JPWO2020104885A5 - 半導体装置 - Google Patents
半導体装置 Download PDFInfo
- Publication number
- JPWO2020104885A5 JPWO2020104885A5 JP2020557011A JP2020557011A JPWO2020104885A5 JP WO2020104885 A5 JPWO2020104885 A5 JP WO2020104885A5 JP 2020557011 A JP2020557011 A JP 2020557011A JP 2020557011 A JP2020557011 A JP 2020557011A JP WO2020104885 A5 JPWO2020104885 A5 JP WO2020104885A5
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor equipment
- semiconductor
- equipment
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title 1
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2018218885 | 2018-11-22 | ||
| JP2018218885 | 2018-11-22 | ||
| JP2018240093 | 2018-12-21 | ||
| JP2018240093 | 2018-12-21 | ||
| PCT/IB2019/059650 WO2020104885A1 (ja) | 2018-11-22 | 2019-11-11 | 二次電池の異常検知装置、および、半導体装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JPWO2020104885A1 JPWO2020104885A1 (ja) | 2021-11-04 |
| JPWO2020104885A5 true JPWO2020104885A5 (ja) | 2022-08-25 |
| JP7352568B2 JP7352568B2 (ja) | 2023-09-28 |
Family
ID=70773576
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2020557011A Active JP7352568B2 (ja) | 2018-11-22 | 2019-11-11 | 半導体装置 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US11973198B2 (ja) |
| JP (1) | JP7352568B2 (ja) |
| KR (1) | KR20210093934A (ja) |
| CN (1) | CN113167821B (ja) |
| DE (1) | DE112019005845T5 (ja) |
| WO (1) | WO2020104885A1 (ja) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7325439B2 (ja) | 2018-11-22 | 2023-08-14 | 株式会社半導体エネルギー研究所 | 蓄電装置 |
| US11916065B2 (en) | 2019-02-26 | 2024-02-27 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for operating semiconductor device |
| CN115877210B (zh) * | 2022-12-08 | 2023-07-21 | 青岛艾测科技有限公司 | 一种保压可调容性负载绝缘检测方法、装置和设备 |
Family Cites Families (32)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5888674A (ja) | 1981-11-20 | 1983-05-26 | Sanyo Electric Co Ltd | 電池の充電検出装置 |
| JPH0611102B2 (ja) | 1985-01-08 | 1994-02-09 | 日本電気株式会社 | 信号検出回路 |
| KR100209449B1 (ko) * | 1990-05-21 | 1999-07-15 | 가나이 쓰토무 | 반도체 집적회로 장치 |
| JPH052037A (ja) * | 1991-06-25 | 1993-01-08 | Mitsubishi Electric Corp | ゼロクロス検出回路 |
| JPH07229932A (ja) * | 1994-02-17 | 1995-08-29 | Toshiba Corp | 電位検知回路 |
| US5600275A (en) | 1994-04-29 | 1997-02-04 | Analog Devices, Inc. | Low-voltage CMOS comparator with offset cancellation |
| US5625304A (en) | 1995-04-21 | 1997-04-29 | Lucent Technologies Inc. | Voltage comparator requiring no compensating offset voltage |
| JP3519650B2 (ja) | 1998-10-23 | 2004-04-19 | 日本電信電話株式会社 | 電圧比較器 |
| EP0996226B1 (en) | 1998-10-23 | 2006-05-03 | Nippon Telegraph and Telephone Corporation | Voltage comparator |
| US6586984B1 (en) * | 2002-07-12 | 2003-07-01 | Lsi Logic Corporation | Method for preventing damage to IO devices due to over voltage at pin |
| US6940318B1 (en) * | 2003-10-06 | 2005-09-06 | Pericom Semiconductor Corp. | Accurate voltage comparator with voltage-to-current converters for both reference and input voltages |
| JP3962381B2 (ja) | 2004-02-13 | 2007-08-22 | 沖電気工業株式会社 | 半導体集積回路 |
| US7049865B2 (en) * | 2004-03-05 | 2006-05-23 | Intel Corporation | Power-on detect circuit for use with multiple voltage domains |
| TW200707905A (en) | 2005-06-17 | 2007-02-16 | Rohm Co Ltd | Semiconductor device, power supply device, and information processing device |
| US7466171B2 (en) * | 2007-01-15 | 2008-12-16 | International Business Machines Corporation | Voltage detection circuit and circuit for generating a trigger flag signal |
| JP4475309B2 (ja) | 2007-09-19 | 2010-06-09 | ヤマハ株式会社 | コンパレータ |
| JP5120154B2 (ja) | 2007-11-01 | 2013-01-16 | 株式会社デンソー | 信号形成回路 |
| JP5815195B2 (ja) | 2008-09-11 | 2015-11-17 | ミツミ電機株式会社 | 電池状態検知装置及びそれを内蔵する電池パック |
| JP5564955B2 (ja) | 2009-01-14 | 2014-08-06 | ミツミ電機株式会社 | 保護監視回路、電池パック、二次電池監視回路、及び保護回路 |
| JP5535608B2 (ja) * | 2009-12-21 | 2014-07-02 | ラピスセミコンダクタ株式会社 | 電圧変化検知装置 |
| WO2012029638A1 (en) | 2010-09-03 | 2012-03-08 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| EP2700958B1 (en) | 2011-04-21 | 2019-01-16 | Renesas Electronics Corporation | Switch circuit, selection circuit, and voltage measurement device |
| TWI580189B (zh) | 2011-12-23 | 2017-04-21 | 半導體能源研究所股份有限公司 | 位準位移電路及半導體積體電路 |
| JP5888674B2 (ja) | 2012-02-28 | 2016-03-22 | 国立大学法人名古屋大学 | エッチング装置およびエッチング方法およびクリーニング装置 |
| US9160195B2 (en) | 2012-07-17 | 2015-10-13 | Semiconductor Energy Laboratory Co., Ltd. | Charging device |
| US9245650B2 (en) | 2013-03-15 | 2016-01-26 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| JP6906978B2 (ja) | 2016-02-25 | 2021-07-21 | 株式会社半導体エネルギー研究所 | 半導体装置、半導体ウェハ、および電子機器 |
| JP2017215906A (ja) | 2016-06-02 | 2017-12-07 | シナプティクス・ジャパン合同会社 | シリーズレギュレータ及び半導体集積回路 |
| US10128821B2 (en) | 2016-11-15 | 2018-11-13 | Stmicroelectronics, Inc. | Low output impedance, high speed and high voltage generator for use in driving a capacitive load |
| JP2018156699A (ja) | 2017-03-16 | 2018-10-04 | 株式会社半導体エネルギー研究所 | 半導体装置、電子部品、及び電子機器 |
| WO2020012284A1 (ja) | 2018-07-10 | 2020-01-16 | 株式会社半導体エネルギー研究所 | 二次電池の保護回路及び二次電池の異常検知システム |
| JP7412346B2 (ja) * | 2018-10-25 | 2024-01-12 | 株式会社半導体エネルギー研究所 | 半導体装置 |
-
2019
- 2019-11-11 DE DE112019005845.2T patent/DE112019005845T5/de active Pending
- 2019-11-11 KR KR1020217017379A patent/KR20210093934A/ko unknown
- 2019-11-11 WO PCT/IB2019/059650 patent/WO2020104885A1/ja active Application Filing
- 2019-11-11 JP JP2020557011A patent/JP7352568B2/ja active Active
- 2019-11-11 US US17/291,000 patent/US11973198B2/en active Active
- 2019-11-11 CN CN201980077052.XA patent/CN113167821B/zh active Active
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