装置、及び自動車
JP6249829B2 (ja) * 2014-03-10 2017-12-20 三菱電機株式会社 半導体装置およびその製造方法
KR102367921B1 (ko) 2014-03-14 2022-02-25 가부시키가이샤 한도오따이 에네루기 켄큐쇼 회로 시스템
US9674470B2 (en) 2014-04-11 2017-06-06 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, method for driving semiconductor device, and method for driving electronic device
KR102582740B1 (ko) * 2014-05-30 2023-09-26 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치, 이의 제조 방법, 및 전자 장치
US9685560B2 (en) 2015-03-02 2017-06-20 Semiconductor Energy Laboratory Co., Ltd. Transistor, method for manufacturing transistor, semiconductor device, and electronic device
JP6208164B2 (ja) * 2015-03-03 2017-10-04 三菱電機株式会社 半導体モジュールおよびその製造方法
US20170098599A1 (en) * 2015-10-01 2017-04-06 United Microelectronics Corp. Oxide semiconductor device and manufacturing method thereof
JP6811084B2 (ja) 2015-12-18 2021-01-13 株式会社半導体エネルギー研究所 半導体装置
US9917207B2 (en) 2015-12-25 2018-03-13 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
US10020336B2 (en) 2015-12-28 2018-07-10 Semiconductor Energy Laboratory Co., Ltd. Imaging device and electronic device using three dimentional (3D) integration
JP6845692B2 (ja) 2016-01-15 2021-03-24 株式会社半導体エネルギー研究所 半導体装置
WO2017125795A1 (ja) * 2016-01-22 2017-07-27 株式会社半導体エネルギー研究所 トランジスタ、撮像装置
JP7020783B2 (ja) 2016-02-03 2022-02-16 株式会社半導体エネルギー研究所 撮像装置
US10333004B2 (en) 2016-03-18 2019-06-25 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, semiconductor wafer, module and electronic device
WO2018051208A1 (en) 2016-09-14 2018-03-22 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method of the same
KR102579972B1 (ko) 2017-09-05 2023-09-20 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 반도체 장치의 제작 방법
JP7328146B2 (ja) 2017-09-06 2023-08-16 株式会社半導体エネルギー研究所 記憶装置及び電子機器
KR102871324B1 (ko) 2018-06-08 2025-10-15 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 반도체 장치의 제작 방법
US11031506B2 (en) 2018-08-31 2021-06-08 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device including transistor using oxide semiconductor

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