JPWO2008010311A1 - レーザ走査装置及びレーザ走査顕微鏡 - Google Patents

レーザ走査装置及びレーザ走査顕微鏡 Download PDF

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Publication number
JPWO2008010311A1
JPWO2008010311A1 JP2008525783A JP2008525783A JPWO2008010311A1 JP WO2008010311 A1 JPWO2008010311 A1 JP WO2008010311A1 JP 2008525783 A JP2008525783 A JP 2008525783A JP 2008525783 A JP2008525783 A JP 2008525783A JP WO2008010311 A1 JPWO2008010311 A1 JP WO2008010311A1
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JP
Japan
Prior art keywords
laser
scanning
line
setting
controller
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2008525783A
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English (en)
Japanese (ja)
Inventor
篤司 鶴旨
篤司 鶴旨
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nikon Corp
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Nikon Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
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First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=38956646&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=JPWO2008010311(A1) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Nikon Corp filed Critical Nikon Corp
Publication of JPWO2008010311A1 publication Critical patent/JPWO2008010311A1/ja
Withdrawn legal-status Critical Current

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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0036—Scanning details, e.g. scanning stages
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/10—Scanning systems
    • G02B26/101—Scanning systems with both horizontal and vertical deflecting means, e.g. raster or XY scanners
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/10—Scanning systems
    • G02B26/105—Scanning systems with one or more pivoting mirrors or galvano-mirrors
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/0025—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical correction, e.g. distorsion, aberration
    • G02B27/0031—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical correction, e.g. distorsion, aberration for scanning purposes

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Microscoopes, Condenser (AREA)
  • Laser Beam Processing (AREA)
JP2008525783A 2006-07-18 2007-06-20 レーザ走査装置及びレーザ走査顕微鏡 Withdrawn JPWO2008010311A1 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2006195241 2006-07-18
JP2006195241 2006-07-18
PCT/JP2007/000656 WO2008010311A1 (en) 2006-07-18 2007-06-20 Laser scanning apparatus and laser scanning microscope

Publications (1)

Publication Number Publication Date
JPWO2008010311A1 true JPWO2008010311A1 (ja) 2009-12-17

Family

ID=38956646

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008525783A Withdrawn JPWO2008010311A1 (ja) 2006-07-18 2007-06-20 レーザ走査装置及びレーザ走査顕微鏡

Country Status (6)

Country Link
US (1) US8159744B2 (https=)
EP (1) EP2045640B1 (https=)
JP (1) JPWO2008010311A1 (https=)
AT (1) ATE495476T1 (https=)
DE (1) DE602007011940D1 (https=)
WO (1) WO2008010311A1 (https=)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
HU0800688D0 (en) * 2008-11-17 2009-01-28 Femtonics Kft Multiple free line-scan mode of scanning
JP5581707B2 (ja) * 2010-01-28 2014-09-03 株式会社ニコン 制御方法
JP5806450B2 (ja) * 2010-07-02 2015-11-10 オリンパス株式会社 細胞観察方法
JP6157155B2 (ja) * 2012-03-15 2017-07-05 オリンパス株式会社 顕微鏡システム、駆動方法およびプログラム
JP2015125177A (ja) 2013-12-25 2015-07-06 ソニー株式会社 顕微鏡システムおよびその画像データ転送方法
JP6171970B2 (ja) 2014-02-10 2017-08-02 ソニー株式会社 レーザ走査型顕微鏡装置および制御方法
JP6161678B2 (ja) * 2015-11-20 2017-07-12 株式会社キーエンス 共焦点顕微鏡システム
US10514394B2 (en) * 2016-02-26 2019-12-24 Tektronix, Inc. Dynamic output clamping for a probe or accessory
EP3538941B1 (en) 2016-11-10 2025-04-23 The Trustees of Columbia University in the City of New York Rapid high-resolution imaging methods for large samples

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6161123A (ja) * 1984-08-31 1986-03-28 Fuji Photo Film Co Ltd ガルバノメ−タミラ−駆動装置
US5187364A (en) * 1989-03-22 1993-02-16 National Research Council Of Canada/Conseil National De Recherches Du Canada Scanning device with waveform generator optimizer
US5084612A (en) * 1989-10-20 1992-01-28 Fuji Photo Film Co., Ltd. Imaging method for scanning microscopes, and confocal scanning microscope
DE19702752C2 (de) 1997-01-27 2001-12-13 Zeiss Carl Jena Gmbh Ansteuersystem für einen Scannerantrieb
JP4555905B2 (ja) * 1998-01-27 2010-10-06 カール ツアイス マイクロイメージング ゲゼルシャフト ミット ベシュレンクテル ハフツング スキャナ駆動部のための方向制御システム
JP2003503213A (ja) * 1999-07-05 2003-01-28 シーメンス アクチエンゲゼルシヤフト 粒子又は波から成るビームによって予め設定された目標コースを描写するための方法及びこの方法の使用
US6687035B2 (en) * 2001-06-07 2004-02-03 Leica Microsystems Heildelberg Gmbh Method and apparatus for ROI-scan with high temporal resolution
JP4700299B2 (ja) * 2004-07-07 2011-06-15 オリンパス株式会社 共焦点走査型顕微鏡
US7355702B2 (en) 2004-06-21 2008-04-08 Olympus Corporation Confocal observation system
DE102004034956A1 (de) * 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh Verfahren zur Erfassung mindestens eines Probenbereiches mit einem Lichtrastermikroskop mit linienförmiger Abtastung
EP1669789B1 (en) * 2004-12-13 2011-07-06 Olympus Corporation Laser scanning microscope apparatus

Also Published As

Publication number Publication date
EP2045640A4 (en) 2009-11-11
DE602007011940D1 (https=) 2011-02-24
EP2045640A1 (en) 2009-04-08
EP2045640B1 (en) 2011-01-12
US8159744B2 (en) 2012-04-17
WO2008010311A1 (en) 2008-01-24
ATE495476T1 (de) 2011-01-15
US20090168157A1 (en) 2009-07-02

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